Abstract:
A fusing unit for an image forming apparatus has a heating roller, and a fusing belt assembly that rotates in contact with the heating roller. The fusing belt assembly comprises a pressure roller, a separating roller and a fusing belt rotatably supported by the pressure roller and the separating roller. A slip prevention element prevents slippage of the fusing belt. Because the slip prevention element is disposed at both ends of the separating roller so that it does not interfere with the paper sheet being fused, the quality of printing can be improved without shortening the life of the fusing belt.
Abstract:
A heat roller for a fixing apparatus includes a conductive cylindrical roller body, and a resistance heater installed in the roller body. Caps at each end of the heat roller have electrodes for supplying a current to the resistance heater. A fastening means confines at least one cap to prevent the cap from being axially separated from the roller body and to substantially prevent the cap from being idled in the roller body.
Abstract:
A method of compensating sensor data used in an interlock system comprises setting a predetermined drift upper limit and a predetermined drift lower limit, creating a reference pattern information about a reference model, creating a sensor pattern information about the sensor data, determining whether the sensor pattern information satisfies the drift upper limit and the drift lower limit, calculating a drift offset according to the reference pattern information and the sensor pattern information when the sensor pattern information satisfies the drift upper limit and the drift lower limit, and compensating the sensor data according to the calculated drift offset. Thus, a method of compensating sensor data and a method of evaluating an interlock of an interlock system, in which interlock setting/managing for identical sets of equipment under the interlock system is simplified through a statistic drift compensation algorithm, and an allowable variation between wafers is minimized, thereby enhancing detection reliability of a defective wafer. A method of compensating sensor data and a method of evaluating an interlock of an interlock system, in which an allowable variation between sensors varying depending on a driving time for a set of equipment, an RF time, the number of wafers, etc. is minimized, thereby enhancing detection reliability of a defective wafer.
Abstract:
An information storage device includes a storage node, a write unit configured to write information to a first magnetic domain region of the storage node, and a read unit configured to read information from a second magnetic domain region of the storage node. The information storage device further includes a temporary storage unit configured to temporarily store information read by the read unit, and a write control unit electrically connected to the temporary storage unit and configured to control current supplied to the write unit. The information read from the second magnetic domain region is stored in the temporary storage unit and written to the first magnetic domain region.
Abstract:
An information storage device includes a magnetic structure having a buffer track and a plurality of storage tracks connected to the buffer track. A write/read unit is disposed on the magnetic structure, and a plurality of switching devices are respectively connected to the buffer track, the plurality of storage tracks, and the write/read unit. The switching devices that are respectively connected to the buffer track and the storage tracks. The information storage device further includes a circuit configured to supply current to at least one of the magnetic structure and the write/read unit.
Abstract:
Provided are a semiconductor memory device and a magneto-logic circuit which change the direction of a magnetically induced current according to a logical combination of logic states of a plurality of input values. The semiconductor memory device comprises a current driving circuit, a magnetic induction layer, and a resistance-variable element. The current driving circuit receives a plurality of input values and changes the direction of a magnetically induced current according to a logical combination of logic states of the input values. The magnetic induction layer induces magnetism having a direction varying according to the direction of the magnetically induced current. The resistance-variable element has a resistance varying according to the direction of the magnetism induced by the magnetic induction layer.
Abstract:
An information storage device includes a memory region having a magnetic track and a write/read unit, and a control circuit connected to the memory region. First and second switching devices are connected to both ends of the magnetic track, and a third switching device is connected to the write/read unit. The control circuit controls the first to third switching devices, and supplies operating current to at least one of the magnetic track and the write/read unit.
Abstract:
In an MRAM and method for fabricating the same, the MRAM includes a semiconductor substrate, a transistor formed on the semiconductor substrate, an interlayer dielectric formed on the semiconductor substrate to cover the transistor, and first and second MTJ cells formed in the interlayer dielectric to be coupled in parallel with a drain region of the transistor, wherein the first MTJ cell is coupled to a first bit line formed in the interlayer dielectric and the second MTJ cell is coupled to a second bit line formed in the interlayer dielectric, and wherein a data line is formed between the first MTJ cell and a gate electrode of the transistor to be perpendicular to the first bit line and the second bit line. The MRAM provides high integration density, sufficient sensing margin, high-speed operation and reduced noise, requires reduced current for recording data and eliminates a voltage offset.
Abstract:
A method of compensating sensor data and a method of evaluating an interlock of an interlock system, in which an allowable variation between sensors varying depending on a driving time for a set of equipment, an RF time, the number of wafers, etc. is minimized, thereby enhancing detection reliability of a defective wafer.
Abstract:
A fixing unit and an image forming apparatus are provided. The fixing unit applies heat and pressure to a print medium on which a toner image is formed and fixes the toner image on the print medium. The fixing unit includes a heating roller including a heating source, at least two pressurizing rollers which are pressed against the heating roller along an outer circumferential surface of the heating roller, adhesion elastic bodies which elastically press the pressurizing rollers toward the heating roller at first locations of both ends of the pressurizing rollers, and correction elastic bodies which elastically press the pressurizing rollers at second locations of both ends of the pressurizing rollers in the opposite direction of the adhesion elastic bodies. With this structure, the fixing unit forms sufficient fixing nips to reliably fix toner images on the print medium while maintaining a compact structure. Furthermore, this structure increases the life span of the apparatus by minimizing deformation of the pressurizing roller.