Method and apparatus for detecting signal in a MIMO communication system
    11.
    发明授权
    Method and apparatus for detecting signal in a MIMO communication system 有权
    用于在MIMO通信系统中检测信号的方法和装置

    公开(公告)号:US07826571B2

    公开(公告)日:2010-11-02

    申请号:US11543387

    申请日:2006-10-05

    CPC classification number: H04B7/04 H04L25/03006

    Abstract: Detection of a signal in a receiver of a MIMO communication system includes a transmitter for signals transmission via K antennas and a receiver for receiving the signals via L reception antennas, such that L is greater than or equal to K and the system has a K×L-dimensional channel matrix, by converting the channel matrix into a plurality of matrixes having an upper triangle structure; dividing each of the matrixes into at least two sub-matrixes having a dimension lower than that of the channel matrix; detecting transmission symbols from corresponding antennas through decoding of a) lowest sub-matrix signal received which sub-matrix is constituted of components having only the channel characteristics of two antennas among the two sub-matrixes; and b) an upper sub-matrix signal using the transmission symbols; and outputting all of the detected transmission symbols, if transmission symbols by a highest sub-matrix among at least two sub-matrixes are detected.

    Abstract translation: MIMO通信系统的接收机中的信号的检测包括用于经由K个天线的信号传输的发射机和用于经由L个接收天线接收信号的接收机,使得L大于或等于K,并且系统具有K× 通过将信道矩阵转换成具有上三角形结构的多个矩阵来生成L维信道矩阵; 将每个矩阵划分成具有小于信道矩阵的维度的至少两个子矩阵; 通过对所接收到的最小子矩阵信号进行解码来检测来自相应天线的传输符号,哪个子矩阵由仅具有两个子矩阵中的两个天线的信道特性的分量构成; 以及b)使用所述发送符号的上部子矩阵信号; 并且如果检测到在至少两个子矩阵中的最高子矩阵的传输符号,则输出所有检测到的传输符号。

    Method of forming gate electrode
    13.
    发明授权
    Method of forming gate electrode 失效
    形成栅电极的方法

    公开(公告)号:US07795123B2

    公开(公告)日:2010-09-14

    申请号:US12345832

    申请日:2008-12-30

    CPC classification number: H01L21/28035 H01L21/02576 H01L21/0262 H01L29/4925

    Abstract: The present invention discloses to a method of forming a gate electrode, the method according to the present invention comprises the steps of forming a lower amorphous silicon layer using silane (SiH4) gas and nitrous oxide (N2O) gas; forming an upper amorphous silicon layer on the lower amorphous silicon layer; and crystallizing the lower and upper amorphous silicon layers through a thermal process.

    Abstract translation: 本发明公开了一种形成栅电极的方法,根据本发明的方法包括以下步骤:使用硅烷(SiH4)气和一氧化二氮(N2O)气形成下一非晶硅层; 在所述下部非晶硅层上形成上部非晶硅层; 并通过热过程使下部和上部非晶硅层结晶。

    Method for matching rate in mobile communication system

    公开(公告)号:USRE41590E1

    公开(公告)日:2010-08-24

    申请号:US12059996

    申请日:2008-03-31

    CPC classification number: H04L1/0069 H04L1/004

    Abstract: A method for matching a rate in a mobile communication system causes puncturing or repetition in a fixed pattern, in which puncturing or repetition is applied to each bitstream on transport channels supporting different services in a next generation mobile communication system of the W-CDMA (Wideband Code Division Multiple Access) system. The method comprises the steps of (1) subjecting a bitstream on a transport channel for use in supporting a particular service to channel coding, (2) determining an initial error offset value for use in avoiding all the puncturing only in a particular bitstream among one or more than one bitstreams produced by the channel coding, (3) periodically subtracting a decrement from the determined initial error offset value, for puncturing a bit at a relevant position when a result of the subtraction satisfies a puncturing condition, (4) adding an update error parameter determined as the maximum bit size among TF (Transport Format) transportable during one TTI (Transport Time Interval) of the transport channel after the puncturing to a result of the subtraction, for updating an initial error offset value, and (5) periodically subtracting a decrement from the updated initial error offset value, for determining a position of a relevant bit to be punctured at the next time.

    Dielectric structure in nonvolatile memory device and method for fabricating the same
    16.
    发明授权
    Dielectric structure in nonvolatile memory device and method for fabricating the same 失效
    非易失性存储器件中的介质结构及其制造方法

    公开(公告)号:US07741170B2

    公开(公告)日:2010-06-22

    申请号:US11264028

    申请日:2005-11-02

    CPC classification number: H01L21/28273 H01L29/513 H01L29/7881

    Abstract: A dielectric structure in a nonvolatile memory device and a method for fabricating the same are provided. The dielectric structure includes: a first oxide layer; a first high-k dielectric film formed on the first oxide layer, wherein the first high-k dielectric film includes one selected from materials with a dielectric constant of approximately 9 or higher and a compound of at least two of the materials; and a second oxide layer formed on the first high-k dielectric film.

    Abstract translation: 提供了一种非易失性存储器件中的电介质结构及其制造方法。 介电结构包括:第一氧化物层; 形成在所述第一氧化物层上的第一高k电介质膜,其中所述第一高k电介质膜包括介电常数约为9或更高的材料和至少两种所述材料的化合物中的一种; 以及形成在第一高k电介质膜上的第二氧化物层。

    Method of fabricating semiconductor device
    17.
    发明授权
    Method of fabricating semiconductor device 失效
    制造半导体器件的方法

    公开(公告)号:US07648923B2

    公开(公告)日:2010-01-19

    申请号:US11963907

    申请日:2007-12-24

    Abstract: A method of fabricating a flash memory device is disclosed. The method comprises forming a first insulating layer on a semiconductor substrate; accumulating nitrogen at an interface between the semiconductor substrate and the first insulating layer to form a second insulating layer at the interface; and implanting oxygen into the second insulating layer to convert the second insulating layer to a third insulating layer.

    Abstract translation: 公开了一种制造闪速存储器件的方法。 该方法包括在半导体衬底上形成第一绝缘层; 在所述半导体衬底和所述第一绝缘层之间的界面处积累氮以在所述界面处形成第二绝缘层; 以及将氧注入到所述第二绝缘层中,以将所述第二绝缘层转换成第三绝缘层。

    Tunnel Insulating Layer of Flash Memory Device and Method of Forming the Same
    18.
    发明申请
    Tunnel Insulating Layer of Flash Memory Device and Method of Forming the Same 失效
    闪存器件的隧道绝缘层及其形成方法

    公开(公告)号:US20090166711A1

    公开(公告)日:2009-07-02

    申请号:US12345617

    申请日:2008-12-29

    Applicant: Kwon Hong

    Inventor: Kwon Hong

    CPC classification number: H01L29/513 H01L21/28273 H01L21/3144

    Abstract: The present invention discloses a tunnel insulating layer in a flash memory device and a method of forming the same, the method according to the present invention comprises the steps of forming a first oxide layer on a semiconductor substrate through a first oxidation process; forming a nitride layer on an interface between the semiconductor substrate and the first oxide layer through a first nitridation process; forming a second nitride layer on the first oxide layer through a second nitridation process; forming a second oxide layer on the second nitride layer through a second oxidation process; and forming a third nitride layer on the second oxide layer through a third nitridation process.

    Abstract translation: 本发明公开了闪速存储器件中的隧道绝缘层及其形成方法,根据本发明的方法包括以下步骤:通过第一氧化工艺在半导体衬底上形成第一氧化物层; 通过第一氮化工艺在所述半导体衬底和所述第一氧化物层之间的界面上形成氮化物层; 通过第二氮化工艺在所述第一氧化物层上形成第二氮化物层; 通过第二氧化工艺在所述第二氮化物层上形成第二氧化物层; 以及通过第三次氮化处理在所述第二氧化物层上形成第三氮化物层。

    METHOD OF FABRICATING SEMICONDUCTOR DEVICE
    19.
    发明申请
    METHOD OF FABRICATING SEMICONDUCTOR DEVICE 失效
    制造半导体器件的方法

    公开(公告)号:US20090098738A1

    公开(公告)日:2009-04-16

    申请号:US11963907

    申请日:2007-12-24

    Abstract: A method of fabricating a flash memory device is disclosed. The method comprises forming a first insulating layer on a semiconductor substrate; accumulating nitrogen at an interface between the semiconductor substrate and the first insulating layer to form a second insulating layer at the interface; and implanting oxygen into the second insulating layer to convert the second insulating layer to a third insulating layer.

    Abstract translation: 公开了一种制造闪速存储器件的方法。 该方法包括在半导体衬底上形成第一绝缘层; 在所述半导体衬底和所述第一绝缘层之间的界面处积累氮以在所述界面处形成第二绝缘层; 以及将氧注入到所述第二绝缘层中,以将所述第二绝缘层转换成第三绝缘层。

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