Abstract:
A non-frangible glass article strengthened by a dual or two-step ion exchange (IOX) process, where the first IOX step leads to a depth of compressive layer FSM_DOL>0.1·t or, in some embodiments, FSM_DOL>0.15·t, where t is the thickness of the glass, is provided. The glass article has a compressive stress CS1 after the first IOX step at the surface of from 100 MPa to 400 MPa or, in some embodiments, from 150 MPa to 300 MPa. The first IOX step is followed by a second IOX step, leading to a “spike” compressive stress CS2 after the second IOX step at the surface of greater than 500 MPa or, in some embodiments, 700 MPa. The width of the spike generated by the second IOX is between 1 μm and 30 μm, or between 8 μm and 15 μm, using the criteria where the magnitude (absolute value) of the slope of the spike is higher than 20 MPa/μm.
Abstract:
A non-frangible glass article strengthened by a dual or two-step ion exchange (IOX) process, where the first IOX step leads to a depth of compressive layer FSM_DOL>0.1·t or, in some embodiments, FSM_DOL>0.15·t, where t is the thickness of the glass, is provided. The glass article has a compressive stress CS1 after the first IOX step at the surface of from 100 MPa to 400 MPa or, in some embodiments, from 150 MPa to 300 MPa. The first IOX step is followed by a second IOX step, leading to a “spike” compressive stress CS2 after the second IOX step at the surface of greater than 500 MPa or, in some embodiments, 700 MPa. The width of the spike generated by the second IOX is between 1 μm and 30 μm, or between 8 μm and 15 μm, using the criteria where the magnitude (absolute value) of the slope of the spike is higher than 20 MPa/μm.
Abstract:
Prism-coupling systems and methods for characterizing large depth-of-layer waveguides formed in glass substrates are disclosed. One method includes making a first measurement after a first ion-exchange process that forms a deep region and then performing a second measurement after a second ion-exchange process that forms a shallow region. Light-blocking features are arranged relative to the prism to produce a mode spectrum where the contrast of the mode lines for the strongly coupled low-order modes is improved at the expense of loss of resolution for measuring characteristics of the shallow region. Standard techniques for determining the compressive stress, the depth of layer or the tensile strength of the shallow region are then employed. A second measurement can be made using a near-IR wavelength to measure characteristics of the deeper, first ion-exchange process. Systems and methods of measuring ion-exchanged samples using shape control are also disclosed.
Abstract:
A method and apparatus for improving contrast in prism coupling measurements of waveguide mode spectra, wherein the measured waveguide sample has a surface region of rapidly decreasing index, characterized with normalized slope |λ/n dn/dz|>0.0004. An opaque light-blocking element is placed in the portion of the light beam closest to the plane of the contact between prism and measured sample, on the input side, output side or both sides of the prism. The light blocking element prevents light from the light source to reach a portion of the length of the prism-sample coupling interface along the optical path, prevents light reflected from a portion of the aforementioned length to reach the detector, or both when input and output light-blocking elements are used.
Abstract:
Methods of capturing improved-contrast mode spectra of a double ion-exchanged (DIOX) glass sample using prism coupling of index np. The DIOX glass sample has a refractive index profile with a first region adjacent the surface that satisfies 0.0005 ≤ λ n ⅆ n ⅆ x ≤ 0.0009 , where λ is a wavelength of measuring light. The prism-sample interface includes an interfacing liquid of index nf that differs from np by no more than 0.03, and that can exceed np. The mode spectra have a contrast that is higher than that obtained by conventional prism coupling by using gradient illumination or partially blocked illumination that reduces the amount of background reflected light from the coupling prism. The improved-contrast mode spectra can be processed using conventional means to determine at least one stress characteristic of the DIOX glass sample.