Dynamic biasing circuit
    1.
    发明授权

    公开(公告)号:US10819294B1

    公开(公告)日:2020-10-27

    申请号:US16574231

    申请日:2019-09-18

    Abstract: A circuit includes first and second gain stages and an output transistor. The second gain stage includes a transconductance amplifier and a variable impedance circuit coupled to an output of the transconductance amplifier. The variable impedance circuit is configured to implement a first impedance level at frequencies below a first frequency threshold and to implement a second impedance level at frequencies above a second frequency level. The first impedance level is larger than the second impedance level. The output transistor has a control input coupled to the variable impedance circuit. At frequencies above the second frequency threshold, the second impedance level is configured to be inversely related to current through the output transistor.

    Analog-to-digital converter
    2.
    发明授权

    公开(公告)号:US10886933B1

    公开(公告)日:2021-01-05

    申请号:US16656913

    申请日:2019-10-18

    Abstract: An analog-to-digital converter (ADC) circuit includes a signal input terminal, a sample-and-hold circuit, and a successive approximation register (SAR) ADC. The sample-and-hold circuit includes an input terminal coupled to the signal input terminal. The SAR ADC includes a comparator, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a first input terminal coupled to the signal input terminal, a second input terminal coupled to an output terminal of the sample-and-hold circuit, and an output terminal coupled to a first input terminal of the comparator. The second CDAC includes a first input terminal coupled to the signal input terminal, an output terminal coupled to a second input terminal of the comparator.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US10447290B2

    公开(公告)日:2019-10-15

    申请号:US15837040

    申请日:2017-12-11

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    METHODS AND APPARATUS TO CONVERT ANALOG VOLTAGES TO DELAY SIGNALS

    公开(公告)号:US20240291484A1

    公开(公告)日:2024-08-29

    申请号:US18115657

    申请日:2023-02-28

    CPC classification number: H03K17/6872 H03K5/01 H03K2005/00078 H03M1/12

    Abstract: An example apparatus includes a first transistor configured to receive an analog voltage signal; a second transistor configured to receive a first control signal, coupled to the first transistor, and coupled to a first terminal; a third transistor configured to receive a second control signal, receive a supply voltage, and coupled to the first terminal; a capacitor coupled to the first terminal and to ground; a fourth transistor configured to receive a third control signal and coupled to the first terminal; a fifth transistor gate configured to receive a bias voltage, coupled to ground, and coupled to the fourth transistor; a sixth transistor coupled to the fourth transistor and to ground; a seventh transistor configured to receive the supply voltage, coupled to the first terminal and to the sixth transistor; and an eighth transistor coupled to the first terminal, to the sixth transistor, and to ground.

    Analog-to-digital converter
    5.
    发明授权

    公开(公告)号:US11349492B2

    公开(公告)日:2022-05-31

    申请号:US17112095

    申请日:2020-12-04

    Abstract: An analog-to-digital converter (ADC) circuit includes a signal input terminal, a sample-and-hold circuit, and a successive approximation register (SAR) ADC. The sample-and-hold circuit includes an input terminal coupled to the signal input terminal. The SAR ADC includes a comparator, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a first input terminal coupled to the signal input terminal, a second input terminal coupled to an output terminal of the sample-and-hold circuit, and an output terminal coupled to a first input terminal of the comparator. The second CDAC includes a first input terminal coupled to the signal input terminal, an output terminal coupled to a second input terminal of the comparator.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US10727852B2

    公开(公告)日:2020-07-28

    申请号:US16555265

    申请日:2019-08-29

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    Dynamic biasing circuit
    7.
    发明授权

    公开(公告)号:US11527999B2

    公开(公告)日:2022-12-13

    申请号:US17027093

    申请日:2020-09-21

    Abstract: A circuit includes first and second gain stages and an output transistor. The second gain stage includes a transconductance amplifier and a variable impedance circuit coupled to an output of the transconductance amplifier. The variable impedance circuit is configured to implement a first impedance level at frequencies below a first frequency threshold and to implement a second impedance level at frequencies above a second frequency level. The first impedance level is larger than the second impedance level. The output transistor has a control input coupled to the variable impedance circuit. At frequencies above the second frequency threshold, the second impedance level is configured to be inversely related to current through the output transistor.

    Successive approximation register analog-to-digital converter

    公开(公告)号:US10826520B1

    公开(公告)日:2020-11-03

    申请号:US16536507

    申请日:2019-08-09

    Abstract: An analog-to-digital converter includes a low voltage power supply rail, a high voltage power supply rail, successive approximation circuit, a level shifter, and a capacitive digital-to-analog converter (CDAC). The successive approximation circuitry is coupled to the low voltage power supply rail. The level shifter is coupled to the high voltage power supply rail and includes inputs coupled to first outputs of the successive approximation circuitry. The CDAC includes a first segment and a second segment. The first segment includes a first plurality of capacitors, and a first plurality of switches coupled to outputs of the level shifter. The second segment includes a second plurality of capacitors, and a second plurality of switches coupled to second outputs of the successive approximation circuitry.

    REDUCED NOISE DYNAMIC COMPARATOR FOR A SUCCESSIVE APPROXIMATION REGISTER ANALOG-TO-DIGITAL CONVERTER

    公开(公告)号:US20190181873A1

    公开(公告)日:2019-06-13

    申请号:US15837040

    申请日:2017-12-11

    CPC classification number: H03M1/089 H03K5/2481

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    Methods and apparatus to convert analog voltages to delay signals

    公开(公告)号:US12273104B2

    公开(公告)日:2025-04-08

    申请号:US18115657

    申请日:2023-02-28

    Abstract: An example apparatus includes a first transistor configured to receive an analog voltage signal; a second transistor configured to receive a first control signal, coupled to the first transistor, and coupled to a first terminal; a third transistor configured to receive a second control signal, receive a supply voltage, and coupled to the first terminal; a capacitor coupled to the first terminal and to ground; a fourth transistor configured to receive a third control signal and coupled to the first terminal; a fifth transistor gate configured to receive a bias voltage, coupled to ground, and coupled to the fourth transistor; a sixth transistor coupled to the fourth transistor and to ground; a seventh transistor configured to receive the supply voltage, coupled to the first terminal and to the sixth transistor; and an eighth transistor coupled to the first terminal, to the sixth transistor, and to ground.

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