Error Correction In A Memory Device
    11.
    发明申请
    Error Correction In A Memory Device 有权
    存储器件中的错误校正

    公开(公告)号:US20150234707A1

    公开(公告)日:2015-08-20

    申请号:US14692092

    申请日:2015-04-21

    Applicant: Rambus Inc.

    Abstract: A dynamic random access memory (DRAM) array is configured for selective repair and error correction of a subset of the array. Error-correcting code (ECC) is provided to a selected subset of the array to protect a row or partial row of memory cells where one or more weak memory cells are detected. By adding a sense amplifier stripe to the edge of the memory array, the adjacent edge segment of the array is employed to store ECC information associated with the protected subsets of the array. Bit replacement is also applied to defective memory cells. By implementing ECC selectively rather than to the entire array, integrity of the memory array is maintained at minimal cost to the array in terms of area and energy consumption.

    Abstract translation: 动态随机存取存储器(DRAM)阵列被配置用于阵列的子集的选择性修复和纠错。 将纠错码(ECC)提供给阵列的选定子集,以保护检测到一个或多个弱存储器单元的行或部分行的存储单元。 通过向存储器阵列的边缘添加感测放大器条纹,阵列的相邻边缘段用于存储与阵列的受保护子集相关联的ECC信息。 位更换也适用于有缺陷的存储单元。 通过有选择地执行ECC而不是整个阵列,在面积和能量消耗方面,以阵列的最低成本保持存储器阵列的完整性。

    Error correction in a memory device
    12.
    发明授权
    Error correction in a memory device 有权
    存储器件中的错误校正

    公开(公告)号:US09037949B1

    公开(公告)日:2015-05-19

    申请号:US13846200

    申请日:2013-03-18

    Applicant: Rambus Inc.

    Abstract: A dynamic random access memory (DRAM) array is configured for selective repair and error correction of a subset of the array. Error-correcting code (ECC) is provided to a selected subset of the array to protect a row or partial row of memory cells where one or more weak memory cells are detected. By adding a sense amplifier stripe to the edge of the memory array, the adjacent edge segment of the array is employed to store ECC information associated with the protected subsets of the array. Bit replacement is also applied to defective memory cells. By implementing ECC selectively rather than to the entire array, integrity of the memory array is maintained at minimal cost to the array in terms of area and energy consumption.

    Abstract translation: 动态随机存取存储器(DRAM)阵列被配置用于阵列的子集的选择性修复和纠错。 将纠错码(ECC)提供给阵列的选定子集,以保护检测到一个或多个弱存储器单元的行或部分行的存储单元。 通过向存储器阵列的边缘添加感测放大器条纹,阵列的相邻边缘段用于存储与阵列的受保护子集相关联的ECC信息。 位更换也适用于有缺陷的存储单元。 通过有选择地执行ECC而不是整个阵列,在面积和能量消耗方面,以阵列的最低成本保持存储器阵列的完整性。

    Error correction in a memory device
    20.
    发明授权
    Error correction in a memory device 有权
    存储器件中的错误校正

    公开(公告)号:US09575835B2

    公开(公告)日:2017-02-21

    申请号:US14692092

    申请日:2015-04-21

    Applicant: Rambus Inc.

    Abstract: A dynamic random access memory (DRAM) array is configured for selective repair and error correction of a subset of the array. Error-correcting code (ECC) is provided to a selected subset of the array to protect a row or partial row of memory cells where one or more weak memory cells are detected. By adding a sense amplifier stripe to the edge of the memory array, the adjacent edge segment of the array is employed to store ECC information associated with the protected subsets of the array. Bit replacement is also applied to defective memory cells. By implementing ECC selectively rather than to the entire array, integrity of the memory array is maintained at minimal cost to the array in terms of area and energy consumption.

    Abstract translation: 动态随机存取存储器(DRAM)阵列被配置用于阵列的子集的选择性修复和纠错。 将纠错码(ECC)提供给阵列的选定子集,以保护检测到一个或多个弱存储器单元的行或部分行的存储单元。 通过向存储器阵列的边缘添加感测放大器条纹,阵列的相邻边缘段用于存储与阵列的受保护子集相关联的ECC信息。 位更换也适用于有缺陷的存储单元。 通过有选择地执行ECC而不是整个阵列,在面积和能量消耗方面,以阵列的最低成本保持存储器阵列的完整性。

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