Abstract:
An embedded framing bit pattern in a serial bit stream is located by combining the last bit to arrive of the serial bit stream with a predetermined number of prior bits of the serial bit stream which are spaced apart by the pitch of the bits of the framing bit pattern, and this combination of the bits is tested to determine if the combination matches part of the framing bit pattern. If a match does not occur, then the bits which were combined together are changed to a bit pattern that will not result in a match when these bits (except for the eldest bit which is disregarded) is combined again with a new bit of the serial bit stream, no matter what the logic state of the new bit. In this manner all of the bits, as they arrive and are combined and tested, will eventually be changed except the bits which are part of the framing bit pattern.
Abstract:
A temperature and processing compensated time delay circuit of the type which can be fabricated in a monolithic integrated circuit utilizes a field effect transistor (FET) (12) connected to the terminals of a charged capacitor (14). A bias voltage connected to the gate of the FET (12) varies with temperature in a manner to compensate for the changes in current which flows from the capacitor (14) through the FET (12) due to changes in temperature. The bias voltage also varies from one integrated circuit to another in a manner to compensate for variations in FET threshold voltage caused by variations in the processing of the integrated circuits.
Abstract:
An embedded framing bit pattern in a serial bit stream is located by combining the last bit to arrive of the serial bit stream with a predetermined number of prior bits of the serial bit stream which are spaced apart by the pitch of the bits of the framing bit pattern, and this combination of bits is tested to determine if the combination matches part of the framing bit pattern. If a match does not occur, then the bits which were combined together are changed to a bit pattern that will not result in a match when these bits (except for the eldest bit which is disregarded) is combined again with a new bit of the serial bit stream, no matter what the logic state of the new bit. In this manner all of the bits, as they arrive and are combined and tested, will eventually be changed except the bits which are part of the framing bit pattern.
Abstract:
A data compression/decompression processor implements a modified Ziv-Lempel ("LZ") coding technique. The processor includes three modules, an interface, a coder-decoder ("CODEC"), and a MODEL. The CODEC and the MODEL modules together form compression engine, in which the CODEC provides variable length coding and data packing, and the MODEL implements the LZ processing. The MODEL uses content addressable memory ("CAM") in encoding mode for text storage and character matching, and uses CAM in decoding mode as an on-chip RAM to obtain high speed access.
Abstract:
A delay circuit that can be implemented in a monolithic integrated circuit includes a plurality of capacitor/laser-fusible link series pairs. Delay of a binary output signal of the circuit with respect to an input transition is directly proportional to the amount of capacitance connected into the circuit. Because the laser-fusible links can selectively be opened with a laser, the amount of capacitance connected into the circuit can incrementally be reduced; thus, the delay of the circuit is reducibly adjustable to a desired value. By including a plurality of conductive element/laser-fusible link series pairs in the delay circuit, the delay of the circuit is also increasingly adjustable. A method for economically adjusting the delay of each of many like delay circuits embodied in a semiconductor wafer includes measuring a sample of the delays of the delay circuits, calculating an average delay, determining the difference between a desired delay and the average delay to determine an incremental amount of delay to eliminate or to add, determining from predetermined data which fusible links should be opened, and using a laser beam to open the appropriate links.
Abstract:
A compact memory cell combines a volatile dynamic storage section with a shadow nonvolatile section in two vertically stacked element arrays.
Abstract:
A clocking system for a self-refreshed dynamic memory (10) for reading data stored in a memory cell (30) and including clocking circuitry (68) includes detecting changes in an address signal (60). The method further includes generating a memory refresh signal (64, 66) in response to detecting changes in the address signal (60). The memory refresh signal (66) is applied to the semiconductor memory circuit (30) for refreshing data stored in the memory cells of the semiconductor memory circuit (30). After the application of the memory refresh signal (66) to the semiconductor memory circuit (30) the address signal (16) is applied to the semiconductor memory circuit (30) for accessing the addressed memory cell to thereby read the data stored therein. The clocking circuitry (68) is reset and precharged during the application of the refresh signal (66) to the semiconductor memory circuit (30).
Abstract:
Analog-to-digital conversion through successive approximation is implemented by means of a charge coupled device. During the conversion process two charges are compared, each comparison yielding one bit of a multi-bit number. By increasing the lesser of the compared charges after each comparison, the need to subtract charge as part of the successive approximation process is eliminated.
Abstract:
Analog-to-digital conversion through successive approximation is implemented by means of a charge coupled device. During the conversion process two charges are compared, each comparison yielding one bit of a multi-bit number. By increasing the lesser of the compared charges after each comparison, the need to subtract charge as part of the successive approximation process is eliminated.
Abstract:
A content addressable memory is provided that includes a memory cell and a first plurality of lines connected directly to the gates of access transistors to this memory cell. These access transistors are further connected to a second plurality of lines. The first and second plurality of lines each perform different functions during read, write, and comparison modes. In another embodiment of the present invention, p-channel transistors are used for a match transistor and its associated pass transistors.