Using cone shaped search models to locate ball bonds on wire bonded
devices
    11.
    发明授权
    Using cone shaped search models to locate ball bonds on wire bonded devices 失效
    使用锥形搜索模型来定位导线接合装置上的球形接合

    公开(公告)号:US5550763A

    公开(公告)日:1996-08-27

    申请号:US236211

    申请日:1994-05-02

    Abstract: Method and apparatus for automatically locating the center of a ball bond of a wire to a lead frame and semiconductor chip or similar device; analyzing the optically sensed images; a bonding mechanism; and a host controller connected to the bonding mechanism, the movable platform. The present invention constructs a synthetic flattened cone model using a center radius, and monotonically increasing slope values to generate a model having a variation in grey levels, and inner and outer radii that will encompass expected size variations in a ball bond; sets a threshold for acceptable normalized correlation search results; acquires a digitized image of the bond, including a nominal location for the bond; conducts a normalized correlation search of the digitized image at the bond location, using the flattened synthetic cone model; and indicates the presence and location of the expected circular object as the location having the largest coefficient which exceeds a threshold.

    Abstract translation: 用于自动将导线的球接合中心定位到引线框架和半导体芯片或类似装置的方法和装置; 分析光学感测图像; 粘合机制; 以及连接到所述接合机构,所述可移动平台的主机控制器。 本发明使用中心半径构造合成扁平锥体模型,并且单调地增加斜率值以产生具有灰度级变化的模型,以及包含球形键的预期尺寸变化的内外半径; 设置可接受的标准化相关搜索结果的阈值; 获得债券的数字化图像,包括债券的标称位置; 使用扁平的合成锥模型,对结合位置处的数字化图像进行归一化相关检索; 并且指示期望的圆形物体作为具有超过阈值的最大系数的位置的存在和位置。

    Basic refractory shapes
    12.
    发明授权
    Basic refractory shapes 失效
    基本耐火形状

    公开(公告)号:US4847222A

    公开(公告)日:1989-07-11

    申请号:US46238

    申请日:1987-05-04

    CPC classification number: C04B35/0435 B22D41/32 B22D41/54

    Abstract: A basic refractory shape resulting from firing a batch consisting essentially of a magnesite and a zirconia; said batch containing for each 100 percent by weight thereof about 3 to 20 percent by weight of coarse zirconia having a particle size of 150-mesh Tyler, or greater, and 0 to 20 percent by weight of fine zirconia having a particle size of finer than 150-mesh Tyler and a slide gate assembly comprising at least one such shape.

    Abstract translation: 由基本上由菱镁矿和氧化锆组成的批次煅烧而产生的基本耐火形状; 所述批料每100重量%含有约3至20重量%的粒度为150目泰勒或更大的粗大氧化锆和0至20重量%的粒度比细小的细小氧化锆 150目Tyler和包括至少一个这种形状的滑动门组件。

    Method and Apparatus for Training a Probe Model Based Machine Vision System
    13.
    发明申请
    Method and Apparatus for Training a Probe Model Based Machine Vision System 有权
    用于训练基于探针模型的机器视觉系统的方法和装置

    公开(公告)号:US20130182948A1

    公开(公告)日:2013-07-18

    申请号:US13733685

    申请日:2013-01-03

    Abstract: A method for training a pattern recognition algorithm including the steps of identifying the known location of the pattern that includes repeating elements within a fine resolution image, using the fine resolution image to train a model associated with the fine image, using the model to examine the fine image resolution image to generate a score space, examining the score space to identify a repeating pattern frequency, using a coarse image that is coarser than the finest image resolution image to train a model associated with the coarse image, using the model associated with the coarse image to examine the coarse image thereby generating a location error, comparing the location error to the repeating pattern frequency and determining if the coarse image resolution is suitable for locating the pattern within a fraction of one pitch of the repeating elements.

    Abstract translation: 一种用于训练模式识别算法的方法,包括以下步骤:使用所述模型来识别包含精细分辨率图像内的重复元素的图案的已知位置,使用所述精细分辨率图像来训练与所述精细图像相关联的模型, 精细图像分辨率图像以生成分数空间,使用与最粗图像分辨率图像相比较粗糙的图像来检查分数空间以识别重复图案频率,以使用与该图像相关联的模型来训练与粗图像相关联的模型 粗图像以检查粗图像,从而产生位置误差,将位置误差与重复图案频率进行比较,并确定粗图像分辨率是否适于将图案定位在重复元件的一个间距的几分之一内。

    Method and apparatus for training a probe model based machine vision system
    14.
    发明授权
    Method and apparatus for training a probe model based machine vision system 有权
    用于训练基于探针模型的机器视觉系统的方法和装置

    公开(公告)号:US08457390B1

    公开(公告)日:2013-06-04

    申请号:US12249318

    申请日:2008-10-10

    Abstract: A method for training a pattern recognition algorithm for a machine vision system that uses models of a pattern to be located, the method comprising the steps of training each of a plurality of models using a different training image wherein each of the training images is a version of a single image of the pattern at a unique coarse image resolution, using the models to identify at least one robust image resolution where the image resolution is suitable for locating the pattern within an accuracy limit of the actual location of the pattern in the image and storing the at least one robust image resolution for use in subsequent pattern recognition processes.

    Abstract translation: 一种训练用于使用要定位的模式的模型的机器视觉系统的模式识别算法的方法,所述方法包括以下步骤:使用不同的训练图像训练多个模型中的每一个,其中每个训练图像是版本 使用这些模型来识别至少一个鲁棒的图像分辨率,其中图像分辨率适合于将图案定位在图像的图案的实际位置的精度极限内,以及 存储用于后续模式识别过程的至少一个鲁棒图像分辨率。

    Machine vision technique for manufacturing semiconductor wafers
    15.
    发明授权
    Machine vision technique for manufacturing semiconductor wafers 有权
    用于制造半导体晶片的机器视觉技术

    公开(公告)号:US08139231B2

    公开(公告)日:2012-03-20

    申请号:US12113492

    申请日:2008-05-01

    Abstract: A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.

    Abstract translation: 提供了一种视觉系统,用于确定平台上的光伏器件晶片与光伏器件晶片远离印版的远程侧的印刷元件(例如印刷丝网)之间的位置关系。 源沿着与穿过压板的孔的纵向轴线横向的路径发射紫外光,并且漫射板位于沿着该路径的位置。 反射器将来自扩散板的光引向光圈。 摄像机沿着孔的纵向轴线定位,并使用从压板孔接收的光产生图像,其中一些接收的光被晶片反射。 带通滤波器放置在相机的前面以阻挡环境光。 使用扩散的紫外光增强了晶片和印刷元件之间的图像的对比度。

    EFFERVESCENT TABLET WITH IMPROVED DISSOLUTION TIME AND METHOD OF USING THE SAME
    16.
    发明申请
    EFFERVESCENT TABLET WITH IMPROVED DISSOLUTION TIME AND METHOD OF USING THE SAME 审中-公开
    具有改进的溶解时间的有效片剂及其使用方法

    公开(公告)号:US20110281008A1

    公开(公告)日:2011-11-17

    申请号:US13086298

    申请日:2011-04-13

    CPC classification number: A61K9/0007 A61K9/2068 A61K47/44

    Abstract: An effervescent tablet that includes from about 20% by weight to about 80% by weight effervescent agent that includes an acid and a base, from about 5% by weight to about 25% by weight a first binder, and at least 0.1% by weight oil component that includes at least one of a fatty acid comprising an alkyl chain having at least 10 carbon atoms, safflower oil, canola oil, sunflower oil, flax seed oil, and wheat germ oil, the tablet having a hardness of at least 2 kiloponds. The tablet optionally includes from about 2% by weight to about 20% by weight of a component (e.g. Aspartame) that is insoluble in water, slightly soluble in water, or sparingly soluble in water or exhibits delayed solubility in water.

    Abstract translation: 一种泡腾片剂,其包含约20重量%至约80重量%的泡腾剂,其包含酸和碱,约5重量%至约25重量%的第一粘合剂和至少0.1重量% 油组分,其包含至少一种包含至少10个碳原子的烷基链的脂肪酸,红花油,菜籽油,向日葵油,亚麻籽油和小麦胚芽油,所述片剂具有至少2千泊的硬度 。 片剂任选地包含约2重量%至约20重量%的不溶于水,微溶于水或微溶于水或在水中延迟溶解的组分(例如阿斯巴甜)。

    SYSTEM AND METHOD FOR RUNTIME DETERMINATION OF CAMERA MISCALIBRATION
    17.
    发明申请
    SYSTEM AND METHOD FOR RUNTIME DETERMINATION OF CAMERA MISCALIBRATION 审中-公开
    用于运动测定摄像机分离的系统和方法

    公开(公告)号:US20110157373A1

    公开(公告)日:2011-06-30

    申请号:US12647192

    申请日:2009-12-24

    CPC classification number: G06T7/85 G06T2207/10012 G06T2207/30108

    Abstract: This invention provides a system and method for runtime determination (self-diagnosis) of camera miscalibration (accuracy), typically related to camera extrinsics, based on historical statistics of runtime alignment scores for objects acquired in the scene, which are defined based on matching of observed and expected image data of trained object models. This arrangement avoids a need to cease runtime operation of the vision system and/or stop the production line that is served by the vision system to diagnose if the system's camera(s) remain calibrated. Under the assumption that objects or features inspected by the vision system over time are substantially the same, the vision system accumulates statistics of part alignment results and stores intermediate results to be used as indicator of current system accuracy. For multi-camera vision systems, cross validation is illustratively employed to identify individual problematic cameras. The system and method allows for faster, less-expensive and more-straightforward diagnosis of vision system failures related to deteriorating camera calibration.

    Abstract translation: 本发明提供了一种用于基于场景中获取的对象的运行时对准分数的历史统计信息的通常与摄像机外部特征相关的摄像机误差(精确度)的运行时确定(自诊断)的系统和方法,其基于 训练对象模型的观察和预期图像数据。 这种安排避免了停止视觉系统的运行时操作和/或停止由视觉系统服务的生产线来诊断系统的相机是否保持校准的需要。 在视觉系统随时间检查的对象或特征基本相同的假设下,视觉系统累积部分对齐结果的统计信息,并存储要用作当前系统精度指标的中间结果。 对于多摄像机视觉系统,交叉验证被说明性地用于识别个别有问题的摄像机。 该系统和方法允许对与相机校准恶化相关的视觉系统故障的更快,更便宜和更直接的诊断。

    Method and apparatus for backlighting a wafer during alignment
    18.
    发明授权
    Method and apparatus for backlighting a wafer during alignment 有权
    在对准期间背光晶片的方法和装置

    公开(公告)号:US07639861B2

    公开(公告)日:2009-12-29

    申请号:US11162540

    申请日:2005-09-14

    CPC classification number: H01L21/67259 G03F9/7011 G03F9/7088

    Abstract: A method and apparatus is provided for illuminating a wafer during wafer alignment using machine vision. An illumination device is fabricated using electroluminescent material, that provides diffuse illumination uniformly over the surface of the lamp to provide backlighting of the wafer. Contrast between the image of the wafer and the diffuse illumination produce edge features in the image that can be analyzed to determine the position and orientation of the wafer.

    Abstract translation: 提供了一种用于在使用机器视觉的晶片对准期间照亮晶片的方法和装置。 使用电致发光材料制造照明装置,其在灯的表面上均匀地提供漫射照明以提供晶片的背光。 晶片的图像与漫射照明之间的对比产生图像中的边缘特征,可以分析晶片的位置和取向。

    Method and apparatus for semiconductor wafer alignment
    19.
    发明申请
    Method and apparatus for semiconductor wafer alignment 有权
    用于半导体晶片对准的方法和装置

    公开(公告)号:US20080050006A1

    公开(公告)日:2008-02-28

    申请号:US11508551

    申请日:2006-08-23

    CPC classification number: H01L21/681 G06T7/73

    Abstract: The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.

    Abstract translation: 本发明在一些方面提供了一种晶片对准系统,其包括图像获取装置,照明源,可旋转晶片平台和图像处理器,该图像处理器包括用于将物品(例如晶片)的图像中的坐标映射到 平台在平台的多个旋转角度的每一个处以“世界”参照系。

    Method and apparatus for determining a reference point of an object profile within an image
    20.
    发明授权
    Method and apparatus for determining a reference point of an object profile within an image 失效
    用于确定图像内的对象轮廓的参考点的方法和装置

    公开(公告)号:US06249602B1

    公开(公告)日:2001-06-19

    申请号:US09086326

    申请日:1998-05-28

    CPC classification number: G06K9/3216 G06K9/6203 G06T7/30 G06T7/60

    Abstract: An efficient and reliable method and apparatus is disclosed that finds a reference point of an object profile within an image when the object is of an unknown size. The object profile is modeled using a synthetic labeled-projection model, which in conjunction with the image, is projected over a portion of the image of the object profile to derive a histogram. The histogram is normalized and a maximum of a first derivative of the histogram is defined for that position. The position of the labeled-projection model is moved relative to the image, and the process is repeated until a selected portion of the image has been examined. The first derivative of the normalized labeled projection is greatest when a feature of the image and the feature denoted by a specific synthetic label of the labeled-projection model are aligned. The method and apparatus can locate the center of the object with reliability, because use of the labeled-projection model and the histogram minimizes the * effects of image artifacts. Further, the method decreases computational time, and thus, increases performance speed.

    Abstract translation: 公开了一种有效且可靠的方法和装置,当物体具有未知尺寸时,找到图像内的对象轮廓的参考点。 使用合成的标注投影模型对对象轮廓进行建模,该模型与图像一起投影在对象轮廓的图像的一部分上以导出直方图。 对直方图进行归一化,并为该位置定义直方图的一阶导数的最大值。 标记投影模型的位置相对于图像移动,并重复该过程直到已经检查图像的所选部分。 当图像的特征和由标记投影模型的特定合成标签表示的特征对齐时,归一化标记投影的一阶导数最大。 该方法和装置可以可靠地定位对象的中心,因为使用标注投影模型和直方图可以最大限度地减小图像伪影的*效应。 此外,该方法减少了计算时间,从而提高了性能速度。

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