Method and device for active wedge error compensation between two objects that can be positioned substantially to parallel to each other
    12.
    发明授权
    Method and device for active wedge error compensation between two objects that can be positioned substantially to parallel to each other 有权
    两个物体之间主动楔形误差补偿的方法和装置可以基本上相互平行

    公开(公告)号:US09329473B2

    公开(公告)日:2016-05-03

    申请号:US13261204

    申请日:2011-02-14

    摘要: The invention relates to a method and device for expanding the travel or control displacement of linear actuators that is available during an imprinting or embossing stroke. The wedge error compensating head (2) comprises a movable part (4), a stationary part (3) and at least three linear actuators (8). Each linear actuator (8) is connected to one of the parts (3, 4) at one end and to the other of the two parts (4, 3) by wedges (9) at the other end. By means of the wedges (9), it is possible to coarsely or roughly compensate for wedge errors and possible tolerances of individual subcomponents of the system. The linear actuators (8) are only used for fine or precision compensation for the wedge error. In this way, sufficient control displacement is available for the imprinting stroke with the linear actuators.

    摘要翻译: 本发明涉及一种用于扩展在压印或压花冲程期间可用的线性致动器的行进或控制位移的方法和装置。 楔形误差补偿头(2)包括可移动部分(4),固定部分(3)和至少三个线性致动器(8)。 每个线性致动器(8)在另一端通过楔(9)在一端连接到部分(3,4)中的一个并且两个部分(4,3)中的另一个连接到另一端。 通过楔形(9),可以粗略地或粗略地补偿系统的各个子部件的楔形误差和可能的公差。 线性执行器(8)仅用于精确或精确补偿楔形误差。 以这种方式,足够的控制位移可用于具有线性致动器的压印行程。

    Method and system for assessing the state of at least one axial joint
    14.
    发明申请
    Method and system for assessing the state of at least one axial joint 有权
    评估至少一个轴向关节状态的方法和系统

    公开(公告)号:US20050278067A1

    公开(公告)日:2005-12-15

    申请号:US11153041

    申请日:2005-06-15

    IPC分类号: B25J9/16 G06F19/00

    CPC分类号: B25J9/1641

    摘要: A method assesses a state of at least one axial joint of an industrial robot, on the basis of data of a mechanical backlash present at the axial joint of the industrial robot, a state of wear of the axial joint being determined. On the basis of data of a torque profile, a first loading state of the axial joint is determined at the axial joint during at a first working cycle of the industrial robot. On a basis of data of a movement sequence at the axial joint during a second working cycle of the industrial robot, a second loading state of the axial joint is determined. An assessment of the state is carried out by pre-assessing the state of wear, the first loading state and the second loading state and a subsequent comparison with an empirically obtained comparison value matrix.

    摘要翻译: 一种方法基于工业机器人轴向接合处存在的机械齿隙的数据,确定轴向接头的磨损状态来评估工业机器人的至少一个轴向接头的状态。 基于扭矩分布的数据,在工业机器人的第一工作循环期间,在轴向接合处确定轴向接头的第一加载状态。 基于在工业机器人的第二工作循环期间的轴向关节处的运动顺序的数据,确定轴向关节的第二加载状态。 通过预先评估磨损状态,第一加载状态和第二加载状态以及随后与经验获得的比较值矩阵的比较来进行状态评估。

    Method and system for appraising the wear of axles of a robot arm
    17.
    发明授权
    Method and system for appraising the wear of axles of a robot arm 失效
    评估机器人手臂的磨损的方法和系统

    公开(公告)号:US07643946B2

    公开(公告)日:2010-01-05

    申请号:US11153069

    申请日:2005-06-15

    CPC分类号: B25J9/1641 G05B2219/50197

    摘要: A method determines the wear of axles of a robot arm of an industrial robot. A torque profile of at least one axle taken during at least one working cycle of the industrial robot is used as a basis for an analysis. The torque profile is analyzed for portions of the torque profile that exceed a previously fixed torque band, and current axial wear is determined by assessing the frequency and/or the curve profile of the portions of the torque profile. A system is provided for determining the wear.

    摘要翻译: 一种方法确定工业机器人的机器人手臂的轴的磨损。 在工业机器人的至少一个工作循环期间所采用的至少一个轴的扭矩分布被用作分析的基础。 分析扭矩分布,其扭矩分布的部分超过预先固定的扭矩带,并且通过评估扭矩分布的部分的频率和/或曲线轮廓来确定当前的轴向磨损。 提供了一种用于确定磨损的系统。

    Center determination of rotationally symmetrical alignment marks
    18.
    发明授权
    Center determination of rotationally symmetrical alignment marks 有权
    旋转对称对准标记的中心确定

    公开(公告)号:US07567699B2

    公开(公告)日:2009-07-28

    申请号:US11176961

    申请日:2005-07-07

    申请人: Sven Hansen

    发明人: Sven Hansen

    IPC分类号: G06K9/00 G06K9/36 G01B11/02

    摘要: The invention provides a method for determining the center of a rotationally symmetrical alignment mark thereby using an image recognition software. The alignment mark is recognized by the image recognition software in different orientations by rotating the alignment mark around a symmetry angle with respect to which the alignment mark is rotationally symmetrical, and respective reference points are determined. The center of rotation of the determined reference points corresponds to the center of the alignment mark. Moreover, the invention provides a method for aligning two flat substrates each having a rotationally symmetrical alignment mark and being arranged substantially parallel with respect to each other. To this end, the centers of the alignment marks of the two substrates are determined by means of the method for determining the centers according to the present invention, and the two substrates are aligned by moving at least one of the two substrates in parallel so that the positions of the centers of the alignment marks coincide.

    摘要翻译: 本发明提供了一种用于确定旋转对称对准标记的中心的方法,从而使用图像识别软件。 通过使对准标记围绕相对于对准标记旋转对称的对称角旋转对准标记,通过图像识别软件以不同的方向识别对准标记,并且确定各个参考点。 所确定的参考点的旋转中心对应于对准标记的中心。 此外,本发明提供了一种用于对准两个平面基板的方法,每个平面基板具有旋转对称的对准标记并且被布置为基本上彼此平行。 为此,通过根据本发明的用于确定中心的方法来确定两个基板的对准标记的中心,并且通过平行移动两个基板中的至少一个来对准两个基板,使得 对准标记的中心的位置重合。

    Method and device for adjusting an alignment microscope by means of a reflective alignment mask
    20.
    发明申请
    Method and device for adjusting an alignment microscope by means of a reflective alignment mask 审中-公开
    用于通过反射对准掩模调整对准显微镜的方法和装置

    公开(公告)号:US20060199085A1

    公开(公告)日:2006-09-07

    申请号:US11417085

    申请日:2006-05-03

    申请人: Sven Hansen

    发明人: Sven Hansen

    IPC分类号: G03F1/00

    摘要: The present invention provides for a method for adjusting an alignment microscope. In the method of the present invention an alignment mask is used in which the one side comprises at least one alignment mark and the other side is reflective. For the adjustment, the microscope is first focused to the alignment mark and then refocused to the mirror image of the alignment mark generated by the reflective side. The microscope is then adjusted by comparing the positions of the alignment mark and the generated mirror image of the alignment mark until the alignment mark overlaps its mirror image. Moreover, a device for adjusting an alignment microscope in accordance with the method of the present invention.

    摘要翻译: 本发明提供一种用于调整对准显微镜的方法。 在本发明的方法中,使用对准掩模,其中一侧包括至少一个对准标记,另一侧包含反射性。 为了进行调整,首先将显微镜聚焦到对准标记上,然后重新聚焦到由反射面产生的对准标记的镜像。 然后通过比较对准标记的位置和对准标记的生成的镜像的位置直到对准标记与其镜像重叠,来调整显微镜。 而且,根据本发明的方法调整对准显微镜的装置。