Current Measurement in a Power Transistor
    91.
    发明申请
    Current Measurement in a Power Transistor 有权
    功率晶体管中的电流测量

    公开(公告)号:US20130181723A1

    公开(公告)日:2013-07-18

    申请号:US13350601

    申请日:2012-01-13

    IPC分类号: G01R35/00

    摘要: A circuit arrangement includes a load transistor and a sense transistor. The first load terminal of the load transistor is coupled to the first load terminal of the sense transistor. A measurement circuit comprising a current source configured to provide a calibration current, the measurement circuit configured to measure a first voltage between the first load terminal and the second load terminal of the sense transistor in the on-state of the sense transistor, to determine a resistance of the sense transistor based on the calibration current and the first voltage, to measure a second voltage between the first load terminal and the second load terminal of the load transistor in the on-state of the load transistor, and to determine a load current through the load transistor based on the resistance of the sense transistor and the second voltage.

    摘要翻译: 电路装置包括负载晶体管和感测晶体管。 负载晶体管的第一负载端子耦合到感测晶体管的第一负载端子。 一种测量电路,包括被配置为提供校准电流的电流源,所述测量电路被配置为在所述感测晶体管的导通状态下测量所述感测晶体管的所述第一负载端子和所述第二负载端子之间的第一电压,以确定 基于校正电流和第一电压的感测晶体管的电阻,在负载晶体管的导通状态下测量负载晶体管的第一负载端子和第二负载端子之间的第二电压,并且确定负载电流 通过基于感测晶体管的电阻和第二电压的负载晶体管。

    Semiconductor device with edge termination structure
    92.
    发明授权
    Semiconductor device with edge termination structure 有权
    具有边缘端接结构的半导体器件

    公开(公告)号:US08466492B1

    公开(公告)日:2013-06-18

    申请号:US13362005

    申请日:2012-01-31

    IPC分类号: H01L29/02

    摘要: A semiconductor device includes a semiconductor body including a first surface, an inner region and an edge region, a first doped device region of a first doping type in the inner region and the edge region, a second device region forming a device junction in the inner region with the first device region, and a plurality of at least two dielectric regions extending from the first surface into the semiconductor body. Two dielectric regions that are adjacent in a lateral direction of the semiconductor body are separated by a semiconductor mesa region. The semiconductor device further includes a resistive layer connected to the second device region and connected to at least one semiconductor mesa region.

    摘要翻译: 半导体器件包括半导体本体,其包括第一表面,内部区域和边缘区域,在内部区域和边缘区域中的第一掺杂型的第一掺杂器件区域,在内部形成器件结的第二器件区域 具有第一器件区域的区域,以及从第一表面延伸到半导体本体中的多个至少两个电介质区域。 在半导体本体的横向相邻的两个电介质区域被半导体台面区域隔开。 半导体器件还包括连接到第二器件区并连接到至少一个半导体台面区的电阻层。

    SEMICONDUCTOR COMPONENT ARRANGEMENT HAVING A COMPONENT WITH A DRIFT ZONE AND A DRIFT CONTROL ZONE
    100.
    发明申请
    SEMICONDUCTOR COMPONENT ARRANGEMENT HAVING A COMPONENT WITH A DRIFT ZONE AND A DRIFT CONTROL ZONE 有权
    具有DRIFT区域和DRIFT控制区域的组件的半导体组件安装

    公开(公告)号:US20090322417A1

    公开(公告)日:2009-12-31

    申请号:US12163037

    申请日:2008-06-27

    IPC分类号: G05F1/10

    摘要: Disclosed is a semiconductor including a component having a drift zone and a drift control zone. A first connection zone is adjacent to the drift zone and is doped more highly than the drift zone. A drift control zone is arranged adjacent to the drift zone and is coupled to the first connection zone. A drift control zone is dielectric arranged between the drift zone and the drift control zone. At least one rectifier element is arranged between the first connection zone and the drift control zone. A charging circuit is connected to the drift control zone.

    摘要翻译: 公开了一种包括具有漂移区和漂移控制区的分量的半导体。 第一连接区域与漂移区相邻,并且掺杂比漂移区更高。 漂移控制区被布置成与漂移区相邻并且耦合到第一连接区。 漂移控制区是介于漂移区和漂移控制区之间的电介质。 至少一个整流元件布置在第一连接区域和漂移控制区域之间。 充电电路连接到漂移控制区。