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公开(公告)号:US10276578B2
公开(公告)日:2019-04-30
申请号:US15632378
申请日:2017-06-25
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hsin-Wen Chen , Chi-Chang Shuai , Hsien-Hung Tsai
IPC: H01L27/108 , H01L27/11 , H01L29/24
Abstract: The present invention provides a semiconductor memory circuit, the semiconductor memory circuit includes a static random access memory (SRAM), having a first storage node and a second storage node, a dynamic oxide semiconductor random access memory (DOSRAM), electrically connected to the SRAM, wherein the DOSRAM includes a first oxide semiconductor field effect transistor (OSFET) and a capacitor, wherein a source of the first OSFET is electrically connected to the first storage node, and a drain of the first OSFET is electrically connected to the capacitor, and a second transistor and a third oxide semiconductor field effect transistor (OSFET), wherein a drain of the second transistor is electrically connected to the second storage node, a source of the third OSFET is electrically connected to the capacitor, and a drain of the third OSFET is electrically connected to a gate of the third transistor.
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公开(公告)号:US20170315892A1
公开(公告)日:2017-11-02
申请号:US15140492
申请日:2016-04-28
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hsin-Wen Chen
CPC classification number: G06F11/27 , G06F11/2289 , G06F13/1689
Abstract: A memory system includes a memory device, a switch device, and a built-in self-test circuit. The memory device is for storing data and toggling a notification signal whenever a read operation or a write operation is completed. The switch device has a first input terminal for receiving an external clock signal, a second input terminal coupled to the memory device for receiving the notification signal, a select terminal for receiving a selection signal, and an output terminal for outputting a memory clock signal to the memory device. The memory clock signal is one of the external clock signal and the notification signal. The built-in self-test circuit is for outputting a control signal required by the memory device to perform the read operation or the write operation and check whether the memory device functions normally.
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公开(公告)号:US10777260B1
公开(公告)日:2020-09-15
申请号:US16655220
申请日:2019-10-16
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Zih-Yu Chiu , Hsin-Wen Chen , Ya-Nan Mou , Yuan-Hui Chen , Chung-Cheng Tsai
IPC: G11C11/00 , G11C11/412 , G11C11/419 , H01L27/11
Abstract: An SRAM cell includes two inverters and three transistors. The first inverter includes a first end coupled to a first storage node and a second end coupled to a second storage node. The second inverter includes a first end coupled to the second storage node and a second end coupled to the first storage node. The first transistor includes a first end coupled to the first storage node, a second end and a control end. The second transistor includes a first end coupled to the second end of the first transistor, a second end coupled to a first bit line, and a control end. The third transistor includes a first end coupled between the second end of the first transistor and the first end of the second transistor, a second end, and a control end coupled to the first storage node.
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公开(公告)号:US20200234765A1
公开(公告)日:2020-07-23
申请号:US16254611
申请日:2019-01-23
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Zih-Yu Chiu , Hsin-Wen Chen , Yen-Yao Wang
IPC: G11C15/04
Abstract: A cell of a content-addressable memory (CAM) has a first switch, a second switch and a storage unit. A first end of the first switch and a first end of the second switch are coupled to a matchline. The first switch is controlled by a first search signal, and the second switch is controlled by a second search signal. The second search signal is complementary to the first search signal. The storage unit has a first inverter and a second inverter. The first inverter has a first latch node coupled to a second end of the first switch. The second inverter is cross-coupled to the first inverter and has a second latch node coupled to a second end of the second switch.
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公开(公告)号:US10352986B2
公开(公告)日:2019-07-16
申请号:US15164129
申请日:2016-05-25
Applicant: United Microelectronics Corp.
Inventor: Hsin-Pang Lu , Hsin-Wen Chen
IPC: G05F1/56 , G01R31/26 , H01L49/02 , H01L27/092 , H01L21/8238
Abstract: A method for controlling voltage of a doped well in a substrate is provided. The substrate and the doped well are in different conductive type. The method includes applying a substrate voltage to the substrate while a well power for applying a well voltage to the doped well is turned off. The method also includes detecting a voltage level of one of the doped well and the substrate to judge whether or not a voltage target is reached. The well power is turned on to apply the well voltage to the doped well when the voltage level as detected reaches to the voltage target.
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公开(公告)号:US20180374856A1
公开(公告)日:2018-12-27
申请号:US15632378
申请日:2017-06-25
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hsin-Wen Chen , Chi-Chang Shuai , Hsien-Hung Tsai
IPC: H01L27/108 , H01L27/11 , H01L29/24
Abstract: The present invention provides a semiconductor memory circuit, the semiconductor memory circuit includes a static random access memory (SRAM), having a first storage node and a second storage node, a dynamic oxide semiconductor random access memory (DOSRAM), electrically connected to the SRAM, wherein the DOSRAM includes a first oxide semiconductor field effect transistor (OSFET) and a capacitor, wherein a source of the first OSFET is electrically connected to the first storage node, and a drain of the first OSFET is electrically connected to the capacitor, and a second transistor and a third oxide semiconductor field effect transistor (OSFET), wherein a drain of the second transistor is electrically connected to the second storage node, a source of the third OSFET is electrically connected to the capacitor, and a drain of the third OSFET is electrically connected to a gate of the third transistor.
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公开(公告)号:US20170345720A1
公开(公告)日:2017-11-30
申请号:US15164129
申请日:2016-05-25
Applicant: United Microelectronics Corp.
Inventor: Hsin-Pang Lu , Hsin-Wen Chen
IPC: H01L21/8234 , H01L21/66 , G05F1/56 , H01L49/02 , G01R31/26
CPC classification number: G01R31/26 , G05F1/56 , H01L21/823892 , H01L27/092 , H01L28/40
Abstract: A method for controlling voltage of a doped well in a substrate is provided. The substrate and the doped well are in different conductive type. The method includes applying a substrate voltage to the substrate while a well power for applying a well voltage to the doped well is turned off. The method also includes detecting a voltage level of one of the doped well and the substrate to judge whether or not a voltage target is reached. The well power is turned on to apply the well voltage to the doped well when the voltage level as detected reaches to the voltage target.
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公开(公告)号:US20140160861A1
公开(公告)日:2014-06-12
申请号:US13707611
申请日:2012-12-07
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hsin-Wen Chen
CPC classification number: G11C7/12 , G11C11/419
Abstract: A memory array includes a plurality of columns of memory cells and each column of memory cells of the memory array is coupled to a local voltage source, a bit line, and a bit line bar. Provide a working voltage to pre-charge the bit line and the bit line bar of the column of memory cells when a memory cell of the column of memory cells is selected to be read, and meanwhile use local voltage sources coupled to remaining columns of memory cells of the memory array to provide high voltages lower than the working voltage to pre-charge bit lines and bit line bars of the remaining columns of memory cells.
Abstract translation: 存储器阵列包括多列存储器单元,并且存储器阵列的每列存储器单元耦合到本地电压源,位线和位线条。 当选择存储单元列的存储单元被读取时,提供工作电压以对存储器单元列的位线和位线条进行预充电,同时使用耦合到剩余存储列的本地电压源 存储器阵列的单元以提供低于工作电压的高电压以对存储器单元的剩余列的位线和位线条进行预充电。
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公开(公告)号:US10885981B2
公开(公告)日:2021-01-05
申请号:US16254611
申请日:2019-01-23
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Zih-Yu Chiu , Hsin-Wen Chen , Yen-Yao Wang
IPC: G11C15/04
Abstract: A cell of a content-addressable memory (CAM) has a first switch, a second switch and a storage unit. A first end of the first switch and a first end of the second switch are coupled to a matchline. The first switch is controlled by a first search signal, and the second switch is controlled by a second search signal. The second search signal is complementary to the first search signal. The storage unit has a first inverter and a second inverter. The first inverter has a first latch node coupled to a second end of the first switch. The second inverter is cross-coupled to the first inverter and has a second latch node coupled to a second end of the second switch.
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公开(公告)号:US10032777B1
公开(公告)日:2018-07-24
申请号:US15613288
申请日:2017-06-05
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hsin-Wen Chen , Chi-Chang Shuai , Hung-Chan Lin , Ting-Hao Chang , Hsien-Hung Tsai
IPC: H01L27/108 , G06F12/0846
Abstract: An array of dynamic random access memory cells includes a first set of memory cell pairs in a first row, a second set of memory cells in a second row, and a first set of bit line contacts in the first row. The second set of memory cell pairs are disposed adjacent to the first set of memory cell pairs, and each two of the memory cell pairs in the second row include a common S/D region. Each of the first set of bit line contacts is electrically coupled to each of the common S/D regions of the memory cell pairs in the second row respectively.
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