摘要:
A memory cell is connected to a cell-based bit line. The cell-based bit line is connected to a bit line via a Y decoder. The bit line is connected to a sense bit line via a separation circuit. This sense bit line is connected to a sense line via a bias circuit. An amplifier circuit amplifies a signal voltage on the sense line together with a reference voltage for sensing data. The sense line is connected with a sense line initialization circuit for setting the sense line to a specified voltage. The bit line is connected with a bit line initialization circuit for setting the bit line to a specified voltage. Both the sense line initialization circuit and the bit line initialization circuit are activated in a given period before the amplifier circuit operates to sense data. Thus, the sense line and the bit line are set to specified voltages.
摘要:
A non-volatile semiconductor memory device includes: an array of electrically rewritable nonvolatile data storage memory cells each having a transistor structure with a control gate; reference current source circuit configured to generate a first reference current adaptable for use during an ordinary read operation and a second reference current for use during a verify-read operation for data status verification in one of writing and erasing events; a sense amplifier configured to compare read currents of a selected memory cell as selected during the ordinary read operation and the verify-read operation with the first and second reference currents respectively to thereby perform data detection; and a driver configured to give an identical voltage to the control gate of the selected memory cell presently selected during the ordinary read operation and the verify-read operation.
摘要:
A current difference divider circuit with a plurality of current sources is provided. The divider circuit includes a first current source which is operable to generate a first current, a second current source for generation of a second current less in magnitude than the first current, and a third current source for generating a difference current with its magnitude equivalent to a difference between the first and second currents and for generating a third current resulting from the division thereof. The circuit further includes a fourth current source for generating a fourth current obtainable by mirroring of the second current. The third and fourth currents are added together to provide a fifth current, which is then output.
摘要:
A nonvolatile semiconductor memory includes first and second nonvolatile memory banks, a data-line for read, a data-line for program and verify, a sense amplifier for read, a sense amplifier for program and verify, and a program circuit. The data-lines are arranged in a region between the first and second nonvolatile memory banks, and selectively connected to the bit-lines of the first and second nonvolatile memory banks. The sense amplifier for read is connected to the data-line for read. The sense amplifier for program and verify and the program circuit are connected to the data-line for program and verify.
摘要:
A current difference divider circuit with a plurality of current sources is provided. The divider circuit includes a first current source which is operable to generate a first current, a second current source for generation of a second current less in magnitude than the first current, and a third current source for generating a difference current with its magnitude equivalent to a difference between the first and second currents and for generating a third current resulting from the division thereof. The circuit further includes a fourth current source for generating a fourth current obtainable by mirroring of the second current. The third and fourth currents are added together to provide a fifth current, which is then output.
摘要:
The semiconductor memory comprises a reference current generator, first and second current converters, sense amplifiers for read, and sense amplifiers for verify. The reference current generator generates a first voltage dependent upon the current flowing through a reference cell. The first current converters, to which the first voltage is input, each generate a second voltage. The second current converters, to which the first voltage is input, each generate a third voltage. The sense amplifiers for read output data of a selection memory cell, comparing the voltage of the data-line for read with the second voltage. The sense amplifiers for verify output verify data of the selection memory cell, comparing the voltage of the data-lines for verify and the third voltage.
摘要:
A non-volatile semiconductor memory device includes: an array of electrically rewritable nonvolatile data storage memory cells each having a transistor structure with a control gate; reference current source circuit configured to generate a first reference current adaptable for use during an ordinary read operation and a second reference current for use during a verify-read operation for data status verification in one of writing and erasing events; a sense amplifier configured to compare read currents of a selected memory cell as selected during the ordinary read operation and the verify-read operation with the first and second reference currents respectively to thereby perform data detection; and a driver configured to give an identical voltage to the control gate of the selected memory cell presently selected during the ordinary read operation and the verify-read operation.
摘要:
A semiconductor memory device is provided using a sense amp circuitry capable of lowering a supply voltage. The semiconductor memory device includes an array of memory cells each configured to store data in accordance with the presence/absence or the magnitude of a current; a sense amp configured to compare a voltage caused on a sense line based on data in a memory cell selected from the array of memory cells with a reference voltage applied to a reference sense line to determine the data; and a reference voltage generator configured to generate the reference voltage applied to the reference sense line.
摘要:
A semiconductor memory device comprises memory cell array, a sense amp, and a reference voltage generator. The reference voltage generator includes a reference cell unit containing a reference cell to flow a reference current and a first current source load to supply a current to the reference cell; a reference transistor unit containing a reference transistor to flow a current reflecting the reference current and a second current source load to supply a current to the reference transistor; a control amp for negative feedback control of the reference transistor; a current source transistor; and a third current source load connected to a reference sense line.
摘要:
There is disclosed a semiconductor integrated circuit device comprising a memory cell array, row decoder, sense amplifier, column gate with two or more stages connected in series, column gate driving circuit, data latch, multiplexer, and address control circuit, and the multiplexer sequentially selects data corresponding to a predetermined address from a plurality of data latched by the data latch. The address control circuit reverses a driving signal for driving at least one stage of the column gate with two or more stages connected in series and selects the columns designated by the next selected plurality of addresses, while the multiplexer sequentially selects the data corresponding to the predetermined address.