公开(公告)号：US20040177700A1

公开(公告)日：2004-09-16

申请号：US10650059

申请日：2003-08-27

申请人： Rigaku Corporation

发明人： Ryouichi Yokoyama ,  Kamihisa Endo

IPC分类号： G01L001/24

CPC分类号： G01N23/207 ,  H01L21/31691

摘要： A stress of a c-axis-oriented specimen of a tetragonal polycrystal is measured using X-ray diffraction under the assumption of a plane stress state. An X-ray optical system is set in the location of nullnull0null, 45null or 90null. An X-ray diffracted at a crystal plane (the direction of the normal thereto is the direction of an angle of null) with the Miller indices (hkl) is detected. A diffraction angle null in a strain state is measured in the vicinity of a Bragg's angle null0 in a non-strain state. Strains null with respect to a plurality of null are calculated from the difference between the measurement values null and the Bragg's angle null0. Specific stress calculation formulae are determined with respect to the tetragonal system having the Laue symmetry 4/mmm. The stress is calculated from the slope of the linear line of plotted measurement results.

摘要翻译： 在假设平面应力状态下，使用X射线衍射测量四方晶体的c轴取向试样的应力。 X射线光学系统设置在phi = 0°，45°或90°的位置。 检测在米勒指数（hk1）处在晶面（法线方向为角度方向）的X射线衍射的X射线。 在非应变状态下在布拉格角θ0附近测量应变状态下的衍射角θ。 从测量值θ和布拉格角θ0之间的差计算相对于多个psi的菌株ε。 相对于具有Laue对称性4 / mmm的四方晶系确定比应力计算公式。 应力由绘制的测量结果的线性线的斜率计算。

公开(公告)号：US20040136496A1

公开(公告)日：2004-07-15

申请号：US10743896

申请日：2003-12-22

发明人： Dennis William Mueller ,  Russell F. Pinizzotto

IPC分类号： G01N023/20

CPC分类号： H05G1/00 ,  G01N23/207

摘要： In one embodiment, a portable apparatus adapted to be battery powered is used to scan an object in situ with x-rays and measure the intensity of the diffracted x-rays. The apparatus includes a scanning head having an x-ray source that is battery powered and an x-ray detector. The x-ray source and the x-ray detector are aligned in one of a plurality of predetermined alignments such that x-rays from the x-ray source are incident upon an object at a specific angle and the x-ray detector is aligned to detect x-rays that are diffracted at a specific angle, wherein the specific angle is a Bragg angle for a particular plane of atoms in the object.

摘要翻译： 在一个实施例中，适用于电池供电的便携式设备用于利用x射线原位扫描物体并测量衍射X射线的强度。 该装置包括具有电池供电的x射线源和x射线检测器的扫描头。 X射线源和X射线检测器以多个预定对准中的一个对准，使得来自x射线源的x射线以特定角度入射到物体上，并且x射线检测器对准 检测以特定角度衍射的X射线，其中特定角度是对象中特定原子平面的布拉格角。

公开(公告)号：US20040096894A1

公开(公告)日：2004-05-20

申请号：US09859722

申请日：2001-05-17

发明人： William Stuart Somers ,  Jin Tang ,  Raymond Camphausen ,  Jasbir Seehra

IPC分类号： C12Q001/68 ,  G01N033/53 ,  C07K014/47 ,  C07K014/415

CPC分类号： C07K14/70564 ,  A61K38/00 ,  C07K14/70596 ,  C07K2299/00 ,  G01N23/207

摘要： The present invention relates to the crystal and three dimensional structures of the lectin and EGF-like (LE) domains of P-selectin, the crystal and three dimensional structures of P-selectin LE and E-selectin LE each complexed with SLeX, as well as the crystal and three dimensional structure of P-selectin LE complexed with a functional PSGL-1 peptide modified by both tyrosine sulfation and SLeX. The present invention also provides methods for identifying agents which activate or inhibitor each of the foregoing structures. In addition, the present invention provides agents identified by such methods.

摘要翻译： 本发明涉及P-选择蛋白的凝集素和EGF样（LE）结构域的晶体和三维结构，P选择素LE和E-选择蛋白LE的晶体和三维结构各自与SLe ，以及与由酪氨酸硫酸化和SLe X修饰的功能性PSGL-1肽复合的P-选择蛋白LE的晶体和三维结构。 本发明还提供用于鉴定激活或抑制每种前述结构的试剂的方法。 此外，本发明提供了通过这些方法鉴定的药剂。

公开(公告)号：US06457862B1

公开(公告)日：2002-10-01

申请号：US09611531

申请日：2000-07-06

申请人： Koushi Sumii ,  Kiyotaka Kasai

发明人： Koushi Sumii ,  Kiyotaka Kasai

IPC分类号： H05G100

CPC分类号： G01N23/207

摘要： An analyzer system to ease sample handling having a sample exchanger with an analyzer apparatus, a sample table, and a transfer unit for taking the sample from the table into the analyzer apparatus. The sample table includes a base and a tray for holding the samples supported so they tray can be pulled out in front of the base. With this, it is possible for an operator to handle the samples easily, in particular samples located deep on the table usually difficult to handle. The operator may pull out the tray in the front direction from the base, without having to stand. The tray may be separately carried to a computer controller of the analyzer apparatus, thereby enabling input of sample data while mounting or installing the samples onto the tray to prevent erroneous inputting.

摘要翻译： 一种分析仪系统，用于使具有分析装置的样品交换器，样品台和用于将样品从工作台中取出进入分析装置的转印单元的样品处理。 样品台包括基座和托盘，用于保持支撑的样品，使得托盘可以在基座前拉出。 因此，操作者可以容易地处理样品，特别是位于桌子深处的样品通常难以处理。 操作者可以从底座向前方向拉出托盘，而不必站立。 托盘可以分开地携带到分析仪装置的计算机控制器上，从而可以在将样品安装或安装到托盘上的同时输入样本数据，以防止错误的输入。

公开(公告)号：US06349273B1

公开(公告)日：2002-02-19

申请号：US09241068

申请日：1999-02-01

申请人： Tsutomu Shinzawa

发明人： Tsutomu Shinzawa

IPC分类号： G06G748

CPC分类号： G21K1/00 ,  G01N23/207

摘要： An atomic coordinates generating method generating an atomic coordinate position within a rectangular parallelepiped as an outer frame of a crystal having a predetermined plane orientation derives a sphere circumscribing the rectangular parallelepiped, derives a cubic circumscribing the sphere, generates atomic coordinates within the cubic, provides rotation for the generated atomic coordinates for matching a bottom of the cubic with the plane orientation, checks whether the atomic coordinates after rotation are present within a rectangular parallelepiped having the predetermined plane orientation, and selects only coordinates present within the rectangular parallelepiped.

摘要翻译： 生成作为具有预定平面取向的晶体的外框的长方体内的原子坐标位置的原子坐标生成方法导出围绕长方体的球体，导出围绕球体的立方体，产生立方体内的原子坐标，提供旋转 对于用于将立方体的底部与平面取向匹配的生成的原子坐标，检查旋转之后的原子坐标是否存在于具有预定平面取向的长方体内，并且仅选择存在于长方体内的坐标。

公开(公告)号：US5717733A

公开(公告)日：1998-02-10

申请号：US454909

申请日：1995-05-31

申请人： Alexey V. Kurbatov ,  Pavel I. Lazarev

发明人： Alexey V. Kurbatov ,  Pavel I. Lazarev

IPC分类号： G01N23/20 ,  A61B6/00 ,  A61B6/06 ,  G01N23/207

CPC分类号： G01N23/207

摘要： A method and device for examining the internal structure of an object uses diffracted X-rays or other penetrating radiation. In one embodiment, spatial filters proximate to a source of radiation transmit an array of divergent pixel-beams which irradiate an object being examined. The object absorbs, refracts, diffracts, and incoherently scatters radiation from the pixel-beams. Spatial filters proximate to a detector block undeflected and refracted radiation which exits the object. The detector separately measures diffracted radiation for each pixel-beam. For example, an integral of the diffracted intensity around a pixel-beam provides a pixel intensity in an image of the object. Alternatively, analyzing the intensity in a diffraction pattern around a pixel-beam can identify structures and materials within the object. A non-invasive procedure identifies abnormal tissue by measuring radiation diffracted at an angle characteristic of the diffraction pattern for abnormal tissue. In one embodiment of the invention, two spatial filters which form the pixel-beams have arrays of apertures with apertures in the first and second filters along lines from the source. This allow the pixel-beams to be divergent and increases the percentage of usable radiation from the source.

摘要翻译： 用于检查物体的内部结构的方法和装置使用衍射X射线或其他穿透辐射。 在一个实施例中，靠近辐射源的空间滤波器传送照射被检查物体的发散像素束阵列。 物体吸收，折射，衍射和不连续散射来自像素束的辐射。 靠近检测器块的空间滤波器不偏转和折射离开物体的辐射。 检测器分别测量每个像素束的衍射辐射。 例如，像素束周围的衍射强度的积分在物体的图像中提供像素强度。 或者，分析围绕像素束的衍射图案中的强度可以识别对象内的结构和材料。 非侵入性过程通过测量以异常组织的衍射图案的角度特征衍射的辐射来识别异常组织。 在本发明的一个实施例中，形成像素光束的两个空间滤光器具有沿着源自线的第一和第二滤光器中的孔的阵列。 这允许像素束是发散的并且增加来自源的可用辐射的百分比。

公开(公告)号：US5459770A

公开(公告)日：1995-10-17

申请号：US157136

申请日：1993-12-06

申请人： Ekhard K. H. Salje

发明人： Ekhard K. H. Salje

IPC分类号： G01N23/207

CPC分类号： G01N23/207

摘要： An X-ray diffractometer has an X-ray source for producing an X-ray beam; a position sensitive detector for detecting diffracted X-rays over a wide angle; and means for effecting controlled relative rotation between the detector and the X-ray source incident beam. A sample holder is capable of rotation about three mutually perpendicular axes and is also capable of providing rotation of the sample relative to the sample holder about two perpendicular axes. Thin films or substrates under investigation can be individually aligned into selected diffraction geometries by such a diffractometer. The X-ray source itself may be rotatable about the axis of the X-ray beam.

摘要翻译： PCT No.PCT / GB92 / 01861 Sec。 371日期：1993年12月6日 102（e）日期1993年12月6日PCT提交1992年10月12日PCT公布。 出版物WO93 / 08462 日期：1993年04月29日。X射线衍射仪具有用于产生X射线束的X射线源; 用于在广角上检测衍射X射线的位置敏感检测器; 以及用于在检测器和X射线源入射光束之间进行受控的相对旋转的装置。 样品架能够围绕三个相互垂直的轴线旋转，并且还能够提供样品相对于样品保持器围绕两个垂直轴的旋转。 研究中的薄膜或基底可以通过这种衍射仪单独排列成选定的衍射几何形状。 X射线源本身可以围绕X射线束的轴线旋转。

公开(公告)号：US5446777A

公开(公告)日：1995-08-29

申请号：US287053

申请日：1994-08-08

申请人： Eliberthus Houtman

发明人： Eliberthus Houtman

IPC分类号： G01N23/20 ,  G01N23/207 ,  G01N23/02

CPC分类号： G01N23/20008 ,  G01N23/207

摘要： For position-sensitive measurements, an X-ray analysis system comprises a one-dimensional position-sensitive detector and a detection Soller slit system in order to achieve position sensitivity in a direction transversely of the dispersion direction of the detector. Different position-sensitive measurement methods can be carried out by adaptation of the Soller slit system and the orientation of the one-dimensional position-sensitive detector.

摘要翻译： 对于位置敏感测量，X射线分析系统包括一维位置敏感检测器和检测索勒狭缝系统，以在横向于检测器的色散方向的方向上实现位置灵敏度。 可以通过适应Soller狭缝系统和一维位置敏感检测器的取向来进行不同的位置敏感测量方法。

公开(公告)号：US5432832A

公开(公告)日：1995-07-11

申请号：US100142

申请日：1993-08-02

申请人： Christopher J. L. Moore ,  James H. Fierling

发明人： Christopher J. L. Moore ,  James H. Fierling

IPC分类号： G01N23/207

CPC分类号： G01N23/207

摘要： A combination of X-ray diffractometer and solid state detector is much faster than previous diffractometers and detectors in that X-ray photons that impinge on the detector do not have to be counted in the single photon counting mode.

摘要翻译： X射线衍射仪和固体状态检测器的组合比以前的衍射仪和检测器快得多，因为在单光子计数模式下，不必对入射到检测器上的X射线光子进行计数。

公开(公告)号：US5406609A

公开(公告)日：1995-04-11

申请号：US44508

申请日：1993-04-09

申请人： Tomoya Arai ,  Takashi Shoji

发明人： Tomoya Arai ,  Takashi Shoji

IPC分类号： G01N23/207 ,  G01N23/223 ,  G21K1/06

CPC分类号： B82Y10/00 ,  G01N23/207 ,  G01N23/223 ,  G21K1/062 ,  G01N2223/076 ,  G21K2201/061 ,  G21K2201/064

摘要： An X-ray analysis apparatus including an artificial multi-layered grating for rendering X-ray beams to be monochromatic before they are incident on a specimen to be analyzed. This artificial multi-layered grating operates to diffract the X-ray beam, generated from an X-ray radiation source and subsequently impinging on a reflective surface of the artificial multi-layered grating, at a predetermined angle of diffraction to provide the monochromatic X-ray beams. The periodicity of the spacing of lattice planes of the artificial multi-layered grating is so chosen as to be of a value progressively varying along the reflective surface thereof with an increase in distance from the X-ray radiation source. The X-ray analysis apparatus herein disclosed is designed to avoid any possible reduction of the intensity of the X-ray beams which would occur when they are rendered to be monochromatic, and to increase the intensity of the X-ray beams to ensure an improved accuracy in spectroscopic analysis.

摘要翻译： 一种X射线分析装置，其包括人造多层光栅，用于在将X射线束入射到待分析的样本上之前使其成为单色。 这种人造多层光栅操作以衍射由X射线辐射源产生并随后以预定的衍射角撞击在人造多层光栅的反射表面上的X射线束，以提供单色X- 射线束。 人造多层光栅的晶格间距的周期性被选择为随着其与X射线辐射源的距离的增加而沿其反射表面逐渐变化的值。 这里公开的X射线分析装置被设计成避免当它们变为单色时将发生的X射线束的强度的任何可能的降低，并且增加X射线束的强度以确保改善 光谱分析的准确性。