摘要:
A semiconductor memory including first, second, and third data busses, and first and second memory cell arrays arranged among the first, second, and third data busses. During operation of the semiconductor memory, a first, a second, and a third circuit selectively couple the first, second, and third data busses to a fourth and a fifth data bus. Additionally, there is provided first and second buffer circuits, which are respectively coupled to the fourth and the fifth data busses, and a sixth data bus, which is commonly coupled to the first and second buffer circuits. A control circuit is used to control the operation of the switch circuits. In preferred embodiments, the number of buffer circuits in the semiconductor memory is less than or equal to the number of memory cell arrays.
摘要:
A dynamic random access memory includes a dynamic memory cell having a transfer N-channel MOS transistor and a capacitive element for storing data which is connected to the transfer N-channel MOS transistor, a word line connected to a gate of the transfer N-channel transistor, of the dynamic memory cell, and a word line driving voltage source, to which power voltage is input for raising the input power voltage to generate a word line driving voltage. Also, the dynamic random access memory includes an address circuit for generating internal address signals in accordance with externally input address signals, a word line selecting circuit for decoding the internal address signals and outputting a word line selecting signal which varies within a range between the word line driving voltage and a ground potential, and a word line driving circuit for driving a corresponding word line in accordance with the word line selecting signal, the word line driving circuit being provided in correspondence with the word line and having a P-channel MOS transistor which has a source connected to a first node having the word line driving voltage, a drain connected to the word line and a gate to which the word line selecting signal is applied.
摘要:
A wave soldering tank includes a soldering tank body for housing molten solder and a solder feed chamber disposed within the soldering tank body. An axial-flow, multiple-blade screw-type pump is disposed so as to draw molten solder into the solder feed chamber through an inlet and discharge the molten solder through an outlet. In a preferred embodiment, the pump includes a rotatable hub and a plurality of helical blades secured to the hub at equal intervals in the circumferential direction of the hub, each of the blades overlapping an adjoining one of the blades when the blades are viewed in the axial direction of the impeller.
摘要:
A wave soldering tank includes a soldering tank body for housing molten solder and a solder feed chamber disposed within the soldering tank body. An axial-flow, multiple-blade screw-type pump is disposed so as to draw molten solder into the solder feed chamber through an inlet and discharge the molten solder through an outlet. In a preferred embodiment, the pump includes a rotatable hub and a plurality of helical blades secured to the hub at equal intervals in the circumferential direction of the hub, each of the blades overlapping an adjoining one of the blades when the blades are viewed in the axial direction of the impeller.
摘要:
A wave soldering tank includes a soldering tank body for housing molten solder and a solder feed chamber disposed within the soldering tank body. An axial-flow, multiple-blade screw-type pump is disposed so as to draw molten solder into the solder feed chamber through an inlet and discharge the molten solder through an outlet. In a preferred embodiment, the pump includes a rotatable hub and a plurality of helical blades secured to the hub at equal intervals in the circumferential direction of the hub, each of the blades overlapping an adjoining one of the blades when the blades are viewed in the axial direction of the impeller.
摘要:
A voltage generator for outputting an output voltage at an output terminal thereof includes a driver MOS transistor of a first conductivity type having a first end connected to said output terminal and a capacitor connected between the output terminal and a second voltage node. The capacitor comprises a plurality of trench capacitors formed in a semiconductor substrate.
摘要:
A dynamic random access memory includes a dynamic memory cell having a transfer N-channel MOS transistor and a capacitive element for storing data which is connected to the transfer N-channel MOS transistor, a word line connected to a gate of the transfer N-channel transistor, of the dynamic memory cell, and a word line driving voltage source, to which power voltage is input for raising the input power voltage to generate a word line driving voltage. Also, the dynamic random access memory includes an address circuit for generating internal address signals in accordance with externally input address signals, a word line selecting circuit for decoding the internal address signals and outputting a word line selecting signal which varies within a range between the word line driving voltage and a ground potential, and a word line driving circuit for driving a corresponding word line in accordance with the word line selecting signal, the word line driving circuit being provided in correspondence with the word line and having a P-channel MOS transistor which has a source connected to a first node having the word line driving voltage, a drain connected to the word line and a gate to which the word line selecting signal is applied.
摘要:
The present invention relates to a semiconductor memory device which, while preventing an operation error, achieves the shortening of a precharging time and, hence, further shortening of a cycle time of a memory operation. The equalizing control circuit includes a latch circuit. An equalizing control circuit receives a signal WLact and a signal X-ADR from a predecoder and outputs an equalizing signal EQS from these two signals. A latch circuit in the equalizing control circuit is set (the inactivation of an equalizing signal) by a signal X-ADR which is activated with an internal RAS signal and holds its state. The latch circuit is reset (the activation of the equalizing signal) by a signal corresponding to a word line active signal WLact with a word line inactivated. By doing so, it is possible to provide the equalizing control circuit not directly depending upon the internal RAS signal.
摘要:
In a DRAM or similar memory having sense amplifiers coupled to memory cells, a sense amplifier is switchably connected to a discharge circuit to discharge the terminal of the sense amplifier at high speed. The node of the sense amplifier is also coupled to a discharge circuit which discharges the node at a slower speed. In operation, only the node of a selected sense amplifier is discharged at high speed, while other non-selected sense amplifiers are activated by discharging the sense amplifier node at a lower speed. This mode of operation allows for the high speed activation of the selected sense amplifier with the associated current consumption being limited to that necessary to discharge the individual sense amplifier selected. The two discharge circuits may be two N channel MOS transistors connecting the node of the sense amplifier to two drive lines driven by independent circuits. The higher speed discharge circuit is implemented as an N channel MOS transistor which is switched by a signal from the column select line.
摘要:
A digital/analog conversion apparatus for converting a digital signal into an analog signal. The digital/analog conversion apparatus can generate a high-quality analog signal, even when elements configuring the digital/analog conversion apparatus have variance, with high resolution and a small circuit size. The data conversion apparatus is provided with a first data converter for reducing the number of bits of an input signal, a second data converter for converting the format of the first output signal, and a third data converter for conversion into a code which corresponds to the history of the output from the second data converter.