Abstract:
A method of implementing dynamic ground sharing in an image sensor with pipeline architecture starts with a pixel array capturing image data. Pixel array includes pixels to generate pixel data signals, respectively. A readout circuitry acquires the image data from a row in the pixel array. An analog-to-digital conversion (ADC) circuitry included in the readout circuitry samples the image data from the row to obtain sampled input data. When the ADC circuitry is sampling, a ground sharing switch is closed to couple the pixel array and the ADC circuitry to a common ground. When the ADC circuitry is not sampling, the ground sharing switch is open to separate the pixel array and the ADC circuitry from the common ground. The ADC circuitry converts the sampled image data from analog to digital to obtain an ADC output. Other embodiments are described.
Abstract:
A programmable current source for use with a time of flight pixel cell includes a first transistor. A current through the first transistor is responsive to a gate-source voltage of the first transistor. A current control circuit is coupled to the first transistor and coupled to a reference current source to selectively couple a reference current of the reference current source through the first transistor during a sample operation. A sample and hold circuit is coupled to the first transistor to sample a gate-source voltage of the first transistor during the sample operation. The sample and hold circuit is coupled to hold the gate-source voltage during a hold operation after the sample operation substantially equal to the gate-source voltage during the sample operation. A hold current through the first transistor during the hold operation is substantially equal to the reference current.
Abstract:
An integrated circuit chip includes CMOS integrated circuit cells arranged in a semiconductor layer, each including first and second active regions, having first and second polarities, respectively. A first power rail is routed along boundaries of the CMOS integrated circuit cells proximate to the first active regions. A second power rail is routed over second active regions. Global routing channels are routed over the second active regions such that the second power rail is disposed between the global routing channels and the first power rail. The global routing channels are coupled between the CMOS integrated circuit cells to couple the CMOS integrated circuit cells together globally in the integrated circuit chip.
Abstract:
An imaging system includes an image sensor and a row-period compensator. The image sensor includes an array of photosensitive pixels and electrical circuitry for controlling the array of photosensitive pixels and for reading accumulated electrical charge therefrom. The electrical circuitry is at least partially powered from a positive power rail and a negative power rail. The row-period compensator is for compensating for a change in current drawn by the electrical circuitry during at least part of a row-period of the image sensor, and the row-period compensator is electrically coupled between the positive and negative power rails. A method for compensating for a change in current drawn by electrical circuitry of an image sensor includes controlling a magnitude of compensation current drawn by a row-period compensator, to compensate for a change in current drawn by the electrical circuitry of the image sensor.
Abstract:
A programmable current source for use with a time of flight pixel cell includes a first transistor. A current through the first transistor is responsive to a gate-source voltage of the first transistor. A current control circuit is coupled to the first transistor and coupled to a reference current source to selectively couple a reference current of the reference current source through the first transistor during a sample operation. A sample and hold circuit is coupled to the first transistor to sample a gate-source voltage of the first transistor during the sample operation. The sample and hold circuit is coupled to hold the gate-source voltage during a hold operation after the sample operation substantially equal to the gate-source voltage during the sample operation. A hold current through the first transistor during the hold operation is substantially equal to the reference current.
Abstract:
An imaging system includes an image sensor and a row-period compensator. The image sensor includes an array of photosensitive pixels and electrical circuitry for controlling the array of photosensitive pixels and for reading accumulated electrical charge therefrom. The electrical circuitry is at least partially powered from a positive power rail and a negative power rail. The row-period compensator is for compensating for a change in current drawn by the electrical circuitry during at least part of a row-period of the image sensor, and the row-period compensator is electrically coupled between the positive and negative power rails. A method for compensating for a change in current drawn by electrical circuitry of an image sensor includes controlling a magnitude of compensation current drawn by a row-period compensator, to compensate for a change in current drawn by the electrical circuitry of the image sensor.
Abstract:
A time of flight pixel cell includes a photosensor to sense photons reflected from an object. Pixel support circuitry including charging control logic is coupled to the photosensor to detect when the photosensor senses the photons reflected from the object, and coupled to receive timing signals representative of when light pulses are emitted from a light source. A controllable current source is coupled to receive a time of flight signal form the charging control logic to provide a charge current when a light pulse emitted from the light source until the photosensor senses a respective one of the photons reflected from the object. A capacitor is coupled to receive the charge current, and a voltage on the capacitor is representative of a round trip distance to the object. A reset circuit is coupled to reset the voltage on the capacitor after being charged a plurality number of times.
Abstract:
A pixel cell includes a latch having an input terminal and an output terminal. The latch is coupled to provide a latched output signal at the output terminal responsive to the input terminal. A first precharge circuit is coupled to precharge the input terminal of the latch to a first level during a reset of the pixel cell. A single photon avalanche photodiode (SPAD) is coupled to provide a SPAD signal to the input terminal of the latch in response to a detection of a photon incident on the SPAD.
Abstract:
A pixel cell includes a latch having an input terminal and an output terminal. The latch is coupled to provide a latched output signal at the output terminal responsive to the input terminal. A first precharge circuit is coupled to precharge the input terminal of the latch to a first level during a reset of the pixel cell. A single photon avalanche photodiode (SPAD) is coupled to provide a SPAD signal to the input terminal of the latch in response to a detection of a photon incident on the SPAD.
Abstract:
A time of flight pixel cell includes a photosensor to sense photons reflected from an object. Pixel support circuitry including charging control logic is coupled to the photosensor to detect when the photosensor senses the photons reflected from the object, and coupled to receive timing signals representative of when light pulses are emitted from a light source. A controllable current source is coupled to receive a time of flight signal form the charging control logic to provide a charge current when a light pulse emitted from the light source until the photosensor senses a respective one of the photons reflected from the object. A capacitor is coupled to receive the charge current, and a voltage on the capacitor is representative of a round trip distance to the object. A reset circuit is coupled to reset the voltage on the capacitor after being charged a plurality number of times.