公开(公告)号：US20170288693A1

公开(公告)日：2017-10-05

申请号：US15465305

申请日：2017-03-21

Applicant: STMicroelectronics International N.V.

Inventor： Ashish Sharma Kumar ,  Rajeev Jain ,  Chandrajit Debnath

IPC: H03M3/00 ,  H03M1/00

CPC classification number: H03M3/464 ,  H03M1/001 ,  H03M3/42 ,  H03M3/466 ,  H03M3/468 ,  H03M3/494

Abstract: A wide band continuous time delta-sigma modulator implements a time interleaved quantization processing operation. The modulator may provide for an inherent finite impulse response filtering in the feedback loop. Additionally, further finite impulse response filtering in each time interleaved feedback path may be provided.

公开(公告)号：US20160124445A1

公开(公告)日：2016-05-05

申请号：US14530448

申请日：2014-10-31

Applicant: STMicroelectronics International N.V.

Inventor： Rajeev Jain ,  Chandrajit Debnath

IPC: G05F1/46

CPC classification number: G05F1/468 ,  G05F1/46 ,  G05F3/16 ,  G05F3/26 ,  G05F3/30

Abstract: A bandgap voltage generator includes a plurality of calibration transistors. A test circuit measures the bandgap reference voltage generated by the bandgap voltage generator and enables a subset of the calibration transistors to correct to the bandgap reference voltage.

Abstract translation: 带隙电压发生器包括多个校准晶体管。 测试电路测量由带隙电压发生器产生的带隙参考电压，并使得校准晶体管的子集能够校正到带隙参考电压。

公开(公告)号：US09851731B2

公开(公告)日：2017-12-26

申请号：US14530448

申请日：2014-10-31

Applicant: STMicroelectronics International N.V.

Inventor： Rajeev Jain ,  Chandrajit Debnath

IPC: G05F1/46 ,  G05F3/16 ,  G05F3/30 ,  G05F3/26

CPC classification number: G05F1/468 ,  G05F1/46 ,  G05F3/16 ,  G05F3/26 ,  G05F3/30

Abstract: A bandgap voltage generator includes a plurality of calibration transistors. A test circuit measures the bandgap reference voltage generated by the bandgap voltage generator and enables a subset of the calibration transistors to correct to the bandgap reference voltage.