CONTENT RECOMMENDATION USING THIRD PARTY PROFILES
    12.
    发明申请
    CONTENT RECOMMENDATION USING THIRD PARTY PROFILES 有权
    使用第三方配置文件的内容建议

    公开(公告)号:US20130066973A1

    公开(公告)日:2013-03-14

    申请号:US13614816

    申请日:2012-09-13

    IPC分类号: G06F15/16

    摘要: A method includes identifying one or more features of a short term profile of a user that are not included in a long term profile of the user, using the one or more features to identify one or more third party profiles having features that substantially match the one or more features of the user's short term profile, accessing the identified one or more third party profiles, and providing one or more content items included in the third party profile to the user, the one or more content items having associated features that match the one or more features of the short term profile. An alternative method includes accessing one or more third party profiles that are not a profile of the user, and using the accessed third party profile to identify a plurality of content items for recommendation based on a feature set of the third party profile.

    摘要翻译: 一种方法包括使用一个或多个特征来识别不包括在用户的长期简档中的用户的短期简档的一个或多个特征,以识别具有基本上匹配于该特征的特征的一个或多个第三方简档 或更多的特征,用户的短期简档,访问所识别的一个或多个第三方简档,以及向所述用户提供包括在所述第三方简档中的一个或多个内容项,所述一个或多个内容项具有与所述一个 或更多的短期特征。 替代方法包括访问不是用户的简档的一个或多个第三方简档,并且使用所访问的第三方简档来基于第三方简档的特征集来标识用于推荐的多个内容项。

    Method of operating integrated circuit embedded with non-volatile one-time-programmable and multiple-time programmable memory
    15.
    发明授权
    Method of operating integrated circuit embedded with non-volatile one-time-programmable and multiple-time programmable memory 有权
    嵌入非易失性一次可编程和多时间可编程存储器的集成电路操作方法

    公开(公告)号:US07787309B2

    公开(公告)日:2010-08-31

    申请号:US12264076

    申请日:2008-11-03

    申请人: David Liu

    发明人: David Liu

    IPC分类号: G11C11/34

    摘要: A programmable non-volatile device is operated using a floating gate that functions as a FET gate that overlaps a portion of a source/drain region. This allows a programming voltage for the device to be imparted to the floating gate through capacitive coupling, thus changing the state of the device. The invention can be used in environments such as data encryption, reference trimming, manufacturing ID, security ID, and many other applications.

    摘要翻译: 使用浮动栅极操作可编程非易失性器件,该浮栅用作与源极/漏极区域的一部分重叠的FET栅极。 这允许通过电容耦合将器件的编程电压赋予浮置栅极,从而改变器件的状态。 本发明可以用于诸如数据加密,参考修整,制造ID,安全ID等许多应用的环境中。

    Snow brush
    16.
    外观设计

    公开(公告)号:USD562006S1

    公开(公告)日:2008-02-19

    申请号:US29282337

    申请日:2007-07-17

    申请人: David Liu

    设计人: David Liu

    System and method for detecting wafer failure in wet bench applications
    17.
    发明申请
    System and method for detecting wafer failure in wet bench applications 审中-公开
    用于检测湿式台架应用中的晶圆故障的系统和方法

    公开(公告)号:US20070177788A1

    公开(公告)日:2007-08-02

    申请号:US11344032

    申请日:2006-01-31

    申请人: David Liu

    发明人: David Liu

    IPC分类号: G06K9/00

    CPC分类号: G06T7/001 G06T2207/30148

    摘要: A system is disclosed for detecting the presence of a broken or mis-positioned wafer during bench processing of the wafers. In one embodiment, a charge-coupled device (CCD) is provided above a wet bench bath, and is positioned to record an image of the bath and its contents. The CCD is connected to processing software that compares the image with a stored image of the bath. Based on the image comparison, the system can provide either a “go” indication, where the images are deemed substantially the same, or an “error” indication, where the images are deemed substantially different thus indicating the presence of broken wafer pieces in the bath. In a second embodiment, the CCD may be positioned to record an image of a plurality of wafers carried on a cassette-less wafer lifter held above the bath. Again, the CCD may be connected to processing software that compares the image with a stored image of the plurality of wafers on the lifter. Based on the image comparison, the system can provide a “go” indication if the images are substantially the same, or an “error” indication if the images are substantially different—indicating the presence of a broken or mis-positioned wafer on the wafer lifter. A method of using the system is also disclosed.

    摘要翻译: 公开了一种用于在晶片的台阶处理期间检测是否存在断裂或错位的晶片的系统。 在一个实施例中,电荷耦合器件(CCD)设置在湿台面上方,并且被定位成记录浴液及其内容物的图像。 CCD连接到处理软件,将图像与储存的沐浴图像进行比较。 基于图像比较,系统可以提供“去”指示,其中图像被认为基本相同,或者“误差”指示,其中图像被认为基本不同,从而指示在 浴。 在第二实施例中,CCD可以定位成记录保持在浴上方的无盒式晶片升降器上承载的多个晶片的图像。 再次,CCD可以连接到将图像与升降器上的多个晶片的存储图像进行比较的处理软件。 基于图像比较,如果图像基本相同,则系统可以提供“去”指示,或者如果图像基本上不同,则可以提供“错误”指示 - 指示在晶片上存在断裂或错误定位的晶片 升降机。 还公开了一种使用该系统的方法。

    Vascular disease therapies
    19.
    发明申请
    Vascular disease therapies 审中-公开
    血管疾病治疗

    公开(公告)号:US20060281668A1

    公开(公告)日:2006-12-14

    申请号:US11418787

    申请日:2006-05-05

    IPC分类号: A61K38/17

    CPC分类号: C07K16/22 A61K2039/505

    摘要: The present invention relates to methods and agents for treating impaired vascular and cardiac function. Methods and agents for treating various physiological and pathological features associated with vascular dysfunction and cardiac dysfunction are also provided.

    摘要翻译: 本发明涉及治疗血管和心脏功能受损的方法和试剂。 还提供了用于治疗与血管功能障碍和心脏功能障碍相关的各种生理和病理特征的方法和试剂。

    Cardiovascular disease therapies
    20.
    发明申请
    Cardiovascular disease therapies 有权
    心血管疾病治疗

    公开(公告)号:US20060281667A1

    公开(公告)日:2006-12-14

    申请号:US11418624

    申请日:2006-05-05

    IPC分类号: A61K38/17

    CPC分类号: C07K16/22 A61K2039/505

    摘要: The present invention relates to methods and agents for treating impaired vascular and cardiac function. Methods and agents for treating various physiological and pathological features associated with vascular dysfunction and cardiac dysfunction are also provided.

    摘要翻译: 本发明涉及治疗血管和心脏功能受损的方法和试剂。 还提供了用于治疗与血管功能障碍和心脏功能障碍相关的各种生理和病理特征的方法和试剂。