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    MEDICAL DEVICE DATA ANALYSIS
    11.
    发明公开
    MEDICAL DEVICE DATA ANALYSIS 审中-公开

    公开(公告)号：US20240363241A1

    公开(公告)日：2024-10-31

    申请号：US18764929

    申请日：2024-07-05

    Applicant: Micron Technology, Inc.

    Inventor： Gitanjali T. Ghosh ,  Irene K. Thompson ,  Jessica M. Maderos ,  Hongmei Wang ,  Fatma Arzum Simsek-Ege ,  Kathryn H. Russo

    IPC: G16H40/67 ,  G16H10/60 ,  G16H40/63 ,  G16H80/00

    CPC classification number: G16H40/67 ,  G16H10/60 ,  G16H40/63 ,  G16H80/00

    Abstract: Systems, apparatuses, and methods related to medical device data analysis are described. In some examples, a medical device is implanted in a user of the medical device and the data generated by the medical device is not easily accessible to the user. In an example, a controller can be configured to receive, by a mobile device coupled to a medical device, data from the medical device, where the data is a part of a baseline dataset related to the medical device. The controller can be configured to receive different data from the medical device, where the different data is received from the medical device as the different data is generated by the medical device, analyze the data from the medical device and the different data generated by the medical device, and perform an action based on the analyzed data and the different data generated by the medical device.

    INVENTORY MANAGEMENT
    12.
    发明公开
    INVENTORY MANAGEMENT 审中-公开

    公开(公告)号：US20230410040A1

    公开(公告)日：2023-12-21

    申请号：US18242915

    申请日：2023-09-06

    Applicant: Micron Technology, Inc.

    Inventor： Fatma Arzum Simsek-Ege ,  Gitanjali T. Ghosh ,  Yixin Yan ,  Rosa M. Avila-Hernandez

    IPC: G06Q10/087 ,  G06N20/00

    CPC classification number: G06Q10/087 ,  G06N20/00

    Abstract: Methods, apparatuses, and systems associated with inventory management are described. Examples can include receiving at a processor first signaling from a first sensor device configured to monitor the interior of a first enclosure and receiving at the processor second signaling from a second sensor device configured to monitor the interior of a second enclosure. Examples can include writing from the processor to a storage device coupled to the processor data that is based at least in part on a combination of the first and second signaling, identifying a quantity or amount of at least one item in the first enclosure and at least one item in the second enclosure, and transmitting third signaling when the quantity or amount of the at least one item in the first enclosure or the at least one item in the second enclosure is less than a threshold value.

    SEMICONDUCTOR DEVICE WITH WORD LINE DEGRADATION MONITOR AND ASSOCIATED METHODS AND SYSTEMS
    14.
    发明申请
    SEMICONDUCTOR DEVICE WITH WORD LINE DEGRADATION MONITOR AND ASSOCIATED METHODS AND SYSTEMS 有权

    公开(公告)号：US20220172768A1

    公开(公告)日：2022-06-02

    申请号：US17672537

    申请日：2022-02-15

    Applicant: Micron Technology, Inc.

    Inventor： Gitanjali T. Ghosh ,  Debra M. Bell ,  Arunmozhi R. Subramaniam ,  Roya Baghi ,  Deepika Thumsi Umesh ,  Sue-Fern Ng

    IPC: G11C11/408 ,  G11C11/4099 ,  G11C11/4076 ,  G11C11/4074

    Abstract: Memory devices, systems including memory devices, and methods of operating memory devices are described, in which memory devices are configured to monitor degradations in word line characteristics. The memory device may generate a reference signal in response to an access command directed to a memory array including a plurality of word lines, in some embodiments. The memory array may include a victim word line configured to accumulate adverse effects of executing multiple access commands at the word lines of the memory array. When the degradation in the word line characteristics causes reliability issues (e.g., corrupted data), the memory array is deemed unreliable, and may be blocked from memory operations. The memory device may compare the reference signal and a signal from the victim word line to determine whether preventive measures may be appropriate to avoid (or mitigate) such reliability issues.

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