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公开(公告)号:US20230095086A1
公开(公告)日:2023-03-30
申请号:US17953803
申请日:2022-09-27
Applicant: ASM IP Holding B.V.
Inventor: Timothee Blanquart , René Henricus Jozef Vervuurt , Giuseppe Alessio Verni , Ren-Jie Chang , Charles Dezelah , Qi Xie , Viljami Pore
IPC: H01L21/285
Abstract: Disclosed are methods and systems for filling a gap. An exemplary method comprises providing a substrate to a reaction chamber. The substrate comprises the gap. The method further comprises forming a gap filling process by means of a plasma-enhanced deposition process. The gap filling fluid at least partially fills the gap. The methods and systems are useful, for example, in the field of integrated circuit manufacture.
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公开(公告)号:US20220328318A1
公开(公告)日:2022-10-13
申请号:US17845325
申请日:2022-06-21
Applicant: ASM IP Holding B.V.
Inventor: Chiyu Zhu , Henri Jussila , Qi Xie
IPC: H01L21/285 , C23C16/02 , C23C16/04 , C23C16/455 , H01L21/768
Abstract: There is provided a method of selectively depositing a material on a substrate with a first and second surface, the first surface being different than the second surface. The depositing of the material on the substrate comprises: supplying a bulk precursor comprising metal atoms, halogen atoms and at least one additional atom not being a metal or halogen atom to the substrate; and supplying a reactant to the substrate. The bulk precursor and the reactant have a reaction with the first surface relative to the second surface to form more material on the first surface than on the second surface.
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公开(公告)号:US20220293463A1
公开(公告)日:2022-09-15
申请号:US17680607
申请日:2022-02-25
Applicant: ASM IP Holding B.V.
Inventor: René Henricus Jozef Vervuurt , Timothee Blanquart , Viljami Pore , Giuseppe Alessio Verni , Qi Xie , Ren-Jie Chang , Eric James Shero
IPC: H01L21/768 , H01L21/02
Abstract: Disclosed are methods and systems for filling a gap. An exemplary method comprises providing a substrate to a reaction chamber. The substrate comprises the gap. The method further comprises at least partially filling the gap with a gap filling fluid. The method then comprises subjecting the gap filling fluid to a transformation treatment, thus forming a transformed material in the gap. The methods and systems are useful, for example, in the field of integrated circuit manufacture.
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公开(公告)号:US20220285146A1
公开(公告)日:2022-09-08
申请号:US17680761
申请日:2022-02-25
Applicant: ASM IP Holding B.V.
Inventor: Giuseppe Alessio Verni , Ren-Jie Chang , Qi Xie , Timothee Blanquart , Eric Shero
IPC: H01L21/02 , H01L27/108
Abstract: Disclosed are methods and systems for depositing layers comprising a metal and nitrogen. The layers are formed onto a surface of a substrate. The deposition process may be a cyclical deposition process. Exemplary structures in which the layers may be incorporated include field effect transistors, VNAND cells, metal-insulator-metal (MIM) structures, and DRAM capacitors.
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公开(公告)号:US20220282374A1
公开(公告)日:2022-09-08
申请号:US17680903
申请日:2022-02-25
Applicant: ASM IP Holding B.V.
Inventor: Giuseppe Alessio Verni , Ren-Jie Chang , Qi Xie , Charles Dezelah
IPC: C23C16/455
Abstract: Disclosed are methods and systems for depositing layers comprising vanadium and oxygen. The layers are formed onto a surface of a substrate. The deposition process may be a cyclical deposition process. Exemplary structures in which the layers may be incorporated include field effect transistors, VNAND cells, metal-insulator-metal (MIM) structures, and DRAM capacitors.
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公开(公告)号:US20220189775A1
公开(公告)日:2022-06-16
申请号:US17546186
申请日:2021-12-09
Applicant: ASM IP Holding B.V.
Inventor: Maart van Druenen , Charles Dezelah , Qi Xie , Petro Deminskyi , Giuseppe Alessio Verni , Ren-Jie Chang , Lifu Chen
Abstract: Methods and systems for depositing rare earth metal carbide containing layers on a surface of a substrate and structures and devices formed using the methods are disclosed. An exemplary method includes using a cyclical deposition process such as an atomic layer deposition process for depositing a rare earth metal carbide containing layer onto a surface of the substrate.
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公开(公告)号:US20220186364A1
公开(公告)日:2022-06-16
申请号:US17688258
申请日:2022-03-07
Applicant: ASM IP Holding B.V.
Inventor: Eric Christopher Stevens , Bhushan Zope , Shankar Swaminathan , Charles Dezelah , Qi Xie , Giuseppe Alessio Verni
IPC: C23C16/34 , C23C16/02 , C23C16/08 , C23C16/455 , H01L27/108 , G11C5/06 , H01L21/28 , H01L29/06 , H01L29/423 , H01L29/49 , H01L29/78 , H01L29/786
Abstract: Methods for depositing a molybdenum nitride film on a surface of a substrate are disclosed. The methods may include: providing a substrate into a reaction chamber; and depositing a molybdenum nitride film directly on the surface of the substrate by performing one or more unit deposition cycles of cyclical deposition process, wherein a unit deposition cycle may include, contacting the substrate with a first vapor phase reactant comprising a molybdenum halide precursor, and contacting the substrate with a second vapor phase reactant comprising a nitrogen precursor. Semiconductor device structures including a molybdenum nitride film are also disclosed.
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公开(公告)号:US11295980B2
公开(公告)日:2022-04-05
申请号:US16105802
申请日:2018-08-20
Applicant: ASM IP Holding B.V.
Inventor: Bhushan Zope , Kiran Shrestha , Shankar Swaminathan , Chiyu Zhu , Henri Tuomas Antero Jussila , Qi Xie
IPC: H01L21/768 , H01L21/285 , C23C16/14 , C23C16/02 , H01L23/532 , C23C16/04 , C23C16/455
Abstract: Methods for depositing a molybdenum metal film over a dielectric surface of a substrate by a cyclical deposition process are disclosed. The methods may include: providing a substrate comprising a dielectric surface into a reaction chamber; depositing a nucleation film directly on the dielectric surface; and depositing a molybdenum metal film directly on the nucleation film, wherein depositing the molybdenum metal film includes: contacting the substrate with a first vapor phase reactant comprising a molybdenum halide precursor; and contacting the substrate with a second vapor phase reactant comprising a reducing agent precursor. Semiconductor device structures including a molybdenum metal film disposed over a surface of a dielectric material with an intermediate nucleation film are also disclosed.
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公开(公告)号:US20210375622A1
公开(公告)日:2021-12-02
申请号:US17326912
申请日:2021-05-21
Applicant: ASM IP Holding B.V.
Inventor: Lucas Petersen Barbosa Lima , Joe Margetis , John Tolle , Rami Khazaka , Qi Xie
Abstract: Methods and devices for epitaxially growing boron- and gallium-doped silicon germanium layers. The layers may be used, for example, as a p-type source and/or drain regions in field effect transistors.
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公开(公告)号:US20210348267A1
公开(公告)日:2021-11-11
申请号:US17316847
申请日:2021-05-11
Applicant: ASM IP Holding B.V.
Inventor: Charles Dezelah , Qi Xie , Petri Raisanen , Dieter Pierreux , Bert Jongbloed , Werner Knaepen , Eric James Shero
IPC: C23C16/02 , C23C16/44 , C23C16/455
Abstract: A method may comprise disposing vanadium tetrachloride in a delivery vessel; delivering the vanadium tetrachloride to a reaction chamber in fluid communication with the delivery vessel; mitigating the delivery of decomposition products of the vanadium tetrachloride to the reaction chamber; and/or applying the vanadium tetrachloride to a substrate disposed in the reaction chamber to form a layer comprising vanadium on the substrate.
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