Data recorder and data producing circuit
    91.
    发明授权
    Data recorder and data producing circuit 失效
    数据记录器和数据产生电路

    公开(公告)号:US06275878B1

    公开(公告)日:2001-08-14

    申请号:US09239994

    申请日:1999-01-29

    Abstract: A data recorder for recording data onto a record medium on which a sync signal is inserted at a given interval, has a sequence controller, wherein, after receiving the command from the system controller which triggers an initiation of a recording operation, the sequence controller activates the first encoder in response to a leading end signal of the encoded block from the sync signal set-up section, activates the first encoder and the second encoder in response to a leading end signal of the next encoded block, and activates the first encoder, the second encoder and the data reader in response to a leading end signal of the next following encoded block, and wherein, during the absence of the command from the system controller which triggers an initiation of a recording operation, the sequence controller deactivates the first encoder in response to a leading end signal of an encoded block from the sync signal set-up section, deactivates the first encoder and the second encoder in response to a leading end signal of the next encoded block, and deactivates the first encoder, the second encoder and the data reader in response to a leading end signal of the next following encoded block.

    Abstract translation: 用于将数据记录到以给定间隔插入同步信号的记录介质上的数据记录器具有序列控制器,其中在从系统控制器接收到触发记录操作开始的命令之后,序列控制器激活 第一编码器响应于来自同步信号建立部分的编码块的前端信号,响应于下一编码块的前端信号激活第一编码器和第二编码器,并激活第一编码器, 所述第二编码器和所述数据读取器响应于所述下一个后续编码块的前端信号,并且其中,在不存在触发记录操作开始的系统控制器的命令的情况下,所述序列控制器使所述第一编码器 响应于来自同步信号设置部分的编码块的前端信号,在第一编码器和第二编码器的响应中停用 nse到下一个编码块的前导信号,并且响应于下一个后续编码块的前导信号去激活第一编码器,第二编码器和数据读取器。

    Disk-rotation control apparatus
    92.
    发明授权
    Disk-rotation control apparatus 失效
    盘旋转控制装置

    公开(公告)号:US6118742A

    公开(公告)日:2000-09-12

    申请号:US058844

    申请日:1998-04-13

    CPC classification number: G11B19/247

    Abstract: If a determination is made that a signal is not normally detected by the pre-pit-region detection circuit 53, an error signal is obtained from a pulse generator 58 to control the rotations of the disk 50. If a determination is made that a signal is normally detected by the pre-pit-region detection circuit 53 and if the synchronizing signals are not normally detected at predetermined intervals, an error signal is obtained from the wobble signal so that the rotations of the disk 50 are controlled. If a determination is made that synchronizing signals are detected by the pre-pit-region detection circuit 53 at predetermined intervals, an error signal is obtained from clocks synchronized with the reproduced signal generated by the PLL circuit 54 so that rotations of the disk 50 are controlled.

    Abstract translation: 如果确定信号未被预凹坑区域检测电路53正常检测到,则从脉冲发生器58获得误差信号以控制盘50的旋转。如果确定信号 通常由预凹坑区域检测电路53检测到,并且如果以预定间隔不正常地检测到同步信号,则从摆动信号获得误差信号,从而控制盘50的旋转。 如果确定了预定间隔检测电路53以预定间隔检测到同步信号,则从与PLL电路54产生的再现信号同步的时钟获得误差信号,使得盘50的旋转为 受控。

    Method for measuring crystal defect and equipment using the same
    93.
    发明授权
    Method for measuring crystal defect and equipment using the same 有权
    测量晶体缺陷的方法及使用其的设备

    公开(公告)号:US6108079A

    公开(公告)日:2000-08-22

    申请号:US245195

    申请日:1999-02-05

    CPC classification number: G01N21/9501 H01L22/12 H01L2924/0002

    Abstract: In order to measure an inner defect of a sample with a certain high accuracy even if the sample surface of the moved up and down by flatness irregularity of the sample and problem on accuracy of the sample movement stage, incident light beams having two wavelength and respective different penetration depths for the sample are slantingly irradiated on the surface of the moving sample 15 from irradiation optical systems 4, 8, and the inner defect of the sample is measured by detecting the scattering light occurred from the interior of the sample with a detection optical system 9 arranged over the sample surface. A distance measurement means 14 is located in an upstream of a movement direction of said sample than said irradiation optical system 4, 8 and said detection optical system 9, thereby a surface height of said sample is measured. When a measured point on sample measured by the distance measurement means 14 is arrived at a lower part of the detection optical system 9, height positions of the irradiation optical system and the detection optical system are controlled by piezo electric elements 11,12,13 so that the irradiation optical system and the detection optical system are located at predetermined positions relating to the measured point.

    Abstract translation: 为了以一定的高精度测量样品的内部缺陷,即使样品的平坦度不均匀性上下移动的样品表面和样品移动台的精度问题,具有两个波长的入射光束和相应的 样品的不同穿透深度从照射光学系统4,8倾斜地照射在移动样品15的表面上,并且通过用检测光学检测从样品内部发生的散射光来测量样品的内部缺陷 系统9布置在样品表面上。 距离测量装置14位于所述样品的移动方向的上游,比所述照射光学系统4,8和所述检测光学系统9,从而测量所述样品的表面高度。 当通过距离测量装置14测量的样品上的测量点到达检测光学系统9的下部时,照射光学系统和检测光学系统的高度位置由压电元件11,12,13所控制 照射光学系统和检测光学系统位于与测量点相关的预定位置处。

    Spectrophotometer with a system for calibrating a monochromator
    94.
    发明授权
    Spectrophotometer with a system for calibrating a monochromator 失效
    分光光度计,带有校准单色仪的系统

    公开(公告)号:US5557404A

    公开(公告)日:1996-09-17

    申请号:US405652

    申请日:1995-03-17

    CPC classification number: G01J3/18 G01J2003/2866

    Abstract: Irregular mechanical imperfections caused by constituent parts of a monochromator in connection with wavelength setting are compensated by calibrating the monochromator according to the present invention. A whole measurable spectral range in the monochromator is divided into a plurality of spectral regions by a plurality of calibration wavelengths. Errors between apparent wavelengths set theoretically and their true wavelengths are obtained with respect to the respective calibration wavelengths. Error functions in connection with the respective spectral regions are calculated on the basis of the array of the obtained errors. An element to be detected in a sample is measured under a wavelength the error of which has been compensated for by use of an error function in a spectral region associated with a wavelength to be detected.

    Abstract translation: 通过校准本发明的单色仪来补偿由与单色仪的波长设定有关的组成部分引起的不规则的机械缺陷。 单色仪中的整个可测量光谱范围被多个校准波长分成多个光谱区域。 理论上设定的表观波长与其相应校准波长之间的真实波长的误差。 基于获得的误差的阵列来计算与相应的光谱区域相关的误差函数。 通过在与要检测的波长相关联的光谱区域中使用误差函数对其误差进行了补偿的波长进行测量。

    Polarization interferometer
    96.
    发明授权
    Polarization interferometer 失效
    偏振干涉仪

    公开(公告)号:US4732481A

    公开(公告)日:1988-03-22

    申请号:US42244

    申请日:1987-04-24

    CPC classification number: G01B9/02024 G01B9/02057 G01J3/4537 G01B2290/70

    Abstract: A polarization interferometer includes a light source to be measured, a Wollaston prism, a pair of polarizers arranged in such a manner that the Wollaston prism is interposed between the polarizers and the plane of polarization of each polarizer is inclined at 45.degree. to each of two crystallographic axes of the Wollaston prism, a photodetector for detecting an interference fringe which is spatially formed by two light beams separated by the Wollaston prism, changeover means for causing one of the polarizers to changeover from one of polarizing and non-polarizing states to the other state, memory means for storing a first output signal which is delivered from the photodetector in a state that one polarizer is kept at the non-polarizing state, and means for dividing a second output signal which is delivered from the photodetector in a state that one polarizer is kept at the polarizing state, by the first output signal stored in the memory means.

    Abstract translation: 偏振干涉仪包括待测量的光源,Wollaston棱镜,以这样的方式布置的一对偏振器,使得Wollaston棱镜插入在偏振器之间并且每个偏振器的偏振面之间倾斜45° Wollaston棱镜的晶轴,用于检测由由Wollaston棱镜分离的两个光束空间形成的干涉条纹的光电检测器,用于使偏振器之一从偏振和非偏振状态之一转换到另一个的转换装置 状态,用于存储在一个偏振器保持在非偏振状态的状态下从光电检测器传送的第一输出信号的存储装置,以及用于将从光电检测器传送的第二输出信号划分为一个 通过存储在存储装置中的第一输出信号将偏振器保持在偏光状态。

    Method of measuring the static magnetic field distribution in an NMR
inspection system
    97.
    发明授权
    Method of measuring the static magnetic field distribution in an NMR inspection system 失效
    在NMR检查系统中测量静态磁场分布的方法

    公开(公告)号:US4672318A

    公开(公告)日:1987-06-09

    申请号:US696909

    申请日:1985-01-31

    CPC classification number: G01R33/24

    Abstract: A method of measuring a static magnetic field distribution in a nuclear magnetic resonance (NMR) inspection system which comprises magnetic field generator for producing a static magnetic field, inclination or gradient magnetic fields and a high-frequency magnetic field, a signal detector for sensing nuclear magnetic resonance signals from an inspection sample, a computer for processing output signals from the signal detector and an output device for providing a computational result of the computer, wherein a time interval t.sub.1 from the center of a 90.degree.-pulse high-frequency magnetic field to the center of a 180.degree.-pulse high-frequency magnetic field is made different by a time difference t.sub.0 from a time interval t.sub.2 from the center of the 180.degree.-pulse high-frequency magnetic field to a peak of a spin echo, so that static magnetic field distribution is calculated based on the computer output which corresponds to the difference of the two time intervals.

    Abstract translation: 一种在核磁共振(NMR)检查系统中测量静磁场分布的方法,其包括用于产生静磁场,倾斜或梯度磁场和高频磁场的磁场发生器,用于感测核的信号检测器 来自检查样本的磁共振信号,用于处理来自信号检测器的输出信号的计算机和用于提供计算机的计算结果的输出装置,其中从90°脉冲高频磁场的中心起的时间间隔t1 从180°脉冲高频磁场的中心到从180°脉冲高频磁场的中心到自旋回波的峰值的时间间隔t2由时间差t0变化到180°脉冲高频磁场的中心,因此 基于对应于两个时间间隔的差的计算机输出来计算静态磁场分布。

    Waterproof watch case
    98.
    发明授权
    Waterproof watch case 失效
    防水表壳

    公开(公告)号:US4117658A

    公开(公告)日:1978-10-03

    申请号:US721146

    申请日:1976-09-07

    CPC classification number: G04B37/084

    Abstract: A waterproof watch case construction depends on gaskets alone for waterproofing and is free of cement. The construction is such that a broken crystal can be readily replaced, and the watch case itself can be of any shape, including square, ovoid and hexagonal, as well as circular. The watch crystal is located positively by means of a bezel and a ring which compress a gasket both axially and radially against the watch crystal.

    Abstract translation: 防水表壳的构造取决于垫片单独用于防水,并且不含水泥。 该结构使得可以容易地更换破碎的晶体,并且表壳本身可以是任何形状,包括方形,卵形和六边形以及圆形。 手表晶体通过一个边框和一个环来定位,该表圈将垫圈沿轴向和径向压靠在手表晶体上。

    Touch response sensor for an electronic musical instrument
    99.
    发明授权
    Touch response sensor for an electronic musical instrument 失效
    触摸电子乐器的响应传感器

    公开(公告)号:US4079651A

    公开(公告)日:1978-03-21

    申请号:US762558

    申请日:1977-01-25

    Applicant: Shigeru Matsui

    Inventor: Shigeru Matsui

    CPC classification number: G10H1/0558 Y10S84/07

    Abstract: This invention relates to a touch response sensor for an electronic musical instrument which may control the volume, pitch, tone-color or the like of the musical tones produced by the instrument upon depression of the key responsive to the key depressing pressure. In order to detect the key depressing pressure, the touch response sensor has an electrically conductive resilient member having two legs downwardly extending therefrom for producing resistance variations between contact pieces provided on a base plate under the resilient member in response to the key depressing pressure. The contact pieces are, for example, connected via lines to a voltage-controlled variable-frequency oscillator circuit, voltage-controlled variable filter circuit, voltage-controlled variable gain amplifier circuit or the like so as to vary the volume and the like of the tones in accordance with the key depressing pressure.

    Abstract translation: 本发明涉及一种用于电子乐器的触摸响应传感器,其可以响应于按键按压而按下按键时可以控制由乐器产生的乐音的音量,音高,色调等。 为了检测键按压压力,触摸响应传感器具有导电弹性构件,其具有从其向下延伸的两个腿,用于响应于按键压力而产生设置在弹性构件下方的底板上的接触片之间的电阻变化。 接触片例如通过线路连接到压控可变频率振荡器电路,压控可变滤波器电路,压控可变增益放大器电路等,以便改变其容量等 音调按照按键压力。

    Light source device, surface inspecting apparatus using the device, and method for calibrating surface inspecting apparatus using the device
    100.
    发明授权
    Light source device, surface inspecting apparatus using the device, and method for calibrating surface inspecting apparatus using the device 有权
    光源装置,使用该装置的表面检查装置以及使用该装置校准表面检查装置的方法

    公开(公告)号:US08743357B2

    公开(公告)日:2014-06-03

    申请号:US13058081

    申请日:2009-07-15

    CPC classification number: G01N21/93 G01N21/94 G01N21/9501

    Abstract: A surface inspecting apparatus can inspect a smaller defect by using a PSL of a smaller particle size. However, the particle size of the PSL is restricted. In the conventional surface inspecting apparatus, therefore, no consideration has been taken as to how to inspect the defect of such a small particle size as is not set in the PSL which will be needed in the near future in an inspection of a semiconductor manufacturing step. The invention has a light source device for generating light which simulated at least one of a wavelength, a light intensity, a time-dependent change of the light intensity, and a polarization of light which was scattered, diffracted, or reflected by an inspection object, and the light is inputted to a photodetector of the surface inspecting apparatus. The smaller defect can be inspected.

    Abstract translation: 表面检查装置可以通过使用较小粒径的PSL来检查较小的缺陷。 然而,PSL的粒径受到限制。 因此,在传统的表面检查装置中,在半导体制造步骤的检查中,不考虑如何检查在不久的将来需要的PSL中未设置的这种小粒径的缺陷 。 本发明具有用于产生光的光源装置,其模拟由检查对象散射,衍射或反射的光的波长,光强度,时间依赖性变化和光的偏振中的至少一个 并且光被输入到表面检查装置的光电检测器。 可以检查较小的缺陷。

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