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公开(公告)号:US11538532B2
公开(公告)日:2022-12-27
申请号:US17199383
申请日:2021-03-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Xian Liu , Chunming Wang , Nhan Do , Hieu Van Tran
IPC: G06F11/10 , G06F11/07 , G06F11/30 , G06F11/14 , G11C16/26 , G11C11/56 , G11C16/04 , G11C16/24 , H01L23/00 , H01L25/065 , H01L25/18 , H03K19/20
Abstract: Numerous embodiments are disclosed of improved architectures for storing and retrieving system data in a non-volatile memory system. Using these embodiments, system data is much less likely to become corrupted due to charge loss, charge redistribution, disturb effects, and other phenomena that have caused corruption in prior art non-volatile memory systems.
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公开(公告)号:US20220254414A1
公开(公告)日:2022-08-11
申请号:US17734807
申请日:2022-05-02
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stanley Hong , Anh Ly , Vipin Tiwari , Nhan Do
IPC: G11C16/04 , G06N3/08 , H01L27/11521 , H01L29/788
Abstract: Numerous embodiments are disclosed for a high voltage generation algorithm and system for generating high voltages necessary for a particular programming operation in analog neural memory used in a deep learning artificial neural network. In one example, a method for programming a plurality of non-volatile memory cells in an array of non-volatile memory cells, comprises generating a high voltage, and programming a plurality of non-volatile memory cells in an array using the high voltage when a programming enable signal is asserted and providing a feedback loop to maintain the high voltage while programming the plurality of non-volatile memory cells.
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公开(公告)号:US11315636B2
公开(公告)日:2022-04-26
申请号:US16784183
申请日:2020-02-06
Applicant: Silicon Storage Technology, Inc.
Inventor: Hsuan Liang , Man Tang Wu , Jeng-Wei Yang , Hieu Van Tran , Lihsin Chang , Nhan Do
IPC: G11C16/16 , G11C16/04 , G11C16/08 , G11C16/10 , H01L27/11521
Abstract: A memory cell array with memory cells arranged in rows and columns, first sub source lines each connecting together the source regions in one of the rows and in a first plurality of the columns, second sub source lines each connecting together the source regions in one of the rows and in a second plurality of the columns, a first and second erase gate lines each connecting together all of the erase gates in the first and second plurality of the columns respectively, first select transistors each connected between one of first sub source lines and one of a plurality of source lines, second select transistors each connected between one of second sub source lines and one of the source lines, first select transistor line connected to gates of the first select transistors, and a second select transistor line connected to gates of the second select transistors.
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124.
公开(公告)号:US10910061B2
公开(公告)日:2021-02-02
申请号:US15990395
申请日:2018-05-25
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Vipin Tiwari , Nhan Do , Mark Reiten
Abstract: Numerous embodiments of programming systems and methods for use with a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. Selected cells thereby can be programmed with extreme precision to hold one of N different values.
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公开(公告)号:US20210020255A1
公开(公告)日:2021-01-21
申请号:US16569611
申请日:2019-09-12
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.
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公开(公告)号:US20210019608A1
公开(公告)日:2021-01-21
申请号:US16569647
申请日:2019-09-12
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.
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127.
公开(公告)号:US10755779B2
公开(公告)日:2020-08-25
申请号:US15701071
申请日:2017-09-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Anh Ly , Thuan Vu , Stanley Hong , Feng Zhou , Xian Liu , Nhan Do
Abstract: Various architectures and layouts for an array of resistive random access memory (RRAM) cells are disclosed. The RRAM cells are organized into rows and columns, with each cell comprising a top electrode, a bottom electrode, and a switching layer. Circuitry is included for improving the reading and writing of the array, including the addition of a plurality of columns of dummy RRAM cells in the array used as a ground source, connecting source lines to multiple pairs of rows of RRAM cells, and the addition of rows of isolation transistors.
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公开(公告)号:US20200242453A1
公开(公告)日:2020-07-30
申请号:US16382051
申请日:2019-04-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G06N3/063 , H01L27/115
Abstract: A neural network device with synapses having memory cells each having source and drain regions in a semiconductor substrate with a channel region extending there between, a floating gate over an entirety of the channel region, and a first gate over the floating gate. First lines each electrically connect together the first gates in one of the memory cell rows, second lines each electrically connect together the source regions in one of the memory cell rows, and third lines each electrically connect together the drain regions in one of the memory cell columns. The synapses are configured to receive a first plurality of inputs as electrical voltages on the first lines or on the second lines, and to provide a first plurality of outputs as electrical currents on the third lines.
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公开(公告)号:US20200234758A1
公开(公告)日:2020-07-23
申请号:US16382045
申请日:2019-04-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G11C11/54 , H01L27/11521 , H01L29/423 , H01L29/788 , G06N3/04 , G11C16/10 , G11C16/14 , G11C16/04
Abstract: A neural network device with synapses having memory cells each having a floating gate and a first gate over first and second portions of a channel region disposed between source and drain regions, and a second gate over the floating gate or the source region. First lines each electrically connect the first gates in one of the memory cell rows, second lines each electrically connect the second gates in one of the memory cell rows, third lines each electrically connect the source regions in one of the memory cell columns, and fourth lines each electrically connect the drain regions in one of the memory cell columns. The synapses receive a first plurality of inputs as electrical voltages on the first or second lines, and provide a first plurality of outputs as electrical currents on the third or fourth lines.
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130.
公开(公告)号:US20200119028A1
公开(公告)日:2020-04-16
申请号:US16231231
申请日:2018-12-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: H01L27/11531 , H01L29/788 , G11C16/04 , G06N3/08
Abstract: Numerous embodiments of a precision tuning algorithm and apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. Selected cells thereby can be programmed with extreme precision to hold one of N different values.
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