Abstract:
A transducing head may be connected to a controller and positioned proximal a data storage medium. The controller can be connected to a wear level identification circuit and configured to identify a first data region of the data storage medium having a first wear level and a second data region of the data storage medium having a second wear level. The first and second wear levels can respectively correspond to different amounts of component degradation of the data storage device.
Abstract:
Method and apparatus for managing data in a memory. In accordance with some embodiments, a non-volatile (NV) buffer is adapted to store input write data having a selected logical address. A write circuit is adapted to transfer a copy of the input write data to an NV main memory while retaining the stored input write data in the NV buffer. A verify circuit is adapted to perform a verify operation at the conclusion of a predetermined elapsed time interval to verify successful transfer of the copy of the input write data to the NV main memory. The input write data are retained in the NV buffer until successful transfer is verified.
Abstract:
Various embodiments may generally be directed to a variable resistance data storage device and a method of managing the device. A data storage device may have at least a controller configured to re-characterize at least one variable resistance memory cell in response to an identified variance from a predetermined resistance threshold.
Abstract:
An incremental signal is defined that includes at least one of a duration and a peak voltage that is less than a respective minimum programming time or minimum programming voltage step of a resistive memory element. A characterization procedure is repeatedly performed that at least involves: applying a signal to the memory element, the signal being incremented by the incremental signal during each subsequent application; measuring a first resistance of the memory element in response to the signal; and c) measuring a second resistance of the memory element after a time period has elapsed from the measurement of the first resistance with no programming signal applied. In response to the first and second resistance measurements of the characterization procedure, a characterization parameter of the memory element is formed.
Abstract:
Method and apparatus for managing data in a memory. In accordance with some embodiments, a non-volatile (NV) buffer is adapted to store input write data having a selected logical address. A write circuit is adapted to transfer a copy of the input write data to an NV main memory while retaining the stored input write data in the NV buffer. A verify circuit is adapted to perform a verify operation at the conclusion of a predetermined elapsed time interval to verify successful transfer of the copy of the input write data to the NV main memory. The input write data are retained in the NV buffer until successful transfer is verified.