Semiconductor device comprising a glass supporting body onto which a substrate with semiconductor elements and a metalization is attached by means of an adhesive
    111.
    发明授权
    Semiconductor device comprising a glass supporting body onto which a substrate with semiconductor elements and a metalization is attached by means of an adhesive 有权
    包括玻璃支撑体的半导体装置,借助于粘合剂将具有半导体元件的基板和金属化附着在该玻璃支撑体上

    公开(公告)号:US06177707B1

    公开(公告)日:2001-01-23

    申请号:US09258430

    申请日:1999-02-26

    IPC分类号: H01L2910

    摘要: A thin film semiconductor device includes a glass supporting body having thereon an insulating substrate which is attached thereto by a layer of adhesive material. On the surface of the substrate facing the supporting body is a layer of semiconductor material which includes therein a semiconductor element, such surface further having thereon a metalization pattern of conductor tracks. An insulating layer is additionally provided between the metalization pattern and the adhesive layer, and has a dielectric constant &egr;r below 3 and a thickness in the range of approximately 20 &mgr;m to 60 &mgr;m. By virtue of such additional layer, parasitic capacitanees between the metalization pattern and an envelope in which the device is included or a printed circuit board on which the device is mounted are reduced substantially, thereby reducing the power consumption of the device.

    摘要翻译: 薄膜半导体器件包括玻璃支撑体,其上具有通过粘合剂材料层附接到其上的绝缘基底。 在面向支撑体的基板的表面上是包括半导体元件的半导体材料层,该表面还具有导体轨迹的金属化图案。 在金属化图案和粘合剂层之间另外设置绝缘层,其介电常数ε为3以下,厚度为20μm〜60μm左右。 由于这种附加层,金属化图案与其中包含器件的封套之间的寄生电容或其上安装器件的印刷电路板被大大减小,从而降低了器件的功耗。

    Method of manufacturing a semiconductor device having a semiconductor
body with field insulation regions formed by grooves filled with
insulating material
    115.
    发明授权
    Method of manufacturing a semiconductor device having a semiconductor body with field insulation regions formed by grooves filled with insulating material 失效
    具有半导体本体的半导体器件的制造方法,该半导体器件具有由绝缘材料填充的沟槽形成的场绝缘区域

    公开(公告)号:US5554256A

    公开(公告)日:1996-09-10

    申请号:US310824

    申请日:1994-09-22

    CPC分类号: H01L21/308 H01L21/76

    摘要: A method of manufacturing a semiconductor device comprising a semiconductor body (1) with field insulation regions (14) formed by grooves (10; 24) filled with an insulating material (13) is disclosed. The grooves (10; 24) are etched into the semiconductor body (1) with the use of an etching mask (9) formed on an auxiliary layer (6) provided on a surface (5) of the semiconductor body (1). The auxiliary layer (6) is removed from the portion (11) of the surface (5) situated next to the etching mask (9) before the grooves (10; 24) are etched into the semiconductor body (1), and the auxiliary layer (6) is removed from the edge (12) of the surface (5) situated below the etching mask (9) after the grooves (10; 24) have been etched into the semiconductor body. Furthermore, a layer (13) of the insulating material is deposited on the semiconductor body (1), whereby the grooves (10; 24) are filled and the edge (12) of the surface (5) situated below the etching mask (9) is covered. Then the semiconductor body is subjected to a treatment whereby material is taken off parallel to the surface (5) down to the auxiliary layer (6), and finally the remaining portion of the auxiliary layer (6) is removed. Field insulation regions are thus formed which extend over an edge (12) of the active regions (15) surrounded by the field insulation regions (14) with a strip (18) which has no overhanging edge.

    摘要翻译: 公开了一种制造半导体器件的方法,该半导体器件包括具有由绝缘材料(13)填充的沟槽(10; 24)形成的场绝缘区域(14)的半导体本体(1)。 使用形成在设置在半导体本体(1)的表面(5)上的辅助层(6)上的蚀刻掩模(9),将凹槽(10; 24)蚀刻到半导体本体(1)中。 在凹槽(10; 24)被蚀刻到半导体本体(1)中之前,从邻近蚀刻掩模(9)的表面(5)的部分(11)去除辅助层(6),并且辅助层 在凹槽(10; 24)被蚀刻到半导体本体中之后,从位于蚀刻掩模(9)下方的表面(5)的边缘(12)去除层(6)。 此外,绝缘材料的层(13)沉积在半导体本体(1)上,由此填充凹槽(10; 24),并且位于蚀刻掩模(9)下方的表面(5)的边缘(12) )被覆盖。 然后对半导体体进行处理,由此将材料平行于表面(5)取下到辅助层(6),最后除去辅助层(6)的剩余部分。 这样形成了场绝缘区域,该区域由具有不突出边缘的条带(18)在由绝缘区域(14)包围的有源区域(15)的边缘(12)上延伸。

    Bipolar epitaxial cascode with low-level base connection
    116.
    发明授权
    Bipolar epitaxial cascode with low-level base connection 失效
    具有低电平基极连接的双极外延级共源共栅

    公开(公告)号:US5399899A

    公开(公告)日:1995-03-21

    申请号:US173839

    申请日:1993-12-27

    CPC分类号: H01L27/0825

    摘要: A semiconductor device with a semiconductor body (1) is provided with a first and a second bipolar transistor (T1, T2, respectively) in a cascode configuration, in which the semiconductor body (1) comprises, in that order, a collector region (10) and a base region (11) of the first transistor (T1), a region (12) which forms both an emitter region of the first transistor (T1) and a collector region of the second transistor (T2), a space charge region (13), and a base region (14) and emitter region (15) of the second transistor (T2), while the regions form pn junctions with one another which extend parallel to a main surface (2) of the semiconductor body (1). The base region (14) and the emitter region (15) of the second transistor (T2) adjoin a main surface (3) of the semiconductor body (1). According to the invention, a depression (4) is provided in this main surface (3), cutting through the emitter region (12) of the first transistor (T1) which at the same time is the collector region (12) of the second transistor (T2), the space charge region (13), and the base region (14) of the second transistor (T2) and laterally bounding these; regions, while a connection electrode (B1) for the base region (11) of the first transistor (T1) is provided in the depression (4). No latch-up by a parasitic transistor then takes place in the device.

    摘要翻译: 具有半导体本体(1)的半导体器件以共成型结构设置有第一和第二双极晶体管(T1,T2),其中半导体主体(1)依次包括集电极区域 10)和第一晶体管(T1)的基极区域(11),形成第一晶体管(T1)的发射极区域和第二晶体管(T2)的集电极区域的区域(12),空间电荷 区域(13)以及第二晶体管(T2)的基极区域(14)和发射极区域(15),同时区域形成彼此平行于半导体主体的主表面(2)延伸的pn结( 1)。 第二晶体管(T2)的基极区域(14)和发射极区域(15)与半导体本体(1)的主表面(3)相邻。 根据本发明,在该主表面(3)中设置凹陷(4),切割第一晶体管(T1)的发射极区域(12),同时是第二晶体管的集电极区域(12) 晶体管(T2),空间电荷区域(13)和第二晶体管(T2)的基极区域(14)并且横向地限制它们; 区域,而在第一晶体管(T1)的基极区域(11)的连接电极(B1)设置在凹部(4)中。 然后在器件中不会发生寄生晶体管的闩锁。