公开(公告)号：US11923895B2

公开(公告)日：2024-03-05

申请号：US17701186

申请日：2022-03-22

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Evan Douglas Smith ,  Heike Tritschler

IPC: H04B10/077 ,  H04B10/40

CPC classification number: H04B10/0779 ,  H04B10/40

Abstract: A test and measurement system includes a test and measurement device, a connection to allow the test and measurement device to connect to an optical transceiver, and one or more processors, configured to execute code that causes the one or more processors to: set operating parameters for the optical transceiver to reference operating parameters; acquire a waveform from the optical transceiver; repeatedly execute the code to cause the one or more processors to set operating parameters and acquire a waveform, for each of a predetermined number of sets of reference operating parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted operating parameters; set the operating parameters for the optical transceiver to the predicted operating parameters; and test the optical transceiver using the predicted operating parameters.

公开(公告)号：US20230050162A1

公开(公告)日：2023-02-16

申请号：US17876817

申请日：2022-07-29

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G06F11/273 ,  G06F11/267

Abstract: A test and measurement instrument has an input configured to receive a signal from a device under test, a memory, a user interface to allow the user to input settings for the test and measurement instrument, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. A method of testing a device under test includes acquiring a waveform representing a signal received from the device under test, generating one or more tensor arrays based on the waveform, applying machine learning to the one or more tensor arrays to produce equalizer tap values, applying the equalizer taps values to the waveform to produce an equalized waveform, performing a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test.

公开(公告)号：US20220390515A1

公开(公告)日：2022-12-08

申请号：US17831181

申请日：2022-06-02

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Mark Anderson Smith ,  Kan Tan ,  Evan Douglas Smith ,  Justin E. Patterson ,  Heike Tritschler

IPC: G01R31/3183 ,  G01R31/317

Abstract: A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.

公开(公告)号：US20220373598A1

公开(公告)日：2022-11-24

申请号：US17747954

申请日：2022-05-18

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R31/3183 ,  G01R31/319 ,  G01R31/28

Abstract: A test and measurement system includes a test and measurement device configured to receive a signal from a device under test, and one or more processors configured to execute code that causes the one or more processors to generate a waveform from the signal, apply an equalizer to the waveform, receive an input identifying one or more measurements to be made on the waveform, select a number of unit intervals (UIs) for a known data pattern, scan the waveform for the known data patterns having a length of the number of UIs, identify the known data patterns as short pattern waveforms, apply a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and provide the values of the one or more measurements for the waveform. A method includes receiving a signal from a device under test, generating a waveform from the signal, applying an equalizer to the waveform, receiving an input identifying one or more measurements to be made on the waveform, selecting a number of unit intervals (UIs), scanning the waveform to identify short pattern waveforms having a length equal to the number of UIs, applying a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and providing the values of the one or more measurements for the waveform from the machine learning system.

公开(公告)号：US20220334180A1

公开(公告)日：2022-10-20

申请号：US17724393

申请日：2022-04-19

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Heike Tritschler ,  Evan Douglas Smith ,  Williams Fabricio Flores Yepez

IPC: G01R31/317 ,  G01R31/319 ,  G06N20/00

Abstract: A test and measurement system includes a clock recovery circuit configured to receive a signal from a device under test and to produce a pattern trigger signal, a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing the signal received from the device under test, a row selection circuit configured to select a row in the array of counters, and a ring counter circuit configured to receive a clock signal, select a column in the array of counters, produce end of row signals, and produce a fill complete signal upon all of the columns having been swept, the fill complete signal indicating completion of the waveform image, an equivalent time sweep logic circuit configured to receive the pattern trigger signal and the end of row signals from the ring counter and to produce the clock signal with a delay to increment a clock delay to the ring counter until the fill complete signal is received, and a machine learning system configured to receive the waveform image and provide operating parameters for the device under test. A test and measurement system includes a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing a signal received from a device under test, a row selection circuit configured to select a row in the array of counters, a column selection circuit configured to select a column in the array of counters, a sample clock connected to the row selection circuit and the column selection circuit, and a machine learning system configured to receive the waveform image from the flash array digitizer and provide operating parameters for the device under test.

公开(公告)号：US20210263085A1

公开(公告)日：2021-08-26

申请号：US17182056

申请日：2021-02-22

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: G01R23/02 ,  G01R13/02

Abstract: A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.

公开(公告)号：US20200252246A1

公开(公告)日：2020-08-06

申请号：US16775671

申请日：2020-01-29

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H04L25/03

Abstract: An apparatus configured to acquire S-parameters of a communications channel includes a physical interface configured to transmit and receive signals through a communications channel under test, a processor, configured to execute instructions that, when executed cause the processor to: send a first data pattern from the transmitter through the communications channel at a first data rate; acquire a first waveform corresponding to the first data pattern and determine a first pulse response; calculate a first transfer function from the first pulse response; send a second data pattern from the transmitter through the communications channel at a second data rate; acquire a second waveform corresponding to the second data pattern and determine a second pulse response; calculate a second transfer function from the second pulse response; and combine the first and second transfer functions to determine an S-parameter of the communications channel.

公开(公告)号：US20180262325A1

公开(公告)日：2018-09-13

申请号：US15687364

申请日：2017-08-25

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H04L7/033 ,  H04L25/03 ,  H04L7/00 ,  H04L1/20

Abstract: Disclosed is a mechanism for limiting Intersymbol Interference (ISI) when measuring uncorrelated jitter in a test and measurement system. A waveform is obtained that describes a signal. Such waveform may be obtained from memory. A processor then extracts a signal pulse from the waveform. The processor selects a window function based on a shape of the signal pulse. Further, the processor applies the window function to the signal pulse to remove ISI outside a window of the window function while measuring waveform jitter. The window function may be applied by applying the window function to the signal pulse to obtain a target pulse. A linear equalizer is then generated that results in the target pulse when convolved with the signal pulse. The linear equalizer is then applied to the waveform to limit ISI for jitter measurement.

公开(公告)号：US20160323094A1

公开(公告)日：2016-11-03

申请号：US15076173

申请日：2016-03-21

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H04L7/033 ,  H04L7/00

CPC classification number: H04L7/033 ,  G01R13/00 ,  H04L1/20 ,  H04L1/205 ,  H04L7/0008 ,  H04L7/027 ,  H04L7/0331 ,  H04L25/03878

Abstract: Embodiments of the present invention provide improved techniques for recovering clock information from data signals. In one embodiment, a general purpose device such as a real-time oscilloscope acquires a data signal. The device takes a derivative of the data signal, then computes the square or absolute of the derivative before applying a bandpass filter. The bandpass filter is a windowing function a spectrum that is wider than the clock, and has a flat top and smooth transitions on both sides. In one embodiment, at Tukey window may be used. The device finds edge crossing times of the filtered result, and applies a phase-locked loop or lowpass filter to the edge crossing times in order to recover a stable clock signal. When the improved techniques are implemented in software, they may be used with any number of different equalizers that are required by various high-speed serial data link systems.

Abstract translation: 本发明的实施例提供了用于从数据信号恢复时钟信息的改进技术。 在一个实施例中，诸如实时示波器的通用设备获取数据信号。 器件取数据信号的导数，然后在应用带通滤波器之前计算导数的平方或绝对值。 带通滤波器是一个比时钟宽的频谱的窗口功能，并且在两侧具有平坦的顶部和平滑的过渡。 在一个实施例中，可以使用Tukey窗口。 器件发现滤波结果的边沿交叉时间，并向边沿交叉时间施加锁相环或低通滤波器，以恢复稳定的时钟信号。 当改进的技术在软件中实现时，它们可以与各种高速串行数据链路系统所需的任何数量的不同均衡器一起使用。

公开(公告)号：US20160291056A1

公开(公告)日：2016-10-06

申请号：US14674344

申请日：2015-03-31

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G01R13/02 ,  G01R13/22

CPC classification number: G01R13/0218 ,  G01R13/0272 ,  G01R13/225 ,  H03M1/1052 ,  H03M1/1215

Abstract: A test and measurement instrument including a splitter configured to split an input signal into at least two split signals, at least two harmonic mixers configured to mix an associated split signal with an associated harmonic signal to generate an associated mixed signal, at least two digitizers configured to digitize the associated mixed signal, at least two MIMO polyphase filter arrays configured to filter the associated digitized mixed signal of an associated digitizer of the at least two digitizers, at least two pairs of band separation filters configured to receive the associated digitized mixed signals from each of the MIMO polyphase filter arrays and output a low band of the input signal and a high band of the input signal based on a time different between the at least two digitizers and a phase drift of a local oscillator, and a combiner configured to combine the low band of the input signal and the high band of the input signal to form a reconstructed input signal.

Abstract translation: 一种包括分配器的测试和测量仪器，其被配置为将输入信号分成至少两个分离信号，至少两个谐波混合器被配置为将相关联的分离信号与相关联的谐波信号混合以产生相关联的混合信号，至少两个数字化器被配置 至少两个MIMO多相滤波器阵列被配置为对所述至少两个数字化仪的相关联的数字转换器的相关联的数字化混合信号进行数字化，至少两对频带分离滤波器被配置成从相关联的数字化混合信号中接收相关联的数字化混合信号 每个MIMO多相滤波器阵列，并且基于所述至少两个数字转换器之间的时间和本地振荡器的相位漂移而输出所述输入信号的低频带和所述输入信号的高频带，以及被配置为组合的组合器 输入信号的低频带和输入信号的高频带，以形成重构的输入信号。