公开(公告)号：US20170085317A1

公开(公告)日：2017-03-23

申请号：US15263036

申请日：2016-09-12

Applicant: EXFO INC.

Inventor： Bernard Ruchet

IPC: H04B10/071 ,  H04B10/2581

CPC classification number: H04B10/071 ,  G01M11/3136 ,  G01M11/3154 ,  G02B6/14 ,  H04B10/2581

Abstract: A multimode launch system to be connected to an Optical Time-Domain Reflectometer (OTDR) for use in performing at least one OTDR measurement on a multi-fiber array Device Under Test (DUT), the multimode launch system comprising: an optical switch being connectable to the OTDR during use; a launch array device having an end being connectable to the optical switch and another end being connectable to the multi-fiber array DUT during use, the launch array device having a plurality of multimode launch optical fibers each having at least one first guidance parameter being smaller than a corresponding one of at least one second guidance parameter of at least one multimode optical fiber of the optical switch; and a multi-fiber mode conditioner along the launch array device for inducing a preferential attenuation of higher-order optical modes of test light propagated into the multi-fiber array DUT during use.

公开(公告)号：US09549470B2

公开(公告)日：2017-01-17

申请号：US14471047

申请日：2014-08-28

Applicant: EXFO Inc.

Inventor： Michel Blier ,  Patrick Begin ,  Sergio Prestipino

IPC: H05K1/00 ,  H05K1/18 ,  G02B6/00 ,  H05K1/02

CPC classification number: H05K1/189 ,  G02B6/00 ,  G02B6/4246 ,  G02B6/4284 ,  H05K1/0243 ,  H05K2201/10189

Abstract: There is provided an adapter device for connecting and interfacing a transceiver module in conformance with first mechanical specifications and first connector specifications into a host socket adapted to receive transceiver modules in conformance with second mechanical specifications and second connector specifications. The adapter device comprises: a rigid-flex circuit board having first and second levels of rigid circuit board portions and a flexible circuit board portion interconnecting the two levels to convey high-speed electrical signals therebetween, the two levels being integral with said flexible circuit board portion; a first connector mounted on the first level of rigid circuit board and in conformance with the first connector specifications, for electrically connecting the transceiver module to the adapter device to convey high-speed signals; and a second connector mounted on the second level of rigid circuit board and in conformance with the second connector specifications, for electrically connecting the adapter device into the host socket to convey high-speed signals.

Abstract translation: 提供了适配器装置，用于根据第一机械规格和第一连接器规格将收发器模块连接和接口到适于接收符合第二机械规格和第二连接器规格的收发器模块的主机插座中。 适配器装置包括：刚性 - 柔性电路板，具有第一和第二层的刚性电路板部分和柔性电路板部分，其互连两个层以在其间传送高速电信号，两个层级与所述柔性电路板 一部分; 第一连接器，其安装在刚性电路板的第一层上并且符合第一连接器规格，用于将收发器模块电连接到适配器装置以传送高速信号; 以及安装在刚性电路板的第二层上并符合第二连接器规格的第二连接器，用于将适配器装置电连接到主机插座以传送高速信号。

公开(公告)号：US20170003195A1

公开(公告)日：2017-01-05

申请号：US15193180

申请日：2016-06-27

Applicant: EXFO INC.

Inventor： Denis LAFRANCE ,  Bernard RUCHET ,  Robert BARIBAULT

IPC: G01M11/00 ,  G02B21/00 ,  H04B10/00 ,  G02B6/38 ,  G06T7/00 ,  H04N5/225

CPC classification number: G01M11/30 ,  G02B6/385 ,  G02B6/3885 ,  G02B21/0016 ,  G06T7/0004 ,  G06T2207/10056 ,  H04B10/12 ,  H04N5/2251 ,  H04N2005/2255

Abstract: An inspection system for inspecting a multiple-fiber connector is provided. The inspection system includes a microscope probe and a probe tip configured to provide an optical path between the microscope probe and the multiple-fiber connector. The probe tip and microscope probe are configured so that the field of view of the microscope probe is sufficiently large to cover a portion of the connector surface encompassing a plurality of the optical fiber endfaces. The system further includes a shifting mechanism operable to shift the field of view of the microscope probe between at least two discrete positions over the connector surface. Each discrete position encompasses a different subset of the multiple optical fiber endfaces and optionally at least one positioning reference. A probe tip and a method of inspection are also provided.

Abstract translation: 提供了一种用于检查多光纤连接器的检查系统。 检查系统包括显微镜探针和探针尖端，其构造成在显微镜探针和多光纤连接器之间提供光路。 探针头和显微镜探针被配置成使得显微镜探针的视野足够大以覆盖包围多个光纤端面的连接器表面的一部分。 该系统还包括一个移动机构，可操作以将显微镜探针的视场在连接器表面上的至少两个离散位置之间移动。 每个离散位置包括多个光纤端面的不同子集以及可选地至少一个定位参考。 还提供探针尖端和检查方法。

公开(公告)号：US09438336B2

公开(公告)日：2016-09-06

申请号：US13965823

申请日：2013-08-13

Applicant: EXFO INC.

Inventor： Gang He ,  Daniel Gariepy ,  Hongxin Chen ,  Bernard Ruchet

IPC: H04B10/073 ,  H04J14/02 ,  H04J14/06 ,  H04B10/079

CPC classification number: H04B10/073 ,  H04B10/0775 ,  H04B10/07953 ,  H04J14/02 ,  H04J14/06

Abstract: There is provided a method for determining a noise parameter characterizing an optical Signal-Under-Test (SUT) having a signal contribution, an Amplified Spontaneous Emission (ASE) noise contribution and a non-ASE optical noise contribution, such as a carrier-leakage contribution or a depolarized-signal contribution, within an optical-signal bandwidth. The method comprises acquiring optical spectrum trace(s) of the SUT, discriminating at least the non-ASE optical noise contribution from the ASE-noise contribution using the optical spectrum trace(s) and/or a trace obtained from the optical spectrum trace(s); and determining the noise parameter using discriminated non-ASE optical noise contribution and/or the discriminated ASE-noise contribution.

Abstract translation: 提供了一种用于确定表征具有信号贡献，放大自发发射（ASE）噪声贡献和非ASE光学噪声贡献的光信号不足（SUT）的噪声参数的方法，例如载波泄漏 贡献或去极化信号贡献，在光信号带宽内。 该方法包括获取SUT的光谱轨迹，使用光谱轨迹和/或从光谱轨迹获得的轨迹来区分来自ASE-噪声贡献的至少非ASE光学噪声贡献（和 s）; 以及使用鉴别的非ASE光学噪声贡献和/或所识别的ASE-噪声贡献来确定噪声参数。

公开(公告)号：USD763713S1

公开(公告)日：2016-08-16

申请号：US29537036

申请日：2015-08-21

Applicant: EXFO INC.

Designer： Alain Martel ,  Pascal Recoura-Massaquant ,  Hicham Maalouf

公开(公告)号：US20160197674A1

公开(公告)日：2016-07-07

申请号：US15069365

申请日：2016-03-14

Applicant: EXFO Inc.

Inventor： Bernard Ruchet ,  Normand Cyr

IPC: H04B10/079

CPC classification number: H04B10/07955 ,  H04B3/46 ,  H04B10/079 ,  H04B10/0793 ,  H04B10/0795 ,  H04B10/07953 ,  H04Q11/0067 ,  H04Q2011/0083

Abstract: A portable apparatus for measuring optical powers of optical signals propagating concurrently in opposite directions in an optical transmission path between two elements, at least one of the elements being operative to transmit a first optical signal (S1) only if it continues to receive a second optical signal (S2) from the other of said elements, comprises first and second connector means for connecting the apparatus into the optical transmission path in series therewith, and propagating and measuring means connected between the first and second connector means for propagating at least the second optical signal (S2) towards the one of the elements, and measuring the optical powers of the concurrently propagating optical signals (S1, S2). The measurement results may be displayed by a suitable display unit. Where one element transmits signals at two different wavelengths, the apparatus may separate parts of the corresponding optical signal portion according to wavelength and process them separately.

Abstract translation: 一种用于测量在两个元件之间的光传输路径中以相反方向同时传播的光信号的光功率的便携式设备，所述元件中的至少一个仅在其继续接收第二光信号 来自所述元件中的另一个的信号（S2）包括用于将设备串联连接到光传输路径中的第一和第二连接器装置，以及连接在第一和第二连接器装置之间的传播和测量装置，用于至少传播第二光学 信号（S2），并且测量同时传播的光信号（S1，S2）的光功率。 测量结果可以由合适的显示单元显示。 当一个元件以两个不同的波长发射信号时，该装置可以根据波长分离对应的光信号部分的部分并分别处理它们。

公开(公告)号：US20160170151A1

公开(公告)日：2016-06-16

申请号：US14962301

申请日：2015-12-08

Applicant: EXFO INC.

Inventor： Robert Baribault

IPC: G02B6/38 ,  G02B6/32 ,  G02B6/42 ,  G01M11/00

CPC classification number: G02B6/385 ,  G01M11/30 ,  G01M11/31 ,  G01N21/8803 ,  G01N21/952 ,  G01N2021/9511 ,  G02B6/32 ,  G02B6/381 ,  G02B6/423 ,  G02B6/4292 ,  G02B21/0016

Abstract: The fiber inspection microscope and power measurement system for inspecting an endface of an optical fiber at an angle-polished connector generally has: a mating interface for receiving the angle-polished connector, the endface causing a mean propagation direction of light exiting the optical fiber at endface to be tilted relative to an imaging path of the system; a converging element to be optically coupled to the endface and being configured to receive the tilted light and to redirect the tilted light toward the imaging path of the fiber inspection microscope system; and a power detection assembly optically coupled to the converging element, the power detection assembly being configured to detect an optical power associated with the tilted light redirected by the converging element.

Abstract translation: 用于检查角度抛光连接器的光纤端面的光纤检查显微镜和功率测量系统通常具有：用于接收角度抛光连接器的配合接口，端面导致从光纤出射的光的平均传播方向 端面相对于系统的成像路径倾斜; 光学耦合到端面并且被配置为接收倾斜的光并将倾斜的光重定向到光纤检查显微镜系统的成像路径的会聚元件; 以及光学耦合到所述会聚元件的功率检测组件，所述功率检测组件被配置为检测与由所述会聚元件重定向的所述倾斜光相关联的光学功率。

公开(公告)号：US20160161397A9

公开(公告)日：2016-06-09

申请号：US13767851

申请日：2013-02-14

Applicant: EXFO Inc.

Inventor： Normand Cyr ,  Hongxin Chen ,  Gregory Walter Schinn

IPC: G01N21/21 ,  G06F17/18

CPC classification number: G01N21/21 ,  G01M11/3163 ,  G01M11/3181 ,  G01M11/335 ,  G01M11/336 ,  G06F17/18

Abstract: A polarization-related characteristic of an optical path is determined from a predetermined function of the mean-square of a plurality of differences between polarization-analyzed optical power parameters corresponding to pairs of wavelengths mutually spaced about a midpoint wavelength by a small optical frequency difference. At least some of the said differences correspond to wavelength pairs measured under conditions where at least one of midpoint wavelength, input state of polarization (I-SOP) or analyzed state of polarization (A-SOP) of a pair is different.

Abstract translation: 光路的极化相关特性是根据对应于中点波长相互间隔的一对波长的偏振分析光功率参数之间的多个差的平均值的预定函数由小的光频差确定的。 所述差异中的至少一些对应于在一对中点波长，输入偏振态（I-SOP）或分析的偏振状态（A-SOP）中的至少一个不同的条件下测量的波长对。

公开(公告)号：US20160127074A1

公开(公告)日：2016-05-05

申请号：US14931983

申请日：2015-11-04

Applicant: EXFO INC.

Inventor： Gang HE ,  Daniel GARIEPY

IPC: H04J14/06 ,  H04B10/079

CPC classification number: H04J14/06 ,  H04B10/0775 ,  H04B10/07953

Abstract: There is provided a method to discriminate NLE-induced signal deformation from ASE-noise on polarization multiplexed signals, in order to measure the OSNR under NLE conditions and/or characterize the NLE-induced signal deformation. In accordance with one aspect, the method is based on the acquisition of optical spectrum traces when the (data-carrying) optical communication signal is partially or completely extinguished (ASE-noise only), as well as with a live optical communication signal. Comparing traces acquired with different conditions and/or at different dates allows discrimination of the signal contribution, the ASE-noise contribution and the NLE-induced deformations on the SUT.

Abstract translation: 提供了一种在偏振复用信号上区分NLE诱发的信号变形与ASE噪声的方法，以便在NLE条件下测量OSNR和/或表征NLE引起的信号变形。 根据一个方面，该方法基于当（数据携带）光通信信号被部分或完全熄灭（仅限于ASE噪声）以及带有实时光通信信号时获取光谱踪迹。 比较采用不同条件和/或不同日期的踪迹可以区分信号贡献，ASE噪声贡献和NLE引起的SUT变形。

公开(公告)号：USD751434S1

公开(公告)日：2016-03-15

申请号：US29511590

申请日：2014-12-11

Applicant: EXFO INC.

Designer： Sébastien Nadeau ,  Denis Lafrance