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1.发明公开公开(公告)号：US20240353491A1
公开(公告)日：2024-10-24
申请号：US18756281
申请日：2024-06-27
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , Evan Douglas Smith
IPC: G01R31/319 , G01R31/28 , G01R31/3183
CPC classification number: G01R31/31908 , G01R31/2862 , G01R31/318307 , G01R31/318371
Abstract: A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.
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公开(公告)号：US12085590B2
公开(公告)日：2024-09-10
申请号：US17862293
申请日：2022-07-11
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , Justin E. Patterson
IPC: G01R13/02 , G06T13/00 , G06F3/0482 , G06F3/04847
CPC classification number: G01R13/0218 , G01R13/0254 , G01R13/029 , G06T13/00 , G06F3/0482 , G06F3/04847 , G06T2200/24
Abstract: A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display. A method of animating waveform data includes receiving a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recovering a clock signal from the waveforms, generating a waveform image from each of the waveforms, rendering the waveform images into video frames to produce an image array of the video frames, selecting at least some of the video frames to play as a video sequence, and playing the video sequence on a display.
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公开(公告)号：US11940889B2
公开(公告)日：2024-03-26
申请号：US17877829
申请日：2022-07-29
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , Kan Tan
CPC classification number: G06F11/27 , G06F1/022 , G06F11/2273
Abstract: A test and measurement system has a test and measurement instrument, a test automation platform, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive a waveform created by operation of a device under test, generate one or more tensor arrays, apply machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, apply machine learning to a second tensor array of the one of the one or more tensor arrays to produce predicted tuning parameters for the device under test, use the equalizer tap values to produce a Transmitter and Dispersion Eye Closure Quaternary (TDECQ) value, and provide the TDECQ value and the predicted tuning parameters to the test automation platform. A method of testing devices under test includes receiving a waveform created by operation of a device under test, generating one or more tensor arrays, applying machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, applying machine learning to a second tensor array of the one or more tensor arrays to produce predicted tuning parameters for the device under test, using the equalizer tap values to produce a Transmitter Dispersion Eye Closure Quaternary (TDECQ) value, and providing the TDECQ value and the predicted tuning parameters to a test automation platform.
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公开(公告)号：US11907090B2
公开(公告)日：2024-02-20
申请号：US17876817
申请日：2022-07-29
Applicant: Tektronix, Inc.
Inventor： Kan Tan , John J. Pickerd
IPC: G06F11/273 , G06F11/267
CPC classification number: G06F11/2733 , G06F11/267
Abstract: A test and measurement instrument has an input configured to receive a signal from a device under test, a memory, a user interface to allow the user to input settings for the test and measurement instrument, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. A method of testing a device under test includes acquiring a waveform representing a signal received from the device under test, generating one or more tensor arrays based on the waveform, applying machine learning to the one or more tensor arrays to produce equalizer tap values, applying the equalizer taps values to the waveform to produce an equalized waveform, performing a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test.
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公开(公告)号：US11449697B2
公开(公告)日：2022-09-20
申请号：US17018198
申请日：2020-09-11
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd
Abstract: A test and measurement instrument for analyzing signals using machine learning. The test and measurement instrument can determine a recovered clock signal based on the digital signal, set window positions for a fast Fourier transform of the digital signal, window the digital signal into a series of windowed waveform data based on the window positions, transform each of the windowed waveform data into a frequency-domain windowed waveform data using a fast Fourier transform, and determine high-order spectrum data of each of the frequency-domain windowed waveform data. The test and measurement instrument includes a neural network configured to receive the high-order spectrum data of the frequency-domain windowed transform data and classify each windowed waveform data based on the high-order spectrum data.
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Patent Agency Ranking
公开(公告)号：US20220247648A1
公开(公告)日：2022-08-04
申请号：US17592437
申请日：2022-02-03
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , Kan Tan
IPC: H04L43/045 , H04L27/02
Abstract: A system for generating images on a test and measurement device includes a first input for accepting a waveform input signal carrying sequential digital information and an image generator structured to generate a visual image using a segment of the waveform input only when two or more sequential codes of digital information match sequential codes carried in the sequential digital information of the segment of the waveform input. A user-defined state-machine comparator may be used to determine which segments of the waveform input signal are used in the image generation.
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公开(公告)号：US20220036238A1
公开(公告)日：2022-02-03
申请号：US17386400
申请日：2021-07-27
Applicant: Tektronix, Inc.
Inventor： Karthikeyan R , Siby Charley P , John J. Pickerd , Saifee Jasdanwala , Chandra Sekhar Kappagantu , Mahesh Nair M
IPC: G06N20/00
Abstract: A system an input to receive a waveform signal, and one or more processors configured to execute code to cause the one or more processors to extract data bursts from the waveform signal, generate corresponding data vectors from the raw data for each data burst, and use machine learning to classify each data burst from the corresponding data vector. A method of classifying a data burst, comprising receiving an input waveform, extracting data bursts from the input waveform, deriving one or more spectral features of the data bursts, generating corresponding data vectors for each data burst from the one or more spectral features, and using machine learning to classify the data bursts from the corresponding data vectors.
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公开(公告)号：US11146280B2
公开(公告)日：2021-10-12
申请号：US16554548
申请日：2019-08-28
Applicant: Tektronix, Inc.
Inventor： Gregory A. Martin , Patrick Satarzadeh , John J. Pickerd , Daniel G. Knierim
Abstract: A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.
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公开(公告)号：US20210081630A1
公开(公告)日：2021-03-18
申请号：US17018198
申请日：2020-09-11
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd
Abstract: A test and measurement instrument for analyzing signals using machine learning. The test and measurement instrument can determine a recovered clock signal based on the digital signal, set window positions for a fast Fourier transform of the digital signal, window the digital signal into a series of windowed waveform data based on the window positions, transform each of the windowed waveform data into a frequency-domain windowed waveform data using a fast Fourier transform, and determine high-order spectrum data of each of the frequency-domain windowed waveform data. The test and measurement instrument includes a neural network configured to receive the high-order spectrum data of the frequency-domain windowed transform data and classify each windowed waveform data based on the high-order spectrum data.
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公开(公告)号：US10895588B1
公开(公告)日：2021-01-19
申请号：US15958927
申请日：2018-04-20
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , Pirooz Hojabri , Kan Tan
Abstract: A test and measurement system including a plurality of channels and one or more processors. The one or more processors are configured to cause the test and measurement system to receive, via a first channel of the plurality of channels, a positive side of a reference differential signal pair, receive, via a second channel of the plurality of channels, a negative side of the reference differential signal pair, and produce a reference signal based the reference differential signal pair. A combined signal is received, from a combiner, that is a balanced signal produced from the reference differential signal pair. A de-embed filter is generated based on the reference signal and the combined signal and an additional signal is received from the combiner and an effect of the combiner is removed from the additional signal by applying the de-embed filter to the additional signal.
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