公开(公告)号：US20180024166A1

公开(公告)日：2018-01-25

申请号：US15718430

申请日：2017-09-28

Applicant: TECHNOPROBE S.p.A.

Inventor： Daniele Acconcia ,  Raffaele Vallauri

IPC: G01R1/073 ,  G01R1/067

CPC classification number: G01R1/07378 ,  G01R1/06716 ,  G01R1/06733 ,  G01R1/06744 ,  G01R1/06755 ,  G01R1/06772 ,  G01R1/07314 ,  G01R1/07357

Abstract: It is described a contact probe for a testing head for a testing apparatus of electronic devices, the probe comprising a probe body extended in a longitudinal direction between respective end portions adapted to contact respective contact pads, the second end being a contact tip adapted to abut onto a contact pad of the device under test, the body of each contact probe having a length of less than 5000 μm, and including at least one pass-through opening extending along its longitudinal dimension. Conveniently, the at least one pass-through opening is filled by a filling material, in order to define at least one first and one second lateral portions in the body, being parallel and joined to each other by a connecting central portion realized by the filling material at the pass-through opening, the connecting central portion made of the filling material acting as a strengthening element.

公开(公告)号：US20170269125A1

公开(公告)日：2017-09-21

申请号：US15309776

申请日：2016-03-09

Applicant: TECHNOPROBE S.P.A.

Inventor： Roberto CRIPPA ,  Giuseppe CRIPPA ,  Raffaele VALLAURI

IPC: G01R1/067

CPC classification number: G01R1/06738 ,  G01R1/06716 ,  G01R1/06755 ,  G01R1/06761 ,  G01R1/073 ,  G01R1/07314 ,  G01R1/07357 ,  H01R13/03 ,  H01R13/2464

Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.

公开(公告)号：US20160377656A1

公开(公告)日：2016-12-29

申请号：US15257443

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Rafaele Vallauri ,  Giuseppe Crippa

IPC: G01R1/073

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on opposite sides thereof. Conveniently, the probe card comprises a support which is joined to the intermediate support, which is made of a material compatible with the printed circuit board technologies and has a coefficient of thermal expansion greater than 10×10−6° C.−1, the support being made of a metal material having a coefficient of thermal expansion lower than 6×10−6° C.−1.

Abstract translation: 用于电子设备测试装置的探针卡包括容纳多个接触探针的至少一个测试头，每个接触探针具有至少一个适于邻接被测器件的接触垫的接触尖端，以及支撑板 与加强件相关联的测试头和中间支撑件，其连接到支撑板并且适于提供在其相对侧上形成的接触垫之间的距离的空间变换。 方便地，探针卡包括与中间支撑件相连的支撑件，该中间支架由与印刷电路板技术相兼容的材料制成并具有大于10×10-6℃-1的热膨胀系数， 支撑体由热膨胀系数低于6×10 -6℃-1的金属材料制成。

公开(公告)号：US20150048856A1

公开(公告)日：2015-02-19

申请号：US14528774

申请日：2014-10-30

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Vettori ,  Riccardo Liberini

IPC: G01R1/073 ,  G01R1/067

CPC classification number: G01R1/07364 ,  G01R1/06733 ,  G01R1/07314 ,  G01R1/07378 ,  G01R31/2889

Abstract: A probe card for an apparatus for testing electronic devices comprises at least one probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, a supporting plate of the probe head, an interface plate, a stiffener associating the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed between the supporting plate and the interface plate and housed in a floating manner in a plurality of respective seats made in the supporting plate, and a plurality of connecting elements without clearance disposed between the interface plate and the stiffener.

Abstract translation: 用于测试电子设备的装置的探针卡包括至少一个探针头，容纳在探针头内的多个接触探针，每个接触探针具有至少一个接触尖端，该接触尖端适于邻接被测试装置的接触垫， 探针头的支撑板，界面板，将支撑板和界面板相关联的加强件，具有设置在支撑板和界面板之间的间隙的多个连接元件，并以浮动方式容纳在多个相应的 在支撑板上形成的座，以及设置在界面板和加强件之间的多个没有间隙的连接元件。