摘要:
An inchworm type driving mechanism usable as a fine positioning device is disclosed. The mechanism includes at least two clamps for clamping a movable member, and an expansible/contractable device for driving the movable member. Each clamp includes a plurality of levers each having a pivot provided by a resilient hinge and an electrostrictive device disposed between end portions of the levers. Through the actuation of the electrostrictive device, the other end portions of the levers sandwich the opposite sides of the movable member to clamp the same. In one preferred form, each clamp is supported by a support, with low rigidity in the clamping direction, but with high rigidity in a direction perpendicular to the clamping direction. Thus, undesirable deformation or distortion of the movable member can be avoided and, therefore, high-precision positioning of the movable member is assured.
摘要:
A sheet holding apparatus having: a feeding mechanism to feed a sheet on which an image is formed by an image forming apparatus, from a predetermined feeding position; a tray section having a tray to contain the sheet fed through the feeding mechanism; an initialization mechanism to initialize the tray section; and a control section to make a determination about necessity or unnecessity of an initialization of the tray section and/or a content of the initialization on the basis of information about a position of the tray, which is notified from the image forming apparatus, and to control the initialization of the tray section through the initialization mechanism according to the determination.
摘要:
Disclosed is an optical system having a plurality of optical elements, for use in an optical instrument or a projection exposure apparatus, arranged to maintain a best optical performance by controlling a relative position of the plurality of optical elements. The optical system includes a reference mirror, a first measuring system for measuring a relative position, with respect to the reference mirror, of a first optical element among the plurality of optical elements and/or a first target mirror disposed so that a relative position thereof with respect to the first optical element is kept substantially unchanged, and a second measuring system for measuring a relative position, with respect to the reference mirror, of a second optical element among the plurality of optical elements and/or a second target mirror disposed so that a relative position thereof with respect to the second optical element is kept substantially unchanged. At least one of the first and second optical elements is moved on the basis of the measurement so that a relative positional relationship between the first and second optical elements is placed in predetermined positional relationship.
摘要:
A shape measuring apparatus of this invention includes a light source for generating light beams including two different frequency components, a first optical system for extracting a reference signal from the light beams including the two frequency components, a second optical system for reflecting one of the light beams including the two frequency components by a reference surface, reflecting the other light beam by a measuring region of a surface to be measured, and causing the two reflected light beams to interfere with each other, a photodetector having a plurality of photodetecting elements to detect the interference light beam from the optical system, a housing for holding at least a part of the optical system and the photodetector, an actuator for changing a relative position of the housing and the surface to be measured, and a length measuring device for detecting position information of the housing. An element corresponding to a light beam vertically reflected by the surface to be measured is selected from the photodetector. A measured signal is detected by adding output signals from the selected element and neighboring elements thereof. A distance between the housing and the surface to be measured is controlled in an optical axis direction such that a phase difference between the reference signal and the measured signal is held constant. A shape of the surface to be measured is measured from position information of the housing when the relative position of the housing and the surface to be measured is changed in a direction perpendicular to the optical axis.
摘要:
An interferometer which can vary a direction of an incident beam and which enables more accurate measurement while avoiding eclipse includes an optical system adapted to form an interference beam from a beam from a surface to be measured, and a detected position varying member for varying a position to be detected of the interference beam in accordance with information on inclination of the surface to be measured.
摘要:
Disclosed is a stage device suitably usable in a semiconductor microcircuit device manufacturing exposure apparatus for printing a pattern of a mask on a semiconductor wafer, for supporting and positioning the wafer with respect to plurality of directions. The device includes two plate members coupled to each other with a predetermined distance maintained therebetween. Each plate member has formed therein X, Y and .theta. stages defined by plural cutout grooves. Each stage is resiliently supported by a leaf spring functioning portion formed in the plate member. A Z stage for displacing the wafer in the Z direction is mounted to an outer circumferential part of one plate member, and a measuring mirror operable in combination with a laser interferometer is provided as a unit with the Z stage. Any motion of each stage can be controlled on the basis of the measurement made by using this mirror. The structure of the stage device ensures high precision and high rigidity and, therefore, the Z axis can be set substantially horizontally. Consequently the stage device is suitably applicable to an exposure apparatus to be used with an SOR ring.
摘要:
A stage device usable, e.g., in an X-ray exposure apparatus, for moving a semiconductor wafer placed in a vacuum ambience and held by a wafer chuck, is disclosed. In the stage device, the wafer chuck holds the wafer so that the surface of the wafer onto which a circuit pattern is to be transferred is placed in a vertical plane, and the wafer chuck is moved vertically and horizontally for step-and-repeat exposure of the wafer. The device includes a guide mechanism, locking mechanism and a constant-tension spring mechanism, to thereby ensure high-accuracy movement of the wafer chuck in the vertical direction as well as high-precision positioning of the wafer. Further, in the stage device, a drive source producing a drive to move the wafer chuck is disposed in a vacuum ambience while, on the other hand, the supply of operating fluids to air bearing assemblies, for guiding the movement of the wafer chuck, is achieved by use of metal pipes coupled by rotary joints. The wafer chuck is resiliently supported by one of the air bearing assemblies, such that the wafer chuck can be moved in the vacuum ambience very accurately and without difficulties.
摘要:
An image forming apparatus that sets an output unit configured by a plurality of pages of which the order is determined as one copy and outputs the a plurality of copies of output units as a JOB includes an image forming unit that sequentially forms images corresponding to the plurality of pages on a plurality of sheets, a control unit that performs a calculation process of image eigenvalues based on the images for each of output units, a first storage unit storing a result of the calculation process performed for a reference copy of the output unit that is a specific one copy out of the plurality of copies of the output units, and a second storage unit storing a result of the calculation process performed for a copy of the output unit other than the reference copy out of the plurality of copies of the output units.
摘要:
There is provided a shape measuring apparatus using an interferometer comprising a lens for condensing temporarily light waves from a light source, and a light wave shaping plate having a pinhole with suitable size adapted to convert the condensed light waves into an ideal spherical wave and a window provided in the vicinity of the pinhole and having enough size to pass therethrough light wave surface information, in which at least one lens having a reference surface and a surface to be measured the optical axes of which are slightly decentered in an optical path of the light waves passed through the pinhole is arranged in a position where the light waves which are made incident perpendicularly to the reference surface to be reflected therefrom pass through the pinhole again, and the light reflected from the surface to be measured pass through the window, and the reflected light reflected by the reference surface to pass through the pinhole again and the reflected light reflected by the surface to be measured to pass through the window are made to interfere with each other to measure a shape of the surface to be measured.
摘要:
An apparatus for finishing sheets is provided with a sheet conveyor to convey a sheet in a predetermined sheet conveyance direction on a sheet conveyance path; and a stapling device to conduct an edge stapling processing to put staple pins into an edge portion of sheets and a center stapling processing to put staple pins at a central portion of sheets, the stapling device having a plurality of staplers arranged in a direction perpendicular to the sheet conveyance direction, each of the plurality of staplers constructed in a two-divided piece structure including a driving mechanism provided one side of the sheet conveyance passage so as to put the staple pins into the sheets and a receiving mechanism provided the other side of the sheet conveyance passage so as to clinch the staple pins, and at least one of the plurality of staplers movable in a direction perpendicular to the sheet conveyance direction.