-
公开(公告)号:US11508640B2
公开(公告)日:2022-11-22
申请号:US16874621
申请日:2020-05-14
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chi-Yang Yu , Chin-Liang Chen , Kuan-Lin Ho , Yu-Min Liang , Wen-Lin Chen
IPC: H01L23/373 , H01L23/00 , H01L23/31 , H01L23/495
Abstract: A semiconductor package and a manufacturing method thereof are provided. The semiconductor package includes a first semiconductor die, a second semiconductor die, a molding compound, a heat dissipation module and an adhesive material. The first and second semiconductor dies are different types of dies and are disposed side by side. The molding compound encloses the first and second semiconductor dies. The heat dissipation module is located directly on and in contact with the back sides of the first and second semiconductor dies. The adhesive material is filled and contacted between the heat dissipation module and the molding compound. The semiconductor package has a central region and a peripheral region surrounding the central region. The first and second semiconductor dies are located within the central region. A sidewall of the heat dissipation module, a sidewall of the adhesive material and a sidewall of the molding compound are substantially coplanar.
-
公开(公告)号:US20220359406A1
公开(公告)日:2022-11-10
申请号:US17869286
申请日:2022-07-20
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Wei-Yu Chen , Chun-Chih Chuang , Kuan-Lin Ho , Yu-Min Liang , Jiun Yi Wu
IPC: H01L23/538 , H01L23/00 , H01L21/48 , H01L21/56 , H01L21/683 , H01L23/31
Abstract: A package includes an interposer structure free of any active devices. The interposer structure includes an interconnect device; a dielectric film surrounding the interconnect device; and first metallization pattern bonded to the interconnect device. The package further includes a first device die bonded to an opposing side of the first metallization pattern as the interconnect device and a second device die bonded to a same side of the first metallization pattern as the first device die. The interconnect device electrically connects the first device die to the second device die.
-
公开(公告)号:US20200328173A1
公开(公告)日:2020-10-15
申请号:US16914478
申请日:2020-06-29
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chi-Yang Yu , Chin-Liang Chen , Hai-Ming Chen , Kuan-Lin Ho , Yu-Min Liang
IPC: H01L23/00 , H01L21/768 , H01L21/56 , H01L23/31 , H01L23/522 , H01L23/532 , H01L21/683
Abstract: An integrated fan-out package includes a die, an encapsulant, a seed layer, a conductive pillar, a redistribution structure, and a buffer layer. The encapsulant encapsulates the die. The seed layer and the conductive pillar are sequentially stacked over the die and the encapsulant. The redistribution structure is over the die and the encapsulant. The redistribution structure includes a conductive pattern and a dielectric layer. The conductive pattern is directly in contact with the seed layer and the dielectric layer covers the conductive pattern and surrounds the seed layer and the conductive pillar. The buffer layer is disposed over the redistribution structure. The seed layer is separate from the dielectric layer by the buffer layer, and a Young's modulus of the buffer layer is higher than a Young's modulus of the dielectric layer of the redistribution structure.
-
公开(公告)号:US20190148340A1
公开(公告)日:2019-05-16
申请号:US15835466
申请日:2017-12-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chi-Yang Yu , Chin-Liang Chen , Chien-Hsun Lee , Kuan-Lin Ho , Yu-Min Liang
IPC: H01L25/065 , H01L23/31 , H01L23/00 , H01L23/29 , H01L21/56 , H01L25/00 , H01L23/538
Abstract: A package structure and a method of forming the same are provided. The package structure includes a first die, a second die, a first encapsulant, a second encapsulant, and a plurality of conductive terminals. The first encapsulant is at least disposed between the first die and the second die, and on the second die. The second encapsulant is aside the first die and the second die. The conductive terminals are electrically connected to the first die and the second die through a redistribution layer (RDL) structure. An interface is existed between the first encapsulant and the second encapsulant.
-
公开(公告)号:US10276508B2
公开(公告)日:2019-04-30
申请号:US15719493
申请日:2017-09-28
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Kuan-Lin Ho , Chin-Liang Chen , Chi-Yang Yu , Yu-Min Liang
IPC: H01L23/495 , H01L23/538 , H01L23/31 , H01L23/00 , H01L21/56 , H01L21/48 , H01L21/78 , H01L23/367
Abstract: Semiconductor packages and methods of forming the same are disclosed. The semiconductor package includes a plurality of chips, a first molding compound, a first redistribution structure, a second molding compound and a second redistribution structure. The first molding compound encapsulates the chips. The first redistribution structure is disposed over the plurality of chips and the first molding compound. The second molding compound surrounds the first molding compound. The second redistribution structure is disposed over the first redistribution structure, the first molding compound and the second molding compound.
-
公开(公告)号:US10157871B1
公开(公告)日:2018-12-18
申请号:US15730760
申请日:2017-10-12
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chi-Yang Yu , Chin-Liang Chen , Hai-Ming Chen , Kuan-Lin Ho , Yu-Min Liang
IPC: H01L23/31 , H01L23/00 , H01L21/768 , H01L21/56 , H01L23/522 , H01L23/532
Abstract: An integrated fan-out package includes a die, an encapsulant, a redistribution structure, a plurality of conductive pillars, a seed layer, and a plurality of conductive bumps. The encapsulant encapsulates the die. The redistribution structure is over the die and the encapsulant. The redistribution structure is electrically connected to the die and includes a plurality of dielectric layers that are sequentially stacked and a plurality of conductive patterns sandwiched between the dielectric layers. A Young's modulus of the dielectric layer farthest away from the die is higher than a Young's modulus of each of the rest of the dielectric layers. The conductive patterns are electrically connected to each other. The conductive pillars are disposed on and electrically connected to the redistribution structure. The seed layer is located between the conductive pillars and the redistribution structure. The conductive bumps are disposed on the plurality of conductive pillars.
-
公开(公告)号:US11355461B2
公开(公告)日:2022-06-07
申请号:US16914478
申请日:2020-06-29
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chi-Yang Yu , Chin-Liang Chen , Hai-Ming Chen , Kuan-Lin Ho , Yu-Min Liang
IPC: H01L21/768 , H01L23/00 , H01L21/56 , H01L23/31 , H01L23/522 , H01L23/532 , H01L21/683
Abstract: An integrated fan-out package includes a die, an encapsulant, a seed layer, a conductive pillar, a redistribution structure, and a buffer layer. The encapsulant encapsulates the die. The seed layer and the conductive pillar are sequentially stacked over the die and the encapsulant. The redistribution structure is over the die and the encapsulant. The redistribution structure includes a conductive pattern and a dielectric layer. The conductive pattern is directly in contact with the seed layer and the dielectric layer covers the conductive pattern and surrounds the seed layer and the conductive pillar. The buffer layer is disposed over the redistribution structure. The seed layer is separate from the dielectric layer by the buffer layer, and a Young's modulus of the buffer layer is higher than a Young's modulus of the dielectric layer of the redistribution structure.
-
公开(公告)号:US20210242119A1
公开(公告)日:2021-08-05
申请号:US16916046
申请日:2020-06-29
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Kuan-Lin Ho , Chin-Liang Chen , Jiun-Yi Wu , Chi-Yang Yu , Yu-Min Liang , Wei-Yu Chen
IPC: H01L23/498 , H01L23/00 , H01L21/683 , H01L21/48
Abstract: A semiconductor structure and a manufacturing method thereof are provided. The semiconductor structure includes a redistribution structure, a circuit substrate, and an insulating encapsulation. The redistribution structure includes a first under-bump metallization (UBM) pattern covered by a first dielectric layer, and the first UBM pattern includes a surface substantially leveled with a surface of the first dielectric layer. The circuit substrate is electrically coupled to the redistribution structure through a conductive joint disposed on the surface of the first UBM pattern. The insulating encapsulation is disposed on the redistribution structure to cover the circuit substrate.
-
公开(公告)号:US10957672B2
公开(公告)日:2021-03-23
申请号:US15835466
申请日:2017-12-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chi-Yang Yu , Chin-Liang Chen , Chien-Hsun Lee , Kuan-Lin Ho , Yu-Min Liang
IPC: H01L25/065 , H01L23/31 , H01L21/56 , H01L23/538 , H01L23/00 , H01L23/29 , H01L25/00 , H01L21/66
Abstract: A package structure and a method of forming the same are provided. The package structure includes a first die, a second die, a first encapsulant, a second encapsulant, and a plurality of conductive terminals. The first encapsulant is at least disposed between the first die and the second die, and on the second die. The second encapsulant is aside the first die and the second die. The conductive terminals are electrically connected to the first die and the second die through a redistribution layer (RDL) structure. An interface is existed between the first encapsulant and the second encapsulant.
-
公开(公告)号:US09812410B2
公开(公告)日:2017-11-07
申请号:US14985504
申请日:2015-12-31
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Kuan-Lin Ho , Chin-Liang Chen , Chi-Yang Yu , Yu-Chih Liu
IPC: H01L23/12 , H01L23/58 , H01L23/00 , H01L21/48 , H01L23/367 , H01L21/78 , H01L23/498 , H01L23/31 , H01L25/065
CPC classification number: H01L23/585 , H01L21/4853 , H01L21/78 , H01L23/3107 , H01L23/367 , H01L23/3675 , H01L23/49816 , H01L24/11 , H01L24/17 , H01L24/27 , H01L24/32 , H01L25/0655 , H01L25/0657 , H01L2224/0401 , H01L2224/16145 , H01L2224/16227 , H01L2224/32225 , H01L2224/32245 , H01L2224/73253 , H01L2224/81 , H01L2224/92225 , H01L2224/97 , H01L2225/06513 , H01L2924/15311 , H01L2924/15313
Abstract: A semiconductor device structure and method for forming the same are provided. The semiconductor device structure includes a substrate and a die structure formed over the substrate. The semiconductor device structure also includes a lid structure formed over the die structure. The lid structure includes a top portion with a top length and a bottom portion with a bottom length, and the top length is greater than the bottom length. The semiconductor device structure also includes a package layer formed between the lid structure and the die structure, and a sidewall of the bottom portion of the lid structure is not aligned with a sidewall of the die structure.
-
-
-
-
-
-
-
-
-