公开(公告)号：US20220349917A1

公开(公告)日：2022-11-03

申请号：US17730096

申请日：2022-04-26

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett ,  Andrew W. Rusinek ,  David Thomas Engquist

IPC: G01R1/067 ,  G01R31/28 ,  H05K9/00

Abstract: A probe tip for an isolated probe having a triaxial cable has a conductive probe tip interface at one end of the cable, a signal conductor, the signal conductor traversing a length of the cable and electrically connected to the conductive probe tip interface, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor at least along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the probe tip, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor. A method of manufacturing a tip for an isolated probe having a triaxial cable includes accessing a shield conductor of the triaxial cable, inserting a high magnetic permeability material between the shield conductor and a reference conductor in the triaxial cable, electrically connecting the shield conductor to the reference conductor. A triaxial cable has a signal conductor, the signal conductor traversing a length of the cable, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the cable, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor.

公开(公告)号：US20220334144A1

公开(公告)日：2022-10-20

申请号：US17721294

申请日：2022-04-14

Applicant: Tektronix, Inc.

Inventor： Joshua J. O'Brien ,  Josiah A. Bartlett

IPC: G01R1/067

Abstract: A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.

公开(公告)号：US10215776B2

公开(公告)日：2019-02-26

申请号：US14923242

申请日：2015-10-26

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  Josiah A. Bartlett ,  David A. Sailor ,  Jay Schwichtenberg

IPC: G01R1/067 ,  G01R35/00 ,  G01R1/073

Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.

公开(公告)号：US20130134999A1

公开(公告)日：2013-05-30

申请号：US13734345

申请日：2013-01-04

Applicant: Tektronix, Inc.

Inventor： Josiah A. Bartlett ,  Ira G. Pollock ,  Daniel G. Knierim ,  Michael Duane Stevens

IPC: G01R23/16

CPC classification number: G01R23/16 ,  G01R1/06766 ,  G01R1/06772 ,  G01R35/00

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract translation: 信号采集系统具有信号采集探针，其具有耦合到电阻中心导体信号电缆的探针尖端电路。 信号采集探头的电阻中心导体信号电缆通过输入节点和信号处理仪器中的输入电路耦合到信号处理仪器中的补偿系统。 信号采集探头和信号处理仪器在输入节点处具有不匹配的时间常数，补偿系统具有带反馈回路电路的输入放大器和耦合到输入电路的并联极点对，提供极 - 零对以保持平坦度 信号采集系统频率带宽。

公开(公告)号：US12235291B2

公开(公告)日：2025-02-25

申请号：US17227215

申请日：2021-04-09

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett

IPC: G01R19/00 ,  G01R31/30 ,  G01R31/319

Abstract: An isolated differential current shunt measurement probe for a test and measurement system having an isolation barrier between an input side and output side of the probe. The input side is configured to receive a voltage signal across a current shunt connected to a device under test and transmit the voltage signal across the isolation barrier. The output side is configured to receive the voltage signal across the isolation barrier and output the voltage signal to a test and measurement instrument.

公开(公告)号：US12038456B2

公开(公告)日：2024-07-16

申请号：US17514987

申请日：2021-10-29

Applicant: Tektronix, Inc.

Inventor： Josiah A. Bartlett

IPC: G01R31/26 ,  G01R1/02

CPC classification number: G01R1/025 ,  G01R31/2601

Abstract: A test and measurement instrument includes one or more processors to execute code to cause the processors to: access a user instance of the test and measurement instrument; receive one or more requests from the user instance of the test and measurement instrument; determine any collisions between the one or more requests and any other requests for elements of the test and measurement instrument; resolve any collisions as necessary; perform one or more operations to fulfill the request; and display information resulting from the one or more operations on an instance user interface.

公开(公告)号：US20210148951A1

公开(公告)日：2021-05-20

申请号：US17099701

申请日：2020-11-16

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett ,  Amr Haj-Omar ,  Donald J. Dalebroux ,  Barton T. Hickman ,  Alexander Krauska

IPC: G01R13/02 ,  G01R13/22

Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.

公开(公告)号：US20190353683A1

公开(公告)日：2019-11-21

申请号：US16165928

申请日：2018-10-19

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  Josiah A. Bartlett

IPC: G01R1/067

Abstract: A test-probe tip having a tip component, a resistive element, and a compliance member. The tip component is configured to electrically connect to a device under test at a first end of the tip component. The resistive element is electrically connected to a second end of the tip component along a signal-flow axis. The resistive element is configured to provide electrical impedance to an electrical signal passing through the resistive element. The compliance member is configured to allow movement of the tip component in a first direction when a mechanical force applied to the tip component in the first direction and to cause movement of the tip component in an opposite, second direction when the mechanical force applied to the tip component is removed or reduced. Architectures for the resistive element are also described.

公开(公告)号：US20190170790A1

公开(公告)日：2019-06-06

申请号：US16162354

申请日：2018-10-16

Applicant: Tektronix, Inc.

Inventor： Josiah A. Bartlett

IPC: G01R1/04 ,  G01R1/067

Abstract: A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.

公开(公告)号：US20130245977A1

公开(公告)日：2013-09-19

申请号：US13875112

申请日：2013-05-01

Applicant: TEKTRONIX, INC.

Inventor： Josiah A. Bartlett ,  Kristie L. Veith ,  Steven K. Sullivan

IPC: G01R13/02

CPC classification number: G01R13/0254 ,  G01R13/029

Abstract: A test and measurement instrument and method for providing post-acquisition trigger control and presentation of associated waveforms on a display. An electrical signal under test is sampled and digitized, and stored in an acquisition memory as a data record. A display device draws a waveform associated with the signal under test. After the acquisition of the digital samples is stopped, a user selects trigger criteria using trigger controls such as a trigger level control. A trigger circuit detects a post-acquisition trigger event in the data record based on the trigger criteria causing an automatic adjustment of the waveform to conform to a time of the post-acquisition trigger event. One or more configurable trigger controls can be used to adjust a display of post-acquisition trigger events and waveforms. Upon resumption of the live-acquisition of data, the live waveform conforms to the newly selected trigger criteria as previewed during the post-acquisition mode.

Abstract translation: 一种用于在显示器上提供采集后触发控制和显示相关波形的测试和测量仪器和方法。 被测电信号被采样和数字化，并作为数据记录存储在采集存储器中。 显示设备绘制与被测信号相关联的波形。 在数字采样的采集停止之后，用户使用诸​​如触发电平控制的触发控制来选择触发条件。 触发电路基于触发标准来检测数据记录中的采集后触发事件，导致波形的自动调整以符合采集后触发事件的时间。 可以使用一个或多个可配置的触发控制来调整采集后触发事件和波形的显示。 在恢复数据的实时采集之后，实时波形符合在采集后模式下预览的新选择的触发条件。