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公开(公告)号：US20140107961A1
公开(公告)日：2014-04-17
申请号：US13863383
申请日：2013-04-16
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor： Tzung-Te Chen , Chun-Fan Dai , Han-Kuei Fu , Chien-Ping Wang , Pei-Ting Chou
IPC: G01R31/26
CPC classification number: G01R31/2644 , G01R31/001 , G01R31/2603 , G01R31/275
Abstract: A testing method and testing system for a semiconductor element are provided. The method includes following steps. A level of a testing electrostatic discharge (ESD) voltage is determined. A plurality of sample components is provided. The testing ESD voltage is imposed on the sample components for testing ESD decay rates of the sample components. ESD withstand voltages of the sample components are detected. The relation between the ESD withstand voltages and the electrostatic discharge rates are recorded to a database. The testing ESD voltage is imposed on the semiconductor element for testing an ESD decay rate of the semiconductor element. The database is looked up according to the ESD decay rate of the semiconductor element to determine an ESD withstand voltage of the semiconductor element.
Abstract translation: 提供了半导体元件的测试方法和测试系统。 该方法包括以下步骤。 测定静电放电（ESD）电压的电平。 提供多个样品组分。 测试ESD电压施加在样品组件上，用于测试样品组分的ESD衰减率。 检测出样品成分的ESD耐受电压。 将ESD耐受电压和静电放电率之间的关系记录到数据库。 测试ESD电压施加在半导体元件上，用于测试半导体元件的ESD衰减率。 根据半导体元件的ESD衰减率来查找数据库，以确定半导体元件的ESD耐受电压。
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公开(公告)号：US20140015531A1
公开(公告)日：2014-01-16
申请号：US14029803
申请日：2013-09-18
Applicant: Industrial Technology Research Institute
Inventor： Chien-Ping Wang , Tzung-Te Chen , Yen-Liang Liu , Chun-Fan Dai , Han-Kuei Fu , Pei-Ting Chou
IPC: G01R31/26
CPC classification number: G01R31/2635
Abstract: The disclosure discloses a light emitting diode testing apparatus, which includes a power supply module, a probe, a control unit and a data acquisition unit. The power supply module provides a first current or a second current to a testing item. The probe measures characteristics of the testing item. The control unit controls the power supply module to provide the first current or the second current. The data acquisition unit acquires the characteristics of the testing item from the probe. The power supply module includes a first current source, at least one second current source and at least one protector. The first current source provides the first current to the testing item. The at least one second current source provides at least one additional current. The at least one protector prevents the first current from feeding back to the at least one second current source.
Abstract translation: 本发明公开了一种发光二极管测试装置，其包括电源模块，探针，控制单元和数据采集单元。 电源模块向测试项目提供第一电流或第二电流。 探头测量测试项目的特征。 控制单元控制电源模块以提供第一电流或第二电流。 数据采集单元从探头获取测试项目的特性。 电源模块包括第一电流源，至少一个第二电流源和至少一个保护器。 第一个电流源将第一个电流提供给测试项目。 至少一个第二电流源提供至少一个附加电流。 该至少一个保护器防止第一电流反馈到至少一个第二电流源。
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公开(公告)号：US20240198130A1
公开(公告)日：2024-06-20
申请号：US18590982
申请日：2024-02-29
Applicant: Industrial Technology Research Institute
Inventor： Tzung-Te Chen , Wei-Ting Yen , Hsin-Yun Tsai , Shih-Yi Wen , Chia-Fen Hsieh
CPC classification number: A61N5/0622 , A61H23/0236 , H05B47/16 , A61H2201/10 , A61N2005/0663
Abstract: A light source device, including a first light source, providing a first light beam in a first time period of a first period; and a second light source, providing a second light beam in a second time period of the first period, is provided. The first light beam and the second light beam have the same color temperature. The first light beam and the second light beam are emitted alternately in the first period, and a color rendering index of mixed light of the first light beam and the second light beam is greater than or equal to 85.
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公开(公告)号：US20200057339A1
公开(公告)日：2020-02-20
申请号：US16600584
申请日：2019-10-14
Inventor： Tzung-Te Chen , Chia-Fen Hsieh , Tung-Yun Liu , Shih-Yi Wen , Chien-Chun Lu , Hsin-Yun Tsai
IPC: G02F1/1335 , H05B33/08
Abstract: A light source apparatus including a light-emitting module and a control unit is provided. The light-emitting module is configured to provide a light. The control unit is configured to make the light switched between a first light and a second light so that at least one of a blue-light hazard and a circadian stimulus value of the light is changed. A wavelength of a blue light main peak in a spectrum of the first light is different from a wavelength of a blue light main peak in a spectrum of the second light.
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Patent Agency Ranking
公开(公告)号：US10485070B2
公开(公告)日：2019-11-19
申请号：US16018086
申请日：2018-06-26
Applicant: Industrial Technology Research Institute
Inventor： Tzung-Te Chen , Chia-Fen Hsieh , Tung-Yun Liu , Shih-Yi Wen , Chien-Chun Lu , Hsin-Yun Tsai
Abstract: An embodiment of the disclosure provides a light source apparatus including a light-emitting module and a control unit. The light-emitting module is configured to provide a light. The control unit is configured to change proportion of a first sub-light and a second sub-light to form the light so that a circadian action factor (CAF) and a correlated color temperature (CCT) of the light varies along a CAF vs. CCT locus of the light different from a CAF vs. CCT locus of sunlight. A CAF vs. CCT coordinate of one of the first sub-light and the second sub-light is below the CAF vs. CCT locus of sunlight, and a CAF vs. CCT coordinate of the other one of the first sub-light and the second sub-light is above the CAF vs. CCT locus of sunlight. A display apparatus is also provided.
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公开(公告)号：US10271410B1
公开(公告)日：2019-04-23
申请号：US15974673
申请日：2018-05-08
Applicant: Industrial Technology Research Institute
Inventor： Yin-Jie Wang , Tzung-Te Chen , Han-Kuei Fu
IPC: H05B37/02
Abstract: A light controlling method, a light controlling device, and a computer program product are provided. The light controlling method includes: displaying a user controlling interface which includes a plurality of first input parameter fields; receiving a first input parameter input through the first input parameter fields; obtaining a light parameter set corresponding to the first input parameters from a human factor light parameter table; transmitting a wireless signal to control a light according to the light parameter set.
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公开(公告)号：US09970880B2
公开(公告)日：2018-05-15
申请号：US15382748
申请日：2016-12-19
Applicant: Industrial Technology Research Institute
Inventor： Tzung-Te Chen , Hsueh-Hsing Liu , Chun-Wen Chu , Yi-Keng Fu
CPC classification number: G01N21/8422 , G01B11/24 , G01N2021/8427 , H01L22/12
Abstract: An apparatus for measuring a curvature of a thin film includes a light emitting module, a first optical module, a second optical module, a third optical module, and an image analysis module. The light emitting module emits a single laser to be used as an incident light. The incident light is transmitted through a first optical path provided by the first optical module, then the incident light is guided by the second optical module to be incident to the thin film through a second optical path. A reflected light reflected by the thin film is transmitted through the second optical path, then guided by the third optical module to be transmitted along a third optical path. The image analysis module determines the curvature of the thin film according to the characteristic of the reflected light.
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公开(公告)号：US09726713B2
公开(公告)日：2017-08-08
申请号：US13863383
申请日：2013-04-16
Applicant: Industrial Technology Research Institute
Inventor： Tzung-Te Chen , Chun-Fan Dai , Han-Kuei Fu , Chien-Ping Wang , Pei-Ting Chou
CPC classification number: G01R31/2644 , G01R31/001 , G01R31/2603 , G01R31/275
Abstract: A testing method and testing system for a semiconductor element are provided. The method includes following steps. A level of a testing electrostatic discharge (ESD) voltage is determined. A plurality of sample components is provided. The testing ESD voltage is imposed on the sample components for testing ESD decay rates of the sample components. ESD withstand voltages of the sample components are detected. The relation between the ESD withstand voltages and the electrostatic discharge rates are recorded to a database. The testing ESD voltage is imposed on the semiconductor element for testing an ESD decay rate of the semiconductor element. The database is looked up according to the ESD decay rate of the semiconductor element to determine an ESD withstand voltage of the semiconductor element.
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公开(公告)号：US20170111973A1
公开(公告)日：2017-04-20
申请号：US15390701
申请日：2016-12-26
Applicant: Industrial Technology Research Institute
Inventor： Ya-Hui Chiang , Tzung-Te Chen , Chia-Fen Hsieh , Shih-Yi Wen , Han-Kuei Fu
CPC classification number: H05B33/0872 , H05B33/086 , H05B33/0869
Abstract: An illumination system that includes a light source device and an algorithm unit is provided. The light source includes a color temperature adjustable light source. The algorithm unit is coupled to the light source device and outputs a control signal to the light source device according to a reflection spectrum of an object, a visual color matching function, a visual preference correction function, or a combination of the above. The light source device outputs an illumination beam according to the control signal, so as to develop target visual perception of the object while the object is being irradiated by the illumination beam. A method for developing target visual perception of an object is also provided.
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