Methods and systems for memory devices
    11.
    发明授权
    Methods and systems for memory devices 有权
    存储器件的方法和系统

    公开(公告)号:US07746706B2

    公开(公告)日:2010-06-29

    申请号:US11639935

    申请日:2006-12-15

    IPC分类号: G11C16/04

    CPC分类号: G11C16/3404 G11C16/0475

    摘要: One embodiment of the invention relates to a method for accessing a memory cell. In this method, at least one bit of the memory cell is erased. After erasing the at least one bit, a soft program operation is performed to bias the memory cell thereby improving the reliability of data stored in the memory cell.Other methods and systems are also disclosed.

    摘要翻译: 本发明的一个实施例涉及访问存储器单元的方法。 在该方法中,擦除存储单元的至少一位。 在擦除至少一个位之后,执行软编程操作以偏置存储器单元,从而提高存储在存储单元中的数据的可靠性。 还公开了其它方法和系统。

    FLASH MEMORY DEVICE WITH EXTERNAL HIGH VOLTAGE SUPPLY
    12.
    发明申请
    FLASH MEMORY DEVICE WITH EXTERNAL HIGH VOLTAGE SUPPLY 有权
    具有外部高压电源的闪存存储器件

    公开(公告)号:US20080151639A1

    公开(公告)日:2008-06-26

    申请号:US11613383

    申请日:2006-12-20

    IPC分类号: G11C16/32

    CPC分类号: G11C16/12

    摘要: A semiconductor memory device (104) selectably connectable to an external high voltage power supply (122) is provided. The semiconductor memory device (104) includes a switch (314), a detector (316) and a timing device (318). The switch (314) is connected to external voltage supply signals and selectably couples the external voltage supply signals to memory cells (305) of the semiconductor memory device (104) for memory operations thereof. The external voltage supply signals including a high voltage signal (412) provided from the external high voltage power supply (122) and an operational voltage signal Vcc (402). The detector (316) is connected to the external voltage supply signals for generating a timer activation signal (404) in response to detecting an operational voltage power-on period. The timing device (318) signals the switch (314) to decouple the high voltage signal (412) and the operational voltage signal (402) from the memory cells (305) in response to the timer activation signal (404) and to recouple the high voltage signal (412) and the operational voltage signal (402) to the memory cells (305) a time delay interval thereafter. The time delay interval is determined in response to the high voltage signal (412).

    摘要翻译: 提供可选择地连接到外部高压电源(122)的半导体存储器件(104)。 半导体存储器件(104)包括开关(314),检测器(316)和定时装置(318)。 开关(314)连接到外部电压源信号,并且可选择地将外部电压供应信号耦合到半导体存储器件(104)的存储单元(305),用于存储器操作。 包括从外部高压电源(122)提供的高电压信号(412)的外部电压供给信号和操作电压信号Vcc(402)。 检测器(316)连接到外部电压源信号,以响应于检测到工作电压通电周期而产生定时器激活信号(404)。 定时装置(318)响应于定时器启动信号(404),向开关314通知高压信号412和操作电压信号402与存储单元305的耦合, 高电压信号(412)和操作电压信号(402)到其后的时间延迟区间。 响应于高电压信号确定时间延迟间隔(412)。

    Methods and systems for memory devices
    13.
    发明申请
    Methods and systems for memory devices 有权
    存储器件的方法和系统

    公开(公告)号:US20080144391A1

    公开(公告)日:2008-06-19

    申请号:US11639935

    申请日:2006-12-15

    IPC分类号: G11C16/10

    CPC分类号: G11C16/3404 G11C16/0475

    摘要: One embodiment of the invention relates to a method for accessing a memory cell. In this method, at least one bit of the memory cell is erased. After erasing the at least one bit, a soft program operation is performed to bias the memory cell thereby improving the reliability of data stored in the memory cell.Other methods and systems are also disclosed.

    摘要翻译: 本发明的一个实施例涉及访问存储器单元的方法。 在该方法中,擦除存储单元的至少一位。 在擦除至少一个位之后,执行软编程操作以偏置存储器单元,从而提高存储在存储单元中的数据的可靠性。 还公开了其它方法和系统。

    Voltage regulator with less overshoot and faster settling time
    14.
    发明授权
    Voltage regulator with less overshoot and faster settling time 有权
    电压调节器具有较少的过冲和更快的建立时间

    公开(公告)号:US07352626B1

    公开(公告)日:2008-04-01

    申请号:US11212614

    申请日:2005-08-29

    IPC分类号: G11C11/34 G11C7/00

    CPC分类号: G11C5/14

    摘要: A voltage regulator may include an operational-amplifier section, a capacitor connected to an output of the operational-amplifier section, and a switch configured to connect the capacitor to a voltage supply. The switch is configured to charge the capacitor before activating the operational-amplifier section. The capacitor is configured to store charge to supplement current being supplied from the operational-amplifier section. The voltage regulator may be used to supply power to non-volatile memory cells.

    摘要翻译: 电压调节器可以包括运算放大器部分,连接到运算放大器部分的输出的电容器和被配置为将电容器连接到电压源的开关。 开关被配置为在激活运算放大器部分之前对电容器充电。 电容器被配置为存储电荷以补充从运算放大器部分提供的电流。 电压调节器可以用于向非易失性存储单元供电。

    Method to provide a higher reference voltage at a lower power supply in flash memory devices
    15.
    发明授权
    Method to provide a higher reference voltage at a lower power supply in flash memory devices 有权
    在闪存器件中的较低电源处提供较高参考电压的方法

    公开(公告)号:US07724075B2

    公开(公告)日:2010-05-25

    申请号:US11634776

    申请日:2006-12-06

    IPC分类号: G05F1/575

    CPC分类号: G11C5/147 G05F3/08 G11C16/30

    摘要: A fast reference circuit having active feedback includes a bias supply circuit and a variable divider circuit connected by an active feedback path to the bias supply circuit, and a comparator circuit connected to the variable divider circuit, the bias supply circuit, and a reference node of the variable divider circuit. In one embodiment, a start-up circuit initially discharges a potential at the bias supply and comparator circuits, then initializes a reference voltage at the reference node at about zero volts to improve repeatability. In one embodiment, the variable voltage divider comprises an impendence that is trimmed based on a sheet resistance of a process used to fabricate the fast reference circuit, and further comprises a variable reference current circuit coupled to the impedance and configured to generate a current having a value based on a desired reference voltage and to conduct the current through the impedance, thereby generating the reference voltage associated therewith. The comparator circuit is configured to compare the bias supply voltage to the reference voltage, and drive the bias supply and the variable divider circuit in response to the comparison, thereby quickly stabilizing the reference voltage.

    摘要翻译: 具有有源反馈的快速参考电路包括偏置电源电路和通过有源反馈路径连接到偏置电源电路的可变分频器电路,以及连接到可变分频器电路,偏置电源电路和参考节点的参考节点 可变分频电路。 在一个实施例中,启动电路首先在偏置电源和比较器电路处放电,然后在约零伏特的参考节点初始化参考电压,以提高可重复性。 在一个实施例中,可变分压器包括基于用于制造快速参考电路的工艺的薄层电阻而修整的阻抗,并且还包括耦合到阻抗的可变参考电流电路,并且被配置为产生具有 基于所需参考电压的值,并且将电流传导通过阻抗,由此产生与其相关联的参考电压。 比较器电路被配置为将偏置电源电压与参考电压进行比较,并且响应于比较来驱动偏置电源和可变分频器电路,由此快速稳定参考电压。

    CIRCUIT PRE-CHARGE TO SENSE A MEMORY LINE
    16.
    发明申请
    CIRCUIT PRE-CHARGE TO SENSE A MEMORY LINE 有权
    电路预先感知记忆线

    公开(公告)号:US20090147587A1

    公开(公告)日:2009-06-11

    申请号:US11951262

    申请日:2007-12-05

    IPC分类号: G11C16/00

    CPC分类号: G11C16/30 G11C7/12 G11C16/24

    摘要: Commonly, read times of a memory line are slowed due to voltage overshoot and/or voltage undershoot. To eliminate these problems, a control component can manage voltage while a leakage component manages timing of voltage. This allows for a line pre-charge that produces increase read times. The control component can implement as a variable resistor that modifies value to compensate for temperature. The leakage component can include a capacitor configuration that allows voltage to pass.

    摘要翻译: 通常,存储线的读取时间由于电压过冲和/或电压下冲而变慢。 为了消除这些问题,控制部件可以管理电压,同时泄漏部件管理电压的时序。 这允许产生增加读取时间的线路预充电。 控制组件可以实现一个可变电阻器来修改值来补偿温度。 泄漏部件可以包括允许电压通过的电容器配置。

    Drain voltage regulator
    17.
    发明授权
    Drain voltage regulator 有权
    漏电压调节器

    公开(公告)号:US07460415B2

    公开(公告)日:2008-12-02

    申请号:US11639936

    申请日:2006-12-15

    IPC分类号: G11C5/14

    CPC分类号: G11C7/16 G11C5/147 G11C7/12

    摘要: A voltage regulator comprises resistor elements that mitigate variations in a program voltage (VPROG). In particular, the resistors allow copies of the voltage regulator to be fabricated more consistently across a semiconductor substrate. As such, variations in respective program voltages applied to different bitlines of a memory arrangement are mitigated. This mitigates yield loss as more devices perform as desired, thus necessitating fewer discards.

    摘要翻译: 电压调节器包括减轻编程电压(VPROG)变化的电阻元件。 特别地,电阻允许电压调节器的副本在半导体衬底上更一致地制造。 因此,减轻了施加到存储器装置的不同位线的各个编程电压的变化。 随着越来越多的设备按需要执行,这减轻了产量损失,因此需要更少的丢弃物。

    Charge-sharing technique during flash memory programming
    18.
    发明授权
    Charge-sharing technique during flash memory programming 有权
    闪存编程中的电荷共享技术

    公开(公告)号:US07196938B1

    公开(公告)日:2007-03-27

    申请号:US11229530

    申请日:2005-09-20

    IPC分类号: G11C16/04

    CPC分类号: G11C16/12

    摘要: A non-volatile memory cell array, such as a Flash NOR array, is programmed by applying voltages to bit lines that connect to memory cells in the memory cell array. A first bit line corresponding to a first memory cell in the memory array may be turned on to perform a first programming operation for the first memory cell and second bit line corresponding to a second memory cell in the memory array may be turned on to perform a second programming operation that is configured to complete after the first programming operation. The turning on/off of the first and second bit lines may be overlapped to share charge between the first and second bit lines. This overlapping can reduce wasted power and decrease programming pulse overshoot problems.

    摘要翻译: 诸如闪存NOR阵列的非易失性存储单元阵列通过将电压施加到连接到存储单元阵列中的存储单元的位线来编程。 对应于存储器阵列中的第一存储器单元的第一位线可以被接通以对第一存储器单元执行第一编程操作,并且可以打开与存储器阵列中的第二存储器单元相对应的第二位线来执行 第二编程操作被配置为在第一编程操作之后完成。 第一和第二位线的导通/截止可以重叠以在第一和第二位线之间共享电荷。 这种重叠可以减少浪费的功率并减少编程脉冲过冲问题。

    Flash memory programming power reduction
    19.
    发明授权
    Flash memory programming power reduction 有权
    闪存编程功耗降低

    公开(公告)号:US08462564B1

    公开(公告)日:2013-06-11

    申请号:US13090981

    申请日:2011-04-20

    CPC分类号: G11C16/12 G11C5/145 G11C8/08

    摘要: A non-volatile memory device includes an array of non-volatile memory cells. When programming the memory cells, a voltage supply source is used that includes multiple independent charge pumps. The independent charge pumps supply the programming voltage to different ones of bit lines in the array of memory cells. Using multiple charge pumps tends to reduce output voltage fluctuations and thereby reduce power loss.

    摘要翻译: 非易失性存储器件包括非易失性存储器单元阵列。 当对存储器单元进行编程时,使用包括多个独立电荷泵的电压源。 独立电荷泵将编程电压提供给存储器单元阵列中的不同位线。 使用多个电荷泵倾向于降低输出电压波动,从而降低功率损耗。

    Capacitor structure used for flash memory
    20.
    发明授权
    Capacitor structure used for flash memory 有权
    用于闪存的电容结构

    公开(公告)号:US07749855B2

    公开(公告)日:2010-07-06

    申请号:US11838483

    申请日:2007-08-14

    IPC分类号: H01L21/8247

    摘要: A method of forming a capacitor for use as a charge pump with flash memory, comprising: (a) concurrently forming polysilicon gates on a semiconductor body in a core region and a polysilicon middle capacitor plate in a peripheral region, (b) forming a first dielectric layer over the polysilicon gates and the middle capacitor plate, (c) planarizing the first dielectric layer to expose a top portion of the polysilicon gates and a top portion of the middle capacitor plate, (d) forming a second dielectric layer over the top portion of the middle capacitor layer, (e) concurrently forming patterning a second polysilicon layer in the core region and a third capacitor plate in the periphery region and (f) connecting the third capacitor plate to the source/drain well.

    摘要翻译: 一种形成用作具有闪速存储器的电荷泵的电容器的方法,包括:(a)在芯区域中的半导体本体和外围区域中的多晶硅中间电容器板同时形成多晶硅栅极,(b)形成第一 在多晶硅栅极和中间电容器板上的电介质层,(c)平坦化第一介电层以暴露多晶硅栅极的顶部和中间电容器板的顶部,(d)在顶部上形成第二电介质层 (e)同时形成芯区域中的第二多晶硅层图案和周边区域中的第三电容器板,以及(f)将第三电容器板连接到源极/漏极阱。