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    Testing apparatus
    1.
    发明授权
    Testing apparatus 有权
    测试仪器

    公开(公告)号：US09341669B2

    公开(公告)日：2016-05-17

    申请号：US14029803

    申请日：2013-09-18

    Applicant: Industrial Technology Research Institute

    Inventor： Chien-Ping Wang ,  Tzung-Te Chen ,  Yen-Liang Liu ,  Chun-Fan Dai ,  Han-Kuei Fu ,  Pei-Ting Chou

    IPC: G01R31/00 ,  G01R31/26

    CPC classification number: G01R31/2635

    Abstract: The disclosure discloses a light emitting diode testing apparatus, which includes a power supply module, a probe, a control unit and a data acquisition unit. The power supply module provides a first current or a second current to a testing item. The probe measures characteristics of the testing item. The control unit controls the power supply module to provide the first current or the second current. The data acquisition unit acquires the characteristics of the testing item from the probe. The power supply module includes a first current source, at least one second current source and at least one protector. The first current source provides the first current to the testing item. The at least one second current source provides at least one additional current. The at least one protector prevents the first current from feeding back to the at least one second current source.

    Abstract translation: 本发明公开了一种发光二极管测试装置，其包括电源模块，探针，控制单元和数据采集单元。 电源模块向测试项目提供第一电流或第二电流。 探头测量测试项目的特征。 控制单元控制电源模块以提供第一电流或第二电流。 数据采集​​单元从探头获取测试项目的特征。 电源模块包括第一电流源，至少一个第二电流源和至少一个保护器。 第一个电流源将第一个电流提供给测试项目。 至少一个第二电流源提供至少一个附加电流。 该至少一个保护器防止第一电流反馈到至少一个第二电流源。

    LIGHT SOURCE DEVICE AND DISPLAY DEVICE
    2.
    发明申请
    LIGHT SOURCE DEVICE AND DISPLAY DEVICE 有权

    公开(公告)号：US20220406271A1

    公开(公告)日：2022-12-22

    申请号：US17565495

    申请日：2021-12-30

    Applicant: Industrial Technology Research Institute

    Inventor： Tzung-Te Chen ,  Hsin-Yun Tsai ,  Shih-Yi Wen ,  Chia-Fen Hsieh

    IPC: G09G5/02 ,  H04R3/00

    Abstract: A light source device, including a first light source, providing a first light beam in a first time period of a first period; and a second light source, providing a second light beam in a second time period of the first period, is provided. The first light beam and the second light beam have the same color temperature. The first light beam and the second light beam are emitted alternately in the first period, and a color rendering index of mixed light of the first light beam and the second light beam is greater than or equal to 85.

    Thin-film curvature measurement apparatus and method thereof
    5.
    发明授权
    Thin-film curvature measurement apparatus and method thereof 有权
    薄膜曲率测量装置及其方法

    公开(公告)号：US09523572B2

    公开(公告)日：2016-12-20

    申请号：US14583432

    申请日：2014-12-26

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Tzung-Te Chen ,  Chien-Ping Wang ,  Shang-Ping Ying ,  Yi-Keng Fu ,  Hsun-Chih Liu

    IPC: G01B11/25 ,  G01B11/255

    CPC classification number: G01B11/2513 ,  G01B11/255

    Abstract: An apparatus for measuring of a curvature of a thin film, is adapted to measure the curvature of a thin-film. The apparatus includes a light emitting module, a first optical module, a second optical module, a third optical module, an image capture module, and an image analysis module. The light emitting module emits at least one line laser as an incident light whose cross-sectional shape is a geometric picture formed of lines. The incident light is transmitted through a first optical path formed of the first optical module, and is directed to incident the thin film by the second optical module. The reflected light is reflected by the thin film go through the second optical path, and is directed to transmit through the third optical path by the third optical module, and then is captured by the capture module to form a second geometric picture.

    Abstract translation: 用于测量薄膜曲率的装置适于测量薄膜的曲率。 该装置包括发光模块，第一光学模块，第二光学模块，第三光学模块，图像捕获模块和图像分析模块。 发光模块发射至少一条线激光器作为入射光，其入射光的横截面形状是由线形成的几何图形。 入射光通过由第一光学模块形成的第一光路透射，并且被引导通过第二光学模块入射薄膜。 反射光被薄膜反射穿过第二光路，并且被第三光学模块引导通过第三光路传输，然后被捕获模块捕获以形成第二几何图像。

    LIGHT SOURCE APPARATUS AND DISPLAY APPARATUS
    6.
    发明申请
    LIGHT SOURCE APPARATUS AND DISPLAY APPARATUS 审中-公开

    公开(公告)号：US20180317296A1

    公开(公告)日：2018-11-01

    申请号：US16018086

    申请日：2018-06-26

    Applicant: Industrial Technology Research Institute

    Inventor： Tzung-Te Chen ,  Chia-Fen Hsieh ,  Tung-Yun Liu ,  Shih-Yi Wen ,  Chien-Chun Lu ,  Hsin-Yun Tsai

    IPC: H05B33/08

    CPC classification number: H05B33/0863 ,  H05B33/086

    Abstract: An embodiment of the disclosure provides a light source apparatus including a light-emitting module and a control unit. The light-emitting module is configured to provide a light. The control unit is configured to change proportion of a first sub-light and a second sub-light to form the light so that a circadian action factor (CAF) and a correlated color temperature (CCT) of the light varies along a CAF vs. CCT locus of the light different from a CAF vs. CCT locus of sunlight. A CAF vs. CCT coordinate of one of the first sub-light and the second sub-light is below the CAF vs. CCT locus of sunlight, and a CAF vs. CCT coordinate of the other one of the first sub-light and the second sub-light is above the CAF vs. CCT locus of sunlight. A display apparatus is also provided.

    APPARATUS FOR MEASURING A CURVATURE OF A THIN FILM AND THE METHOD THEREOF
    7.
    发明申请
    APPARATUS FOR MEASURING A CURVATURE OF A THIN FILM AND THE METHOD THEREOF 有权

    公开(公告)号：US20180052115A1

    公开(公告)日：2018-02-22

    申请号：US15382748

    申请日：2016-12-19

    Applicant: Industrial Technology Research Institute

    Inventor： Tzung-Te Chen ,  Hsueh-Hsing Liu ,  Chun-Wen Chu ,  Yi-Keng Fu

    IPC: G01N21/84 ,  G01B11/24

    CPC classification number: G01N21/8422 ,  G01B11/24 ,  G01N2021/8427 ,  H01L22/12

    Abstract: An apparatus for measuring a curvature of a thin film includes a light emitting module, a first optical module, a second optical module, a third optical module, and an image analysis module. The light emitting module emits a single laser to be used as an incident light. The incident light is transmitted through a first optical path provided by the first optical module, then the incident light is guided by the second optical module to be incident to the thin film through a second optical path. A reflected light reflected by the thin film is transmitted through the second optical path, then guided by the third optical module to be transmitted along a third optical path. The image analysis module determines the curvature of the thin film according to the characteristic of the reflected light.

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