Abstract:
An adaptive algorithm is implemented that optimizes the slicer threshold by optimizing the tail distribution of a “+1” and “−1” histogram. Through the use of a low resolution and under-sampled ADC, a histogram of received bit may be created. The difference between the y-intersects of lines derived from the “+1” and “−1” histogram is used to determine an error function. The algorithm iteratively updates the threshold value based on this error function.
Abstract:
A system may adjust the times at which data is sampled by separate sampling mechanisms. Here, it may be desirable to ensure that one sampler samples data at substantially the same time as the other sampler. For example, output data from a high speed sampler that samples received data may be compared with an output of an analog to digital converter that samples the received data at a lower data rate. This difference or relative error may be accumulated over a period of time for given values of delay applied to the clock for the analog to digital converter. In this way, a delay value that minimizes the relative error may be selected as a desired delay value.
Abstract:
A threshold adjustment circuit including: a current DAC for supplying or sinking a varying current; a differential pair of thin oxide transistors coupled to the DAC and coupled together at a common source node; a power supply for providing a supply voltage having a voltage level above reliability of the thin oxide transistors; and a third transistor for maintaining voltage of the common source node above a predetermined level and to disable the threshold adjustment circuit. The bulk and source of each of the differential pair thin oxide transistors is coupled to the common source node and each of the differential pair thin oxide transistors is switched by a signal to keep each of the differential pair thin oxide transistors in saturation region.
Abstract:
In a phase locked loop in which a phase detector compares an input signal to a reference signal and provides a difference signal to a charge pump or to a transconductance amplifier, a digital to analog converter is provided for connecting the output of the charge pump or transconductance amplifier to a voltage controlled oscillator whereby loop bandwidth can be increased from an operating value to an acquisition value for loop phase acquisition by changing the input to the DAC, thereby changing the amplification of the DAC.
Abstract:
An input processing circuit includes a first and second input transistors for receiving a differential pair of first and second input signals, respectively. At least one resistor is coupled between first terminals of the first and second input transistors. The input processing circuit includes a variable gain amplifier (VGA) circuit. At least one first transistor has a gate terminal, and is coupled between the first terminals of the first and second input transistors. At least one second transistor has a gate terminal, and is coupled between the first terminals of the first and second input transistors. A gate switch is coupled to the gate terminal of the at least one second transistor. The at least one first transistor and the at least one second transistor adjust a gain of the input processing circuit in response to a control voltage. The control voltage is applied to the gate terminal of the at least one first transistor, and the control voltage is applied to the gate terminal of the at least one second transistor through the gate switch.
Abstract:
A compensation apparatus maintains an effective resistance of one or more resistors in a circuit by associating an adjustable resistor circuit to each resistor. The compensation apparatus compares the resistance of a resistor in the circuit with the resistance of a reference resistor. When the resistance of the resistor in the circuit falls outside of a desired range, the compensation apparatus adjusts the resistance of the adjustable resistor to adjust the effective resistance of the resistor and adjustable resistor combination.
Abstract:
Methods and circuitry for implementing high speed first-in first-out (FIFO) structures. In one embodiment, a FIFO is disclosed that allows the frequency of one clock, e.g., the write clock, to be different than (e.g., half) that of the other (read) clock. In another embodiment a FIFO is presented that can be set and/or reset asynchronously. Other embodiments are disclosed wherein the read and write pointers are effectively monitored to ensure proper timing relationship, to detect loss of clock as well as to detect other abnormal FIFO conditions.
Abstract:
Methods and circuitry for implementing high speed first-in first-out (FIFO) structures. In one embodiment, a FIFO is disclosed that allows the frequency of one clock, e.g., the write clock, to be different than (e.g., half) that of the other (read) clock. In another embodiment a FIFO is presented that can be set and/or reset asynchronously. Other embodiments are disclosed wherein the read and write pointers are effectively monitored to ensure proper timing relationship, to detect loss of clock as well as to detect other abnormal FIFO conditions.
Abstract:
A phase detector includes a first flip flop having a data input coupled to a first clock signal at a first frequency and a clock input coupled to a second clock signal at a second frequency. The frequency of the first clock signal is a multiple of the frequency of the second clock signal. The phase detector also includes a second flip flop having a data input coupled to an output of the first flip flop and a clock input coupled to the second clock signal.
Abstract:
A method and device for testing multi-channel transceivers in an integrated circuit is provided. More specifically, the present invention relates to a method and device for implementing a built-in self-test for multi-channel transceivers. An exemplaxy embodiment of the present invention includes a test pattern generator, a multiplexer, a demultiplexer, and a test result evaluator. The test pattern generator generates a test pattern which is fed into each of the input channels of the multiplexer. The multiplexer multiplexes the data from all its input channels and then relays the data to the demultiplexer. The test result evaluator then individually checks the data at each of the output channels of the demultiplexer to determine whether the data received at each output channel is the same as the test pattern. In order to facilitate the checking process, signature analysis is utilized.