摘要:
A differential clock signal gating method and system is provided, wherein a clock buffer circuit control path develops a clock gating signal with a timing relationship to a clock signal. The clock gating signal gates a buffer on the clock buffer circuit controlled path in communication with the clock signal responsive to a first clock signal pulse negative half. The buffer provides second and successive clock signal pulses occurring immediately and sequentially after the first clock signal pulse as a buffer clock signal output to a second buffer stage in a second stage clock path, each having the nominal clock amplitude and the nominal clock pulse width of the clock signal without jitter.
摘要:
Aspects for reducing jitter in a PLL of a high speed serial link include examining at least one parameter related to performance of a voltage controlled oscillator (VCO) in the PLL, and controlling adjustment of a supply voltage to the VCO based on the examining. A regulator control circuit performs the examining and controlling.
摘要:
Disclosed are a receiver circuit, method and design architecture of a decision feedback equalizer (DFE) Clock-And-Data Recovery (CDR) architecture that utilizes/produces one sample-per-bit in the receiver and reduces bit-error-rate (BER). An integrating receiver is combined with a decision feedback equalizer along with the appropriate (CDR) loop phase detector to maintain a single sample per bit requirement. The incoming voltage is converted to a current and connected to a current summing node. Weighted currents determined by the values of previously detected bits and their respective feedback coefficients are also connected to this node. Additionally, the summed currents is integrated and converted to a voltage. A sampler is utilized to make a bit decision based on the resulting voltage. After sampling, the integrator is reset before analysis of the next bit. The necessary amplification is achieved by maximizing the sensitivity of the latch, using integration in front of the data latch.
摘要:
A method and system for testing a high-speed circuit is disclosed. The method and system include obtaining a high-speed statistical signature of the high-speed circuit using a conventional tester. The method and system further include comparing the high-speed statistical signature of the high-speed circuit to an expected signature. Consequently, it can be determined whether the high-speed circuit functions within the desired parameters.
摘要:
Aspects of providing automatic adaptation to frequency offsets in high speed serial links are described. First signals for phase adjusts in a receiver link are adjusted by detecting trends in the first signals to generate second signals, the second signals improving a rate of compensation for the frequency offsets by the phase adjusts. An up/down counter is included for counting signals for phase adjustments by a clock-data-recovery loop of a serial receiver. An adder is coupled to the up/down counter and outputs accumulated data indicative of a trend in the phase adjustments. Combinatorial logic coupled to the adder adapts the signals based on the accumulated data.
摘要:
The invention is directed to a clock data recovery system for resampling a clock signal to an incoming data signal. The clock data recovery system comprises a clock generator for generating the clock signal and a phase adjustment unit for generating sampling phases dependant on a phase adjustment control signal. It also comprises a data sampling unit operable to generate a stream of input samples and an edge detector for generating therefrom an internal early signal and an internal late signal. A phase adjustment control unit is disposed for generating under use of the early signal and the late signal the phase adjustment control signal. The phase adjustment control unit is feedable with an external early/late signal and/or comprises an output for delivering an export early/late signal.
摘要:
A method for providing quality control on wafers running on a manufacturing line is disclosed. The resistances on a group of manufacturing test structures within a wafer running on a wafer manufacturing line are initially measured. Then, an actual distribution value is obtained based on the result of the measured resistances on the group of manufacturing test structures. The difference between the actual distribution value and a predetermined distribution value is recorded. Next, the resistances on a group of design test structures within the wafer are measured. The measured resistances of the group of design test structures are correlated to the measured resistances of the group of manufacturing test structures in order to obtain an offset value. The resistance of an adjustable resistor circuit within the wafer and subsequent wafers running on the wafer manufacturing line are adjusted according to the offset value.
摘要:
A circuit arrangement for synchronizing source data from a source system with a clock and/or clocks from a sink system. The circuit arrangement includes a source counter, a buffer, a sink counter and a controller. The source data is placed in consecutive buffer positions under the control of the source counter. The sink counter is made to "follow" the source counter and identifies the location in the buffer whereat output data is to be extracted. The controller monitors the counters and generates control signals representative of the state of the buffer.
摘要:
Aspects of providing automatic adaptation to frequency offsets in high speed serial links are described. First signals for phase adjusts in a receiver link are adjusted by detecting trends in the first signals to generate second signals, the second signals improving a rate of compensation for the frequency offsets by the phase adjusts. An up/down counter is included for counting signals for phase adjustments by a clock-data-recovery loop of a serial receiver. An adder is coupled to the up/down counter and outputs accumulated data indicative of a trend in the phase adjustments. Combinatorial logic coupled to the adder adapts the signals based on the accumulated data.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.