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公开(公告)号:US20240147736A1
公开(公告)日:2024-05-02
申请号:US17974028
申请日:2022-10-26
Applicant: GlobalFoundries U.S. Inc.
Inventor: Venkatesh P. Gopinath , Alexander Derrickson , Hongru Ren
CPC classification number: H01L27/2445 , H01L23/481 , H01L45/1206 , H01L45/1253 , H01L45/16
Abstract: Structures that include resistive memory elements and methods of forming a structure that includes resistive memory elements. The structure comprises a bipolar junction transistor including a base, a first terminal having a first raised semiconductor layer over the base, and a second terminal having a second raised semiconductor layer over the base. The first raised semiconductor layer is spaced in a lateral direction from the second raised semiconductor layer. The structure further comprises a resistive memory element including a first electrode, a second electrode, and a switching layer between the first electrode and the second electrode. The first electrode of the resistive memory element is coupled to the first terminal of the bipolar junction transistor.
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12.
公开(公告)号:US20230131403A1
公开(公告)日:2023-04-27
申请号:US17452175
申请日:2021-10-25
Applicant: GlobalFoundries U.S. Inc.
Inventor: David C. Pritchard , Hongru Ren , Zhixing Zhao
IPC: H01L29/423 , H01L29/49 , H01L29/66 , H01L29/417 , H01L29/40
Abstract: Embodiments of the disclosure provide an integrated circuit (IC) structure including a gate structure over a semiconductor layer. The gate structure includes a first portion having a first horizontal width, and a second portion laterally adjacent the first portion and having a second horizontal width less than the first horizontal width. A gate contact is on the first portion of the gate structure and is not on the second portion of the gate structure.
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公开(公告)号:US20220285274A1
公开(公告)日:2022-09-08
申请号:US17194565
申请日:2021-03-08
Applicant: GLOBALFOUNDRIES U.S. Inc.
Inventor: Hongru Ren , David Pritchard , Ryan W. Sporer , Manjunatha Prabhu
IPC: H01L23/535 , H01L27/12 , H01L21/74
Abstract: An illustrative device disclosed herein includes a doped well region and a conductive well tap conductively coupled to the doped well region, the conductive well tap including first and second opposing sidewall surfaces. In this example the device also includes a first sidewall spacer that has a first vertical height positioned around the conductive well tap and a second sidewall spacer positioned adjacent the first sidewall spacer along the first and second opposing sidewall surfaces of the conductive well tap, wherein the second sidewall spacer has a second vertical height that is less than the first vertical height.
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