公开(公告)号：US20180364182A1

公开(公告)日：2018-12-20

申请号：US15623813

申请日：2017-06-15

Applicant: Shimadzu Corporation

Inventor： Koichi TANABE ,  Shingo FURUI ,  Hiroyuki KISHIHARA ,  Kenji KIMURA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA

IPC: G01N23/04 ,  G21K1/06

Abstract: An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.

公开(公告)号：US20180306735A1

公开(公告)日：2018-10-25

申请号：US15958188

申请日：2018-04-20

Applicant: Shimadzu Corporation

Inventor： Koichi TANABE ,  Kenji KIMURA ,  Toshinori YOSHIMUTA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: G01N23/041 ,  G01N23/083 ,  G01N23/20 ,  A61B6/00 ,  G01T1/164

CPC classification number: G01N23/041 ,  A61B6/4035 ,  A61B6/4291 ,  A61B6/4452 ,  A61B6/484 ,  G01N23/083 ,  G01N23/20075 ,  G01T1/1648 ,  G21K1/10

Abstract: The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.

公开(公告)号：US20150021487A1

公开(公告)日：2015-01-22

申请号：US14322462

申请日：2014-07-02

Applicant: SHIMADZU CORPORATION

Inventor： Satoshi SANO ,  Toshiyuki SATO ,  Koichi TANABE ,  Toshinori YOSHIMUTA

IPC: G01T1/20 ,  G01N23/04

CPC classification number: G01T1/20 ,  G01N23/043

Abstract: When a conventional idea of determining a setting condition from a parameter of resolution (image resolution) is changed to use an X-ray tube with a stable focus size, setting conditions are determined from a focus size φ [μm] of the X-ray tube. The minimum radiography size b [μm] is settable from the focus size φ [μm] and φ≦b/2. A magnification rate ε is settable from the set minimum radiography size b [μm], a pixel pitch d [μm] of an X-ray detector, and bε/d≧5. Consequently, the minimum radiography size b [μm] and the magnification rate ε are each settable with use of the X-ray tube having the stable focus size φ [μm]. This results in stable radiography or fluoroscopy through magnifying an object in minute size.

Abstract translation: 当从分辨率（图像分辨率）的参数确定设置条件的传统思想被改变为使用具有稳定聚焦尺寸的X射线管时，根据焦点大小＆phgr [μm] X射线管。 最小射线照相尺寸b [μm]可以从焦点尺寸＆phgr [μm]和＆phgr;＆nlE; b / 2。 放大率＆egr 可以从设定的最小射线照相尺寸b [μm]设定，X射线检测器的像素间距d [μm]，b＆egr /d≥5。 因此，最小射线照相尺寸b [μm]和放大率＆egr; 可以使用具有稳定的聚焦尺寸＆phgr的X射线管来设置。 [μm]。 这通过放大微小尺寸的物体导致稳定的放射照相或荧光透视。

公开(公告)号：US20210364453A1

公开(公告)日：2021-11-25

申请号：US17287412

申请日：2019-07-22

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Koichi TANABE ,  Yukihisa WADA ,  Satoshi TOKUDA ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: G01N23/041 ,  G01N23/046

Abstract: This X-ray phase imaging system (100) includes an X-ray source (1), a detector (2), a first grating group (3), a second grating group (4), a moving mechanism (5), and an image processing unit (6). The moving mechanism is configured to relatively move a subject (T) and the imaging system (9) such that the subject (T) passes through a first grating region (R1) and a second grating region (R2). The image processing unit is configured to generate a first phase-contrast image (14a) and a second phase-contrast image (14b).

公开(公告)号：US20210137476A1

公开(公告)日：2021-05-13

申请号：US17041986

申请日：2019-01-22

Applicant: SHIMADZU CORPORATION

Inventor： Satoshi SANO ,  Koichi TANABE ,  Yukihisa WADA ,  Satoshi TOKUDA ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: A61B6/00 ,  A61B6/03 ,  A61B6/04

Abstract: The X-ray imaging device (100) is provided with an imaging system (CS) including an X-ray source (1), a detector (5), and a plurality of gratings, a moving mechanism (8), a position information acquisition unit (7a), and an image processing unit (6) for generating a phase-contrast image (16) in a tomographic plane by acquiring a phase distribution in a tomographic plane (40) based on a plurality of X-ray images (10) and the acquired tomographic position (z+jd).

公开(公告)号：US20210015437A1

公开(公告)日：2021-01-21

申请号：US16955312

申请日：2018-11-08

Applicant: Shimadzu Corporation

Inventor： Koichi TANABE ,  Yukihisa WADA ,  Satoshi TOKUDA ,  Satoshi SANO ,  Akira HORIBA

IPC: A61B6/00 ,  A61B6/10

Abstract: In an X-ray imaging apparatus an image processor is configured to generate a phase contrast image based on a plurality of first images acquired by a first detection region (R1) at a plurality of relative positions of the first detection region with respect to a subject (T) to be imaged, and to generate an absorption image based on a plurality of second images acquired by a second detection region (R2) at a plurality of relative positions of the second detection region with respect to the subject.

公开(公告)号：US20150265227A1

公开(公告)日：2015-09-24

申请号：US14663240

申请日：2015-03-19

Applicant: SHIMADZU CORPORATION

Inventor： Satoshi SANO ,  Toshiyuki SATO ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Hiroyuki KISHIHARA ,  Takahiro DOKI

IPC: A61B6/00

CPC classification number: A61B6/542 ,  A61B6/4233 ,  G01T1/247

Abstract: Disclosed is an X-ray apparatus with an X-ray tube controller. The X-ray tube controller controls an X-ray tube so as for X-rays emitted from the X-ray tube to have an energy width whose upper limit is more than the minimum K-shell absorption edge of K-shell absorption edges for elements forming a conversion film and is equal to or less than a preset value depending on a K-shell absorption edge corresponding to a characteristic X-ray whose energy influences the blur. Accordingly, the less number of ejected K-shell characteristic X-rays is obtainable than the case when the emitted X-rays have an energy width whose upper limit is more than a preset value depending on the K-shell absorption edge corresponding to the characteristic X-ray whose energy influences the blur. This allows a suppressed blurred image generated from ejected K-shell characteristic X-rays outside a pixel area where X-rays enter to introduce a photoelectric effect.

Abstract translation: 公开了具有X射线管控制器的X射线装置。 X射线管控制器控制X射线管，以便从X射线管发射的X射线的能量宽度的上限大于K壳吸收边缘的最小K壳吸收边缘， 形成转换膜的元件，并且根据与其能量影响模糊的特征X射线相对应的K壳吸收边缘等于或小于预设值。 因此，与发射的X射线的上限大于预设值的能量宽度取决于与特性对应的K壳吸收边缘的情况相比，可以获得较少数量的弹出的K-壳特征X射线 X射线的能量影响模糊。 这允许由X射线进入的像素区域之外的K-shell特征X射线产生的抑制的模糊图像引入光电效应。

公开(公告)号：US20150200323A1

公开(公告)日：2015-07-16

申请号：US14595002

申请日：2015-01-12

Applicant: SHIMADZU CORPORATION

Inventor： Takahiro DOKI ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Hiroyuki KISHIHARA ,  Satoshi SANO

IPC: H01L31/115 ,  H01L31/0224 ,  H01L31/0296

CPC classification number: H01L31/115 ,  H01L27/14658 ,  H01L27/14661 ,  H01L27/14696 ,  H01L31/022408 ,  H01L31/0296

Abstract: In an X-ray strip detector, at least one joining semiconductor film are formed on surface of a sensitive semiconductor film, on the part of X-strips and Y-strips, that is sensitive to incident X-rays to generate electric charge, and on at least an entire sensitive region of a conversion film. The joining semiconductor film has higher resistance value than resistance value of the sensitive semiconductor film. Accordingly, when the electric charge generated in the sensitive semiconductor film are collected in the X-strips and the Y-strips, movement of the electric charge into other adjacent strip electrodes is avoidable. Consequently, crosstalk can be suppressed that the electric charge leak to the adjacent strip electrodes.

Abstract translation: 在X射线条检测器中，至少一个接合半导体膜形成在敏感半导体膜的X射线和Y带上对于入射的X射线敏感以产生电荷的表面上，以及 在转换膜的至少整个敏感区域上。 接合半导体膜的电阻值比敏感半导体膜的电阻值高。 因此，当在敏感半导体膜中产生的电荷被收集在X条和Y条中时，可以避免电荷进入其它相邻带状电极的运动。 因此，可以抑制电荷泄漏到相邻条状电极的串扰。