摘要:
Structures of a circuit are identified. Voltages are propagated to the identified structures. Additionally, internal node voltages for the identified structures are obtained. Asymmetrical operating conditions are identified.
摘要:
Structures of a circuit are identified. Voltages are propagated to the identified structures. Additionally, internal node voltages for the identified structures are obtained. Asymmetrical operating conditions are identified.
摘要:
A multiple gate field-effect transistor is built from an overlapping mesh assembly. The assembly comprises a first layer comprising a semiconductor material formed into at least one fin, at least one source, and at least one drain. The first layer comprises a portion of a first mesh, electrically separated from the rest of the mesh. Similarly, a second layer is formed over the first layer and electrically isolated from the first layer, the second layer being electrically conductive and comprising a gate for the at least on fin of the transistor. The second layer comprises a portion of a second mesh offset from the first mesh and overlapping the first mesh, the second layer of the MuGFET device electrically separated from the rest of the second mesh.
摘要:
Shift register for safely providing a configuration bit The invention relates to a shift register cell (1-i, 100-i) for safely providing a configuration bit (6-i) having a master latch (8-i) which can be connected to a serial data input (2-i) on the shift register cell (1-i, 100-i) for the purpose of buffer-storing a data bit (3-i); a first slave latch (10-i) which can be connected to the master latch (8-i) for the purpose of buffer-storing the data bit; at least one second slave latch (12-i) which can be connected to the master latch (8-i) for the purpose of buffer-storing the data bit, and having an evaluation logic unit (13-i) which outputs the configuration bit (6-i) on the basis of the data bits which are buffer-stored in the master latch (8-i) and in the slave latches (10-i, 12-i). In addition, the invention provides a shift register (17) for safely providing configuration bits (6-1, . . . 6-N) which has a plurality of inventive shift register cells (1-1, . . . 1-N, 100-1, . . . 100-N) which are connected in series to form a shift register chain (1, 100).
摘要:
The invention relates to a nonvolatile NOR two-transistor semiconductor memory cell, an associated semiconductor memory device and a method for the fabrication thereof, in which one-transistor memory cells are located in an active region formed in annular fashion and are driven via associated word lines. In this case, the source regions of the one-transistor memory cells are connected via a source line, while the drain regions are connected via corresponding drain lines. A reduced space requirement for the two-transistor semiconductor memory cell is obtained in particular on account of the annular structure of the active regions.
摘要:
A circuit configuration for a programmable nonvolatile memory having memory cells organized in rows and columns, includes a programming circuit which contains a first device for testing purposes that applies a programming current to a first predetermined number of memory cells in parallel for a first predetermined time period. During a second predetermined time period, the device thereupon connects a second predetermined number, which is greater than the first number, in parallel an applies the programming current to them. A method is provided for operating the circuit configuration.
摘要:
One embodiment of the present invention relates to an error tolerant memory circuit having a low hardware overhead that can tolerate both single volatile soft errors and permanent errors. In one embodiment, the method and apparatus comprise a memory circuit having a plurality of memory element pairs, respectively having two memory storage elements configured to store a data unit. One or more parity generation circuits are configured to calculate a first parity bit from data written to the plurality of memory element pairs (e.g., the two memory storage elements) and a second parity bit from data read from one of the two memory storage elements in the plurality of memory element pairs. Based upon the calculated first and second parity bits, the memory circuit chooses to selectively output data from memory storage elements not known to contain an error.
摘要:
A multiple gate field-effect transistor is built from an overlapping mesh assembly. The assembly comprises a first layer comprising a semiconductor material formed into at least one fin, a least one source, and at least one drain. The first layer comprises a portion of a first mesh, electrically separated from the rest of the mesh. Similarly, a second layer is formed over the first layer and electrically isolated from the first layer, the second layer being electrically conductive and comprising a gate for the at least one fin of the transistor. The second layer comprises a portion of a second mesh offset from the first mesh and overlapping the first mesh, the second layer of the MuGFET device electrically separated from the rest of the second mesh.
摘要:
An EEPROM with two-transistor memory cells with source-side selection, and a method for triggering such a EEPROM are described. The EEPROM and the method are distinguished in that the programming voltage required to program a memory cell is delivered via a source line. As a result the EEPROM can be protected in a simple way against unintended loss of the data stored in it.