摘要:
A thin film semiconductor device includes a glass supporting body having thereon an insulating substrate which is attached thereto by a layer of adhesive material. On the surface of the substrate facing the supporting body is a layer of semiconductor material which includes therein a semiconductor element, such surface further having thereon a metalization pattern of conductor tracks. An insulating layer is additionally provided between the metalization pattern and the adhesive layer, and has a dielectric constant &egr;r below 3 and a thickness in the range of approximately 20 &mgr;m to 60 &mgr;m. By virtue of such additional layer, parasitic capacitanees between the metalization pattern and an envelope in which the device is included or a printed circuit board on which the device is mounted are reduced substantially, thereby reducing the power consumption of the device.
摘要:
A device for processing electromagnetic waves in the microwave range, with a body provided with a circuit element which is electrically connected to a strip-type transmission line which comprises conductor tracks, said body being mechanically connected to an insulating substrate via contact bodies. The transmission line is formed by conductor tracks which lie on mutually facing surfaces of the body and the insulating substrate, respectively. The transmission line in the device is present between the body and the insulating substrate, the contact bodies providing a separation between the conductor tracks. Thus, it is not necessary then to use a second side of the body remote from the insulating substrate for the manufacture of transmission lines.
摘要:
A method of manufacturing a semiconductor device which starts with a semiconductor wafer which is provided with a layer of semiconductor material lying on an insulating layer at a first side. Semiconductor elements and conductor tracks are formed on this first side of the semiconductor wafer. Then the semiconductor wafer is fastened with this first side to a support wafer, and material is removed from the semiconductor wafer from its other, second side until the insulating layer has been exposed. The method starts with a semiconductor wafer whose insulating layer is an insulating as well as a passivating layer. The semiconductor device must be provided with a usual passivating layer after its manufacture in order to protect it against moisture and other influences. In the method described here, such a passivating layer is present already before the manufacture of the semiconductor device starts.
摘要:
A semiconductor device with a carrier body on which a substrate is fastened by means of a glue layer, which substrate is provided at its first side facing the carrier body with a semiconductor element and with a pattern of conductor tracks comprising contact electrodes for external contacting from the second side of the substrate facing away from the carrier body. The substrate is provided with windows at the areas of the contact electrodes for external contacting from the second side. The process steps preceding the gluing of the substrate to the carrier body are carried out in a clean room suitable for the manufacture of semiconductor elements, whereas the remaining process steps are preferably carried out in a final mounting room. Expensive lithographical equipment need not be available in both rooms, because the comparatively large windows can be formed by means of a simple contact mask.
摘要:
A method of manufacturing a semiconductor device comprising a semiconductor body (1) with field insulation regions (14) formed by grooves (10; 24) filled with an insulating material (13) is disclosed. The grooves (10; 24) are etched into the semiconductor body (1) with the use of an etching mask (9) formed on an auxiliary layer (6) provided on a surface (5) of the semiconductor body (1). The auxiliary layer (6) is removed from the portion (11) of the surface (5) situated next to the etching mask (9) before the grooves (10; 24) are etched into the semiconductor body (1), and the auxiliary layer (6) is removed from the edge (12) of the surface (5) situated below the etching mask (9) after the grooves (10; 24) have been etched into the semiconductor body. Furthermore, a layer (13) of the insulating material is deposited on the semiconductor body (1), whereby the grooves (10; 24) are filled and the edge (12) of the surface (5) situated below the etching mask (9) is covered. Then the semiconductor body is subjected to a treatment whereby material is taken off parallel to the surface (5) down to the auxiliary layer (6), and finally the remaining portion of the auxiliary layer (6) is removed. Field insulation regions are thus formed which extend over an edge (12) of the active regions (15) surrounded by the field insulation regions (14) with a strip (18) which has no overhanging edge.
摘要:
A semiconductor device with a semiconductor body (1) is provided with a first and a second bipolar transistor (T1, T2, respectively) in a cascode configuration, in which the semiconductor body (1) comprises, in that order, a collector region (10) and a base region (11) of the first transistor (T1), a region (12) which forms both an emitter region of the first transistor (T1) and a collector region of the second transistor (T2), a space charge region (13), and a base region (14) and emitter region (15) of the second transistor (T2), while the regions form pn junctions with one another which extend parallel to a main surface (2) of the semiconductor body (1). The base region (14) and the emitter region (15) of the second transistor (T2) adjoin a main surface (3) of the semiconductor body (1). According to the invention, a depression (4) is provided in this main surface (3), cutting through the emitter region (12) of the first transistor (T1) which at the same time is the collector region (12) of the second transistor (T2), the space charge region (13), and the base region (14) of the second transistor (T2) and laterally bounding these; regions, while a connection electrode (B1) for the base region (11) of the first transistor (T1) is provided in the depression (4). No latch-up by a parasitic transistor then takes place in the device.