公开(公告)号：US20170122980A1

公开(公告)日：2017-05-04

申请号：US15405048

申请日：2017-01-12

Applicant: Technoprobe S.p.A.

Inventor： Roberto Crippa ,  Raffaele Ubaldo Vallauri ,  Emanuele Bertarelli

IPC: G01R1/067 ,  H01R43/16 ,  B23K26/40 ,  H01R43/02 ,  B23K1/19 ,  B23K1/00

CPC classification number: G01R1/06761 ,  B23K1/0016 ,  B23K1/19 ,  B23K26/40 ,  B23K2101/38 ,  B23K2103/18 ,  G01R1/06755 ,  G01R1/07307 ,  G01R1/07357 ,  H01R43/02 ,  H01R43/16

Abstract: A contact probe for a testing head of an apparatus for testing electronic devices is described comprising a body extending between a contact tip and a contact head, that contact probe comprising at least one first section and one second section made of at least two different materials and joined together in correspondence of a soldering line.

公开(公告)号：US20150192614A1

公开(公告)日：2015-07-09

申请号：US14638533

申请日：2015-03-04

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Vettori ,  Emanuele Bertarelli ,  Marco Diegidio

IPC: G01R1/067 ,  G01R1/04 ,  G01R1/073

CPC classification number: G01R1/06727 ,  G01R1/04 ,  G01R1/06733 ,  G01R1/07342

Abstract: A cantilever contact probe comprises at least a probe body and a hook-shaped end portion, being joined to the probe body and ending with a slanted section being configured as a hook. The end portion is bent at a bending point having a suitable inclination of the hooked slanted section with respect to a longitudinal extension axis of the probe and ends with a contact tip being able to assure a mechanical and electrical contact with a contact pad of a device under test. Suitably, the probe comprises at least a reduced portion having a first area with at least a first size being smaller than a corresponding first size of a second area of the probe in a section which does not comprise the reduced portion, along a side by side placing direction of the probes within a testing head. The reduced portion is substantially reduced along its sides thus forming an area having a reduced cross size being placed edgeways.

Abstract translation: 悬臂接触探针至少包括探针体和钩形端部，其连接到探针主体并且以配置为钩的倾斜部分结束。 端部在弯曲点处弯曲，该弯曲点具有相对于探针的纵向延伸轴线的钩形倾斜部分的适当倾斜度，并且端部具有能够确保与装置的接触垫机械和电接触的接触尖端 被测试。 适当地，探针至少包括具有第一区域的缩小部分，第一区域具有至少第一尺寸小于在不包括减少部分的部分中沿着并排的第一尺寸的探针的第二区域 将探头的方向放置在测试头内。 减小的部分沿其侧面大大减小，从而形成具有减小的交叉大小的区域被设置为边缘。

公开(公告)号：US10551433B2

公开(公告)日：2020-02-04

申请号：US15703614

申请日：2017-09-13

Applicant: TECHNOPROBE S.p.A.

Inventor： Roberto Crippa ,  Raffaele Vallauri ,  Emanuele Bertarelli ,  Daniele Perego

IPC: G01R31/28 ,  G01R1/067

Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.

公开(公告)号：US20180003767A1

公开(公告)日：2018-01-04

申请号：US15703614

申请日：2017-09-13

Applicant: TECHNOPROBE S.p.A.

Inventor： Roberto Crippa ,  Raffaele Vallauri ,  Emanuele Bertarelli ,  Daniele Perego

IPC: G01R31/28 ,  G01R1/067

CPC classification number: G01R31/2891 ,  G01R1/06733 ,  G01R1/0675 ,  G01R1/07314 ,  G01R1/07357 ,  H01R13/2435 ,  H01R13/42

Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.