ADAPTIVE SENSING BASED ON DEPTH
    11.
    发明申请

    公开(公告)号:US20200302144A1

    公开(公告)日:2020-09-24

    申请号:US16851830

    申请日:2020-04-17

    Abstract: A microscope for adaptive sensing may comprise an illumination assembly, an image capture device configured to collect light from a sample illuminated by the assembly, and a processor. The processor may be configured to execute instructions which cause the microscope to capture, using the image capture device, an initial image set of the sample, identify, in response to the initial image set, an attribute of the sample, determine, in response to identifying the attribute, a three-dimensional (3D) process for sensing the sample, and generate, using the determined 3D process, an output image set comprising more than one focal plane. Various other methods, systems, and computer-readable media are also disclosed.

    ACCELERATING DIGITAL MICROSCOPY SCANS USING EMPTY/DIRTY AREA DETECTION

    公开(公告)号:US20220350129A1

    公开(公告)日:2022-11-03

    申请号:US17812374

    申请日:2022-07-13

    Abstract: A microscope comprising an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample comprising artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that comprises artifacts or empty space. The imaging process may comprise a higher resolution process to output higher resolution portions of the computational image for sample regions comprising valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions comprising valid sample material.

    METHODS AND SYSTEMS FOR DIAGNOSTIC PLATFORM
    15.
    发明申请

    公开(公告)号:US20190384962A1

    公开(公告)日:2019-12-19

    申请号:US16338668

    申请日:2017-10-26

    Abstract: Methods and systems are provided for improved imaging and analyzing of a sample with a large field-of-view at a high image resolution. A diagnostic system may comprise: a microscope comprising a low collection numerical aperture (NA); an imaging device coupled to the microscope; and a processor coupled to the imaging device. The imaging device may be configured to capture a plurality of low-resolution images of a region of a sample viewed by the microscope. The region of the sample may comprise cells. The processor may comprise instructions configured to reconstruct a high-resolution image of the region of the sample using the plurality of low-resolution images. The processor may further comprise instructions configured to analyze a spatial field of the high-resolution image to identify at least one of a cell type or a cell structure of at least one of the cells of the region of the sample.

    MICROSCOPE HAVING A REFRACTIVE INDEX MATCHING MATERIAL

    公开(公告)号:US20180373016A1

    公开(公告)日:2018-12-27

    申请号:US15774855

    申请日:2016-11-10

    Abstract: A microscope includes an illumination assembly configured to illuminate a sample under two or more different illumination conditions, at least one image capture device configured to capture image information associated with the sample at each of the two or more different illumination conditions, at least one processing device programmed to generate an image of the sample based on a combination of image information captured at each of the two or more different illumination conditions, and at least one refractive index matching material between the illumination assembly and the sample. The refractive index matching material is different from a medium between the at least one image capture device and the sample.

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