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11.
公开(公告)号:US20200059239A1
公开(公告)日:2020-02-20
申请号:US16534199
申请日:2019-08-07
Applicant: Microchip Technology Incorporated
Inventor: Neil Deutscher , Bryan Kris
Abstract: An analog to digital converter (ADC) includes voltage inputs, a transconductor configured to convert the voltage inputs into currents, current-controlled oscillators, a counter, and digital logic. The current-controlled oscillators propagate respect currents from the transconductor. The counter is configured to count repeated traversal of one or more oscillators. The digital logic is configured to, based upon results from the counter, provide a code configured to indicate a value of associated voltage input.
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公开(公告)号:US09923570B2
公开(公告)日:2018-03-20
申请号:US15485020
申请日:2017-04-11
Applicant: Microchip Technology Incorporated
Inventor: Bryan Kris , Neil Deutscher , Thomas S. Spohrer
CPC classification number: H03M1/34 , H03K5/131 , H03K5/14 , H03K2005/00058 , H03M1/007 , H03M1/1009 , H03M1/1028 , H03M1/1057 , H03M1/1071 , H03M1/18 , H03M1/38 , H03M1/502
Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.
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公开(公告)号:US20170294921A1
公开(公告)日:2017-10-12
申请号:US15485020
申请日:2017-04-11
Applicant: Microchip Technology Incorporated
Inventor: Bryan Kris , Neil Deutscher , Tom Spohrer
CPC classification number: H03M1/34 , H03K5/131 , H03K5/14 , H03K2005/00058 , H03M1/007 , H03M1/1009 , H03M1/1028 , H03M1/1057 , H03M1/1071 , H03M1/18 , H03M1/38 , H03M1/502
Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.
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