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公开(公告)号：US20230377144A1
公开(公告)日：2023-11-23
申请号：US18248553
申请日：2021-11-17
Applicant: SCOPIO LABS LTD.
Inventor： Ittai MADAR , Shahar KARNY , Eran SMALL , Erez NA'AMAN
CPC classification number: G06T7/0012 , G01N15/05 , G06T2207/10056 , G06T2207/30024 , G06T2207/30242 , G01N2015/055
Abstract: A microscope system for detecting a scan area within hematology slides in digital microscopy may include a scanning apparatus to scan a hematology sample, and a processor coupled to the scanning apparatus and a memory. The processor may be configured to execute instructions which may cause the system to receive a first image of the sample at a first resolution and determine a scan area of the sample to scan in response to the first image. The instructions may further cause the system to scan the scan area to generate an image of the scan area at a second resolution greater than the first resolution and classify a plurality of cells from the image of the scan area into cell data comprising a plurality of cell parameters. The instructions may also cause the microscope system to output the cell data. Various other systems and methods are provided.
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Patent Agency Ranking
公开(公告)号：US20200278530A1
公开(公告)日：2020-09-03
申请号：US16875721
申请日：2020-05-15
Applicant: SCOPIO LABS LTD.
Inventor： Ittai MADAR , Eran SMALL , Itai HAYUT , Erez NA'AMAN
Abstract: A microscope comprising an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample comprising artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that comprises artifacts or empty space. The imaging process may comprise a higher resolution process to output higher resolution portions of the computational image for sample regions comprising valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions comprising valid sample material.
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公开(公告)号：US20240085688A1
公开(公告)日：2024-03-14
申请号：US18514050
申请日：2023-11-20
Applicant: SCOPIO LABS LTD.
Inventor： Ittai MADAR , Eran SMALL , Itai HAYUT , Erez NA'AMAN
CPC classification number: G02B21/367 , G02B21/0084 , G02B21/125
Abstract: A microscope comprising an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample comprising artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that comprises artifacts or empty space. The imaging process may comprise a higher resolution process to output higher resolution portions of the computational image for sample regions comprising valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions comprising valid sample material.
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公开(公告)号：US20210149169A1
公开(公告)日：2021-05-20
申请号：US17098058
申请日：2020-11-13
Applicant: SCOPIO LABS LTD.
Inventor： Ben LESHEM , Eran SMALL , Erez NA'AMAN , Ittai MADAR
Abstract: A microscope for computational microscopic layer separation may include an imaging device that includes a lens and an image sensor, an illumination system for illuminating a sample, and an actuator to adjust an axial position of a focal plane with respect to the sample. The microscope may also include a processor operatively coupled to the imaging device and the illumination system. The processor may be configured to measure, using the image sensor and the illumination system, optical aberrations of the imaging device at the axial position, and determine whether to adjust the focal plane with respect to the sample in response to the one or more optical aberrations. Various other systems and methods are also disclosed.
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公开(公告)号：US20240420828A1
公开(公告)日：2024-12-19
申请号：US18705277
申请日：2022-11-17
Applicant: SCOPIO LABS LTD.
Inventor： Ittai MADAR , Ben LESHEM , Erez NA'AMAN , Eran SMALL
Abstract: An apparatus configured to process a sample to detect a pathogen receives a slide with the sample on the slide, in which the sample has been stained with one or more of a Gram stain, an Acid-Fast stain, or a Giemsa stain. An area of at least 5 mm2 of the sample is imaged at a rate of at least 15 mm2 per minute and a resolution of 0.3 pm or better to generate one or more images. The one or more images of the sample are processed with a classifier configured to detect the pathogen in the sample. In some embodiments, a plurality of cultured and stained samples on a plurality of slides are imaged at the resolution and processed with the classifier, which can increase the area processed and analyzed in order to decrease the culture time and corresponding time to diagnose the patient.
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公开(公告)号：US20220350129A1
公开(公告)日：2022-11-03
申请号：US17812374
申请日：2022-07-13
Applicant: SCOPIO LABS LTD.
Inventor： Ittai MADAR , Eran SMALL , Itai HAYUT , Erez NA'AMAN
Abstract: A microscope comprising an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample comprising artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that comprises artifacts or empty space. The imaging process may comprise a higher resolution process to output higher resolution portions of the computational image for sample regions comprising valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions comprising valid sample material.
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