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公开(公告)号:US20190204753A1
公开(公告)日:2019-07-04
申请号:US16325319
申请日:2017-12-01
Applicant: Google LLC
Inventor: Brian James Burkett , Rami Barends
CPC classification number: G03F7/70425 , G03F1/36 , G03F1/70 , G03F1/76
Abstract: A method of fabricating a circuit element, such as a quantum computing circuit element, including obtaining a lithography mask write file that includes mask information characterizing one or more mask features, obtaining a uniformity function that is configured to modify the mask information to compensate for a non-uniform deposition process, applying the uniformity function to the lithography mask write to obtain a modified lithography mask write file, and performing lithography as directed by the modified lithography mask write file.
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公开(公告)号:US12239027B2
公开(公告)日:2025-02-25
申请号:US18117918
申请日:2023-03-06
Applicant: Google LLC
Inventor: Brian James Burkett , Ofer Naaman , Anthony Edward Megrant , Theodore Charles White
Abstract: Methods, systems and apparatus for forming Josephson junctions with reduced stray inductance. In one aspect, a device includes a substrate; a first superconductor layer on the substrate; an insulator layer on the first superconductor layer; a second superconductor layer on the insulator layer, wherein the first superconductor layer, the insulator layer, and the second superconductor layer form a superconductor tunnel junction; and a third superconductor layer directly on a surface of the first superconductor layer and directly on a surface of the second superconductor layer to provide a first contact to the superconducting tunnel junction and a second contact to the superconductor tunnel junction, respectively.
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公开(公告)号:US20240194661A1
公开(公告)日:2024-06-13
申请号:US18080729
申请日:2022-12-13
Applicant: Google LLC
Inventor: Zhimin Jamie Yao , Michael C. Hamilton , Marissa Giustina , Brian James Burkett , Theodore Charles White , Ofer Naaman
CPC classification number: H01L25/50 , H01L24/81 , H01L24/13 , H01L2224/13109 , H01L2224/81815
Abstract: A method includes providing a first chip having a circuit element layer stack, the circuit element layer stack including a plurality of circuit elements distributed across a plurality of layers. The circuit element layer stack has a sacrificial material filling a space between the plurality of circuit elements in the plurality of layers and a coherent device layer disposed on the circuit element layer stack. The method includes removing the sacrificial material.
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公开(公告)号:US20240194532A1
公开(公告)日:2024-06-13
申请号:US18080715
申请日:2022-12-13
Applicant: Google LLC
Inventor: Zhimin Jamie Yao , Michael C. Hamilton , Marissa Giustina , Brian James Burkett , Theodore Charles White , Ofer Naaman
IPC: H01L21/822 , H01L21/02 , H01L21/311 , H01L21/768 , H01L23/00 , H01L25/07
CPC classification number: H01L21/8221 , H01L21/02505 , H01L21/02598 , H01L21/31127 , H01L21/7688 , H01L24/16 , H01L24/29 , H01L25/074 , B82Y10/00
Abstract: A method includes providing a first chip having a circuit element layer stack, the circuit element layer stack including a plurality of circuit elements distributed across a plurality of layers. The circuit element layer stack has a sacrificial material filling a space between the plurality of circuit elements in the plurality of layers and a coherent device layer disposed on the circuit element layer stack. The method includes removing the sacrificial material.
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公开(公告)号:US20220328749A1
公开(公告)日:2022-10-13
申请号:US17836893
申请日:2022-06-09
Applicant: Google LLC
Inventor: Brian James Burkett
Abstract: A method of reducing junction resistance variation for junctions in quantum information processing devices fabricated using two-step deposition processes. In one aspect, a method includes providing a dielectric substrate, forming a first resist layer on the dielectric substrate, forming a second resist layer on the first resist layer, and forming a third resist layer on the second resist layer. The first resist layer includes a first opening extending through a thickness of the first resist layer, the second resist layer includes a second opening aligned over the first opening and extending through a thickness of the second resist layer, and the third resist layer includes a third opening aligned over the second opening and extending through a thickness of the third resist layer.
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公开(公告)号:US11378890B2
公开(公告)日:2022-07-05
申请号:US17208391
申请日:2021-03-22
Applicant: Google LLC
Inventor: Brian James Burkett , Rami Barends
Abstract: A method of fabricating a circuit element, such as a quantum computing circuit element, including obtaining a lithography mask write file that includes mask information characterizing one or more mask features, obtaining a uniformity function that is configured to modify the mask information to compensate for a non-uniform deposition process, applying the uniformity function to the lithography mask write to obtain a modified lithography mask write file, and performing lithography as directed by the modified lithography mask write file.
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公开(公告)号:US20210336121A1
公开(公告)日:2021-10-28
申请号:US16964053
申请日:2019-07-25
Applicant: Google LLC
Inventor: Brian James Burkett , Ofer Naaman , Anthony Edward Megrant , Theodore Charles White
Abstract: Methods, systems and apparatus for forming Josephson junctions with reduced stray inductance. In one aspect, a device includes a substrate; a first superconductor layer on the substrate; an insulator layer on the first superconductor layer; a second superconductor layer on the insulator layer, wherein the first superconductor layer, the insulator layer, and the second superconductor layer form a superconductor tunnel junction; and a third superconductor layer directly on a surface of the first superconductor layer and directly on a surface of the second superconductor layer to provide a first contact to the superconducting tunnel junction and a second contact to the superconductor tunnel junction, respectively.
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公开(公告)号:US20210208509A1
公开(公告)日:2021-07-08
申请号:US17208391
申请日:2021-03-22
Applicant: Google LLC
Inventor: Brian James Burkett , Rami Barends
Abstract: A method of fabricating a circuit element, such as a quantum computing circuit element, including obtaining a lithography mask write file that includes mask information characterizing one or more mask features, obtaining a uniformity function that is configured to modify the mask information to compensate for a non-uniform deposition process, applying the uniformity function to the lithography mask write to obtain a modified lithography mask write file, and performing lithography as directed by the modified lithography mask write file.
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