COMPENSATING DEPOSITION NON-UNIFORMITIES IN CIRCUIT ELEMENTS

    公开(公告)号:US20190204753A1

    公开(公告)日:2019-07-04

    申请号:US16325319

    申请日:2017-12-01

    Applicant: Google LLC

    CPC classification number: G03F7/70425 G03F1/36 G03F1/70 G03F1/76

    Abstract: A method of fabricating a circuit element, such as a quantum computing circuit element, including obtaining a lithography mask write file that includes mask information characterizing one or more mask features, obtaining a uniformity function that is configured to modify the mask information to compensate for a non-uniform deposition process, applying the uniformity function to the lithography mask write to obtain a modified lithography mask write file, and performing lithography as directed by the modified lithography mask write file.

    Josephson junctions with reduced stray inductance

    公开(公告)号:US12239027B2

    公开(公告)日:2025-02-25

    申请号:US18117918

    申请日:2023-03-06

    Applicant: Google LLC

    Abstract: Methods, systems and apparatus for forming Josephson junctions with reduced stray inductance. In one aspect, a device includes a substrate; a first superconductor layer on the substrate; an insulator layer on the first superconductor layer; a second superconductor layer on the insulator layer, wherein the first superconductor layer, the insulator layer, and the second superconductor layer form a superconductor tunnel junction; and a third superconductor layer directly on a surface of the first superconductor layer and directly on a surface of the second superconductor layer to provide a first contact to the superconducting tunnel junction and a second contact to the superconductor tunnel junction, respectively.

    REDUCING JUNCTION RESISTANCE VARIATION IN TWO-STEP DEPOSITION PROCESSES

    公开(公告)号:US20220328749A1

    公开(公告)日:2022-10-13

    申请号:US17836893

    申请日:2022-06-09

    Applicant: Google LLC

    Abstract: A method of reducing junction resistance variation for junctions in quantum information processing devices fabricated using two-step deposition processes. In one aspect, a method includes providing a dielectric substrate, forming a first resist layer on the dielectric substrate, forming a second resist layer on the first resist layer, and forming a third resist layer on the second resist layer. The first resist layer includes a first opening extending through a thickness of the first resist layer, the second resist layer includes a second opening aligned over the first opening and extending through a thickness of the second resist layer, and the third resist layer includes a third opening aligned over the second opening and extending through a thickness of the third resist layer.

    Compensating deposition non-uniformities in circuit elements

    公开(公告)号:US11378890B2

    公开(公告)日:2022-07-05

    申请号:US17208391

    申请日:2021-03-22

    Applicant: Google LLC

    Abstract: A method of fabricating a circuit element, such as a quantum computing circuit element, including obtaining a lithography mask write file that includes mask information characterizing one or more mask features, obtaining a uniformity function that is configured to modify the mask information to compensate for a non-uniform deposition process, applying the uniformity function to the lithography mask write to obtain a modified lithography mask write file, and performing lithography as directed by the modified lithography mask write file.

    JOSEPHSON JUNCTIONS WITH REDUCED STRAY INDUCTANCE

    公开(公告)号:US20210336121A1

    公开(公告)日:2021-10-28

    申请号:US16964053

    申请日:2019-07-25

    Applicant: Google LLC

    Abstract: Methods, systems and apparatus for forming Josephson junctions with reduced stray inductance. In one aspect, a device includes a substrate; a first superconductor layer on the substrate; an insulator layer on the first superconductor layer; a second superconductor layer on the insulator layer, wherein the first superconductor layer, the insulator layer, and the second superconductor layer form a superconductor tunnel junction; and a third superconductor layer directly on a surface of the first superconductor layer and directly on a surface of the second superconductor layer to provide a first contact to the superconducting tunnel junction and a second contact to the superconductor tunnel junction, respectively.

    COMPENSATING DEPOSITION NON-UNIFORMITIES IN CIRCUIT ELEMENTS

    公开(公告)号:US20210208509A1

    公开(公告)日:2021-07-08

    申请号:US17208391

    申请日:2021-03-22

    Applicant: Google LLC

    Abstract: A method of fabricating a circuit element, such as a quantum computing circuit element, including obtaining a lithography mask write file that includes mask information characterizing one or more mask features, obtaining a uniformity function that is configured to modify the mask information to compensate for a non-uniform deposition process, applying the uniformity function to the lithography mask write to obtain a modified lithography mask write file, and performing lithography as directed by the modified lithography mask write file.

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