Abstract:
A fan controller may be integrated in silicon and may use an embedded microcontroller to implement a digital fan control algorithm. The microcontroller may continually monitor temperature and sample the speed of the controlled fan. The speed of the fan may be compared to RPM values fitted on a desired curve that is representative of the Temperature-versus-RPM function for the controlled fan. The fan control algorithm may be based on a ramp-rate closed-loop controller (RRCC), which may be operated to drive the fan to the desired speed at different rates, depending on the difference between the desired RPM and the actual RPM of the fan. The fan may also provide a Fan ID feedback signal to the microcontroller, which may use the Fan ID feedback signal upon system start-up to initialize the RRCC range settings and select the appropriate Temperature-versus-RPM function curve based on pre-determined values for the given fan.
Abstract:
A current-mode direct conversion RF receiver is presented. In one set of embodiments the RF receiver comprises a simple transconductor input stage to create a current-mode modulated signal from a voltage-mode modulated signal. A downconversion mixer may be coupled to the transconductor input stage via a low impedance current cascode stage, and may operate to create a set of current-mode quadrature baseband signals from the current-mode modulated signal. The downconversion mixer may be implemented with a transistor-switching network, which may be driven by a phase locked loop (PLL) with quadrature outputs. The set of current-mode quadrature baseband signals may be converted back to the voltage domain by a transimpedance filter, which may perform channel selection for the receiver. The transimpedance filter may additionally include a low frequency zero to remove DC offsets. The receiver may be implemented using CMOS design technologies and operated with minimal self-mixing effects, minimal DC offset in the baseband signal, and utilizing low voltages.
Abstract:
A fan control system in which a sensor selection block having a number of sensor inputs may be combined with an autofan block having a number of zone inputs, where the number of sensor inputs is greater than the number of zone inputs. Each one of the sensor inputs of the sensor selection block may have a corresponding sensor parameter input. The sensor selection block may be configured to map a subset of the sensor inputs with corresponding sensor parameter inputs to the autofan block. Each zone input and corresponding zone parameter input of the autofan block may receive a corresponding one of the subset of the sensor inputs with corresponding sensor parameter inputs, respectively. The autofan block may have a number of pulse width modulated (PWM) outputs that may be calculated according to the autofan block zone inputs and zone parameter inputs.
Abstract:
A system including a serialized secondary bus architecture. The system may include an LPC bus, an I/O controller, a serialized secondary bus, and at least one slave device. The LPC bus may be connected to the I/O controller, and the at least one slave device may be connected to the I/O controller via the serialized secondary bus. The serialized secondary bus has a reduced pin count relative to the LPC bus. The I/O controller may receive bus transactions from the LPC bus. The I/O controller may translate and forward LPC bus transactions to the at least one device over the secondary bus. The I/O controller may include a processing unit. The processing unit may initiate bus transactions intended for the at least one slave device. The I/O controller may also include a bus arbitration unit. The bus arbitration unit may arbitrate ownership of the secondary bus between the processing unit and the LPC bus.
Abstract translation:一种包括序列化二次总线架构的系统。 该系统可以包括LPC总线,I / O控制器,串行化辅助总线和至少一个从设备。 LPC总线可以连接到I / O控制器,并且至少一个从设备可以经由串行辅助总线连接到I / O控制器。 串行次级总线相对于LPC总线的引脚数量减少。 I / O控制器可以从LPC总线接收总线事务。 I / O控制器可以通过辅助总线将LPC总线事务转换和转发到至少一个设备。 I / O控制器可以包括处理单元。 处理单元可以启动用于至少一个从设备的总线事务。 I / O控制器还可以包括总线仲裁单元。 总线仲裁单元可以仲裁处理单元和LPC总线之间的辅助总线的所有权。
Abstract:
A voltage regulator may include a resistor-based voltage divider circuit generating a desired output voltage from a supply voltage, an output NMOS device whose source terminal may be configured as the output of the voltage regulator and whose drain terminal may be configured to receive the supply voltage, and a control circuit configured to control the output NMOS device to maintain the desired output voltage at the output of the voltage regulator. The control circuit may be configured to receive the desired output voltage from the voltage divider circuit as a first input, and to receive the output of the voltage regulator fed back as a second input to form a feedback loop. The control circuit may control the gate of the output NMOS device via the feedback loop to adjust the output of the voltage regulator by maintaining the desired output voltage at the source of the output NMOS device, and may also clamp the output of the voltage regulator to a specified voltage that is lower than the supply voltage, without requiring a second feedback loop.
Abstract:
System and method for switching logic in a Universal Serial Bus hub. The USB hub may include upstream logic and downstream logic for sending and receiving information from a host controller and a USB device respectively. The USB hub may include a plurality of ports operable to couple to a plurality of devices, including a first port coupled to the upstream logic and a second port coupled to the downstream logic. The USB hub may also include switching logic operable to switch the upstream and the downstream logic with respect to the first port and the second port respectively. The switching logic may switch the upstream and downstream logic by decoupling the first port from the upstream logic, decoupling the second port from the downstream logic, and coupling the second port to the upstream logic. Additionally, the first port may be coupled to the downstream logic.
Abstract:
A virtual FIFO automatic data transfer mechanism. A processor unit may allocate memory space within system memory for a data transfer operation. The processing unit may also program both a source device and a target device to perform the data transfer operation. After the programming, the source and target devices perform the data transfer operation without intervention by the processing unit until completion. The source device may store data into the allocated memory space, and indicate to the target device when it has stored a predetermined number of data bytes into the allocated memory space. In response to receiving the notification message, the target device may read the stored data from the allocated memory space, and indicate to the source device when the target device has read a predetermined number of data bytes from the allocated memory space.
Abstract:
In one embodiment, a bandgap voltage reference generating circuit is configured to generate a reference voltage, and may comprise a first PN-junction whose base-emitter voltage (VBE) exhibits a curvature with respect to temperature, where a current conducted by the first PN-junction is proportional to absolute temperature (PTAT). The voltage reference generating circuit may also include a second PN-junction coupled to the first PN-junction. A control circuit coupled to the second PN-junction may be configured to inject a control current into the second PN-junction, where the control current has a negative to absolute temperature (NTAT) characteristic, the control circuit thereby operating to effectively eliminate a curvature with respect to temperature exhibited by the bandgap voltage.
Abstract:
In one set of embodiments, trimming of a reference, which may be a bandgap reference and which is configured on an integrated circuit, may be controlled by an algorithm executed by logic circuitry also configured on the integrated circuit. The bandgap reference may be configured to generate a reference voltage provided to an analog to digital converter (ADC) comprised in a temperature sensor that may also be configured on the integrated circuit. The logic circuitry may be configured to execute one or more of a variety of test algorithms, for example a Successive Approximation Method or remainder processing, that are operable to adjust values of reference trim bits used in trimming the bandgap reference. A tester system configured to perform testing of the integrated circuit may initiate execution of the test algorithm, thereby initiating the trimming process, and may wait for the test algorithm to complete within a previously defined amount of time, or may poll the logic circuitry to determine when the trimming process is complete.
Abstract:
In some embodiments, if a card in a card reader has not been accessed in a first specified amount of time, the card may be powered down. The card may be powered back up if an attempt is made to access the card. In some embodiments, if a memory card is in the memory card slot of the card reader, but has not been accessed in a second specified amount of time, the card reader may be electrically disconnected from the host controller if a sideband signal is available to signal the card reader when to electrically reconnect.