MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC PROPERTIES AND OPTICAL PROPERTIES

    公开(公告)号:US20240027512A1

    公开(公告)日:2024-01-25

    申请号:US18336939

    申请日:2023-06-16

    CPC classification number: G01R31/2607 G01N21/84

    Abstract: A measuring equipment and a measuring method for measuring electronic properties and optical properties are disclosed. The measuring equipment is used to measure electronic and optical properties. The measuring equipment includes a test socket, a light-emitting element circuit, an optical device, a signal conversion circuit, and a control host. The test socket has measuring probes. The test socket tests the electronic properties of the semiconductor device through the measuring probes. The light-emitting element circuit has a light-emitting element. The optical device measures the optical properties of the light-emitting element. The signal conversion circuit converts the electronic properties to an electronic signal. The control host analyzes and stores the electronic signal and the optical properties.

Patent Agency Ranking