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公开(公告)号：US11350171B2
公开(公告)日：2022-05-31
申请号：US16887641
申请日：2020-05-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Heeran Lee , Yongdeok Kim , Namsu Ha , Bongseok Lee , Jaeho Han
Abstract: An electronic apparatus is provided. The electronic apparatus includes: a memory configured to store volume histories for a plurality of content sources; and a processor configured to, based on a content source for providing a content being changed from a first content source to a second content source, among the plurality of content sources, identify a volume level corresponding to the second content source based on a volume history of the first content source and a volume history of the second content source among the stored volume histories, and change a currently-set volume level to the identified volume level, and update the volume history of the second content source based on the changed volume level.
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公开(公告)号：US11314919B2
公开(公告)日：2022-04-26
申请号：US17022233
申请日：2020-09-16
Applicant: Samsung Electronics Co., Ltd.
Inventor： Yongdeok Kim , Munjun Seo , Bonghyun Lee
IPC: G06F30/30 , G06F30/3953 , G03F1/36 , G06F30/398 , G06F30/392
Abstract: Disclosed are a semiconductor device and a method of fabricating the same. The semiconductor device includes an area-oriented region and a performance-oriented region, standard cells disposed on each of the area-oriented region and the performance-oriented region, and a routing metal layer on the standard cells. The routing metal layer includes first routing lines on the area-oriented region and second routing lines on the performance-oriented region. The smallest line width of the first routing lines is a first width, the smallest line width of the second routing lines is a second width greater than the first width, a pitch between the first routing lines is a first pitch, and a pitch between the second routing lines is a second pitch greater than the first pitch.
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公开(公告)号：US20190188840A1
公开(公告)日：2019-06-20
申请号：US16032356
申请日：2018-07-11
Applicant: Samsung Electronics Co., Ltd.
Inventor： Namyeong Kwon , Hyohyeong Kang , Yongdeok Kim
Abstract: A semiconductor defect classification device includes feature extractors that are configured to receive images of semiconductor patterns on a wafer and to extract features of the images from the images, and a classifier that is configured to receive the features of the images and first meta information about the wafer and to use machine learning to classify a defect of the semiconductor patterns associated with the images based on the features of the images and the first meta information.
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公开(公告)号：US12197278B2
公开(公告)日：2025-01-14
申请号：US17954508
申请日：2022-09-28
Inventor： Yongdeok Kim , Kyung Geun Lee , Jeong Yoon Eo , Byung Gon Chun , Ahn Jae Shin
Abstract: A system with fault recovery includes: a plurality of worker nodes configured to perform distributed training; and a master node configured to control the plurality of worker nodes, wherein the master node is configured to: detect a fault of the plurality of worker nodes based on a predetermined period; adjust a collective communication participant list in response to the detecting of the fault; and transmit the adjusted participant list to one or more worker nodes in the adjusted participant list.
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公开(公告)号：US11995391B2
公开(公告)日：2024-05-28
申请号：US17702879
申请日：2022-03-24
Applicant: Samsung Electronics Co., Ltd.
Inventor： Yongdeok Kim , Munjun Seo , Bonghyun Lee
IPC: G06F30/392 , G03F1/36 , G06F30/3953 , G06F30/398
CPC classification number: G06F30/3953 , G03F1/36 , G06F30/392 , G06F30/398
Abstract: Disclosed are a semiconductor device and a method of fabricating the same. The semiconductor device includes an area-oriented region and a performance-oriented region, standard cells disposed on each of the area-oriented region and the performance-oriented region, and a routing metal layer on the standard cells. The routing metal layer includes first routing lines on the area-oriented region and second routing lines on the performance-oriented region. The smallest line width of the first routing lines is a first width, the smallest line width of the second routing lines is a second width greater than the first width, a pitch between the first routing lines is a first pitch, and a pitch between the second routing lines is a second pitch greater than the first pitch.
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Patent Agency Ranking
公开(公告)号：US12223334B2
公开(公告)日：2025-02-11
申请号：US18120163
申请日：2023-03-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Heeran Lee , Injune Baek , Yongdeok Kim , Bongseok Lee , Namsu Ha
Abstract: A method including identifying the operation mode of the electronic device as a first operation mode, sensing a change of setting corresponding to the first operation mode, determining whether to update setting information about the setting, based on at least one of a changing pattern or a change history of a user, and when the operation mode is identified later as the first operation mode, providing the user with the first operation mode with the plurality of updated settings including the setting information about the updated setting is provided.
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公开(公告)号：US11627383B2
公开(公告)日：2023-04-11
申请号：US17046494
申请日：2019-03-27
Inventor： Sunghyun Kim , Yongdeok Kim , Gunhee Kim , Joonil Na , Jinyoung Sung , Youngjae Yu , Sangho Lee
IPC: H04N21/8549 , G06F16/55 , G06F16/583 , G06F16/58 , G06N3/08 , H04N21/8547
Abstract: Provided are an electronic device and an operation method thereof. The electronic device includes a memory that stores one or more instructions, and a processor that executes the one or more instructions stored in the memory, wherein the processor is configured to execute the one or more instructions to: divide original image data into a plurality of image sequences; determine a predetermined number of image sequences among the plurality of image sequences as an input image group, select one of the image sequences included in the input image group and add the selected image sequence to the highlight image group based on one or more image sequences pre-classified as a highlight image group, by using a trained model trained using an artificial intelligence algorithm; and generate summary image data extracted from the original image data, by using the image sequence included in the highlight image group.
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公开(公告)号：US20230281020A1
公开(公告)日：2023-09-07
申请号：US18120163
申请日：2023-03-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Heeran LEE , Injune Baek , Yongdeok Kim , Bongseok Lee , Namsu Ha
IPC: G06F9/445
CPC classification number: G06F9/44505 , G06F3/147
Abstract: A method including identifying the operation mode of the electronic device as a first operation mode, sensing a change of setting corresponding to the first operation mode, determining whether to update setting information about the setting, based on at least one of a changing pattern or a change history of a user, and when the operation mode is identified later as the first operation mode, providing the user with the first operation mode with the plurality of updated settings including the setting information about the updated setting is provided.
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公开(公告)号：US10949949B2
公开(公告)日：2021-03-16
申请号：US16402375
申请日：2019-05-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Choonshik Leem , Taelim Choi , Yongdeok Kim
Abstract: A non-transitory computer-readable medium for monitoring a semiconductor fabrication process includes an image conversion model having an artificial neural network. The image conversion model, when executed, causes the processor to receive a first image and a second image of a semiconductor wafer. The artificial neural network is trained by inputting a dataset representing the first image and the second image, generating a conversion image of the semiconductor wafer and calibrating weights and biases of the artificial neural network to match the conversion image to the second image. A third image of the semiconductor wafer is generated based on the calibrated weights and biases of the artificial neural network. The image conversion model with the trained artificial neural network may be transmitted to another device for image conversion of low resolution images.
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公开(公告)号：US10713778B2
公开(公告)日：2020-07-14
申请号：US16032356
申请日：2018-07-11
Applicant: Samsung Electronics Co., Ltd.
Inventor： Namyeong Kwon , Hyohyeong Kang , Yongdeok Kim
Abstract: A semiconductor defect classification device includes feature extractors that are configured to receive images of semiconductor patterns on a wafer and to extract features of the images from the images, and a classifier that is configured to receive the features of the images and first meta information about the wafer and to use machine learning to classify a defect of the semiconductor patterns associated with the images based on the features of the images and the first meta information.
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