-
公开(公告)号：US11687213B1
公开(公告)日：2023-06-27
申请号：US17385859
申请日：2021-07-26
Applicant: Tektronix, Inc.
Inventor： Gary J. Waldo
IPC: G06F3/04817 , G06F3/0482 , G06F3/04845
CPC classification number: G06F3/0482 , G06F3/04817 , G06F3/04845 , G06F2203/04803
Abstract: A test and measurement instrument including a display and one or more processors configured to display on the display a waveform viewing area with a vertical dimension and an adjustable horizontal dimension, the test and measurement instrument configured to display one or more waveforms in the waveform viewing area, a global settings readout bar located vertically adjacent to the waveform viewing area, the global settings readout bar including a first selectable information badge, wherein when the first selectable information badge is selected, displaying a first menu originating from the first selectable information badge to modify a setting of the test and measurement instrument related to the first selectable information badge. The first selectable information badge including a warning indicator when an error or safety condition occurs.
-
12.发明申请公开(公告)号：US20220308790A1
公开(公告)日：2022-09-29
申请号：US17701662
申请日：2022-03-22
Applicant: Tektronix, Inc.
Inventor： Gary J. Waldo
IPC: G06F3/06
Abstract: A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal, store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the acquisition in the data store to one or more criteria, and identify whether the compared acquisition meets the one or more criteria. When the selected acquisition meets the one or more criteria, the selected acquisition may be stored in a secondary memory of the instrument as a curated or selected history of measurements. After storing the selected acquisition in the secondary memory, the stored, selected acquisitions may be copied to a separate storage device as a storage file.
-
13.发明申请公开(公告)号：US20170030945A1
公开(公告)日：2017-02-02
申请号：US15294522
申请日：2016-10-14
Applicant: TEKTRONIX, INC.
Inventor： Gary J. Waldo
IPC: G01R13/02
Abstract: A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.
Abstract translation: 公开了一种测试和测量仪器和方法。 测试和测量仪器包括具有时域刻度和频域刻度的显示器。 处理器被配置为对输入信号进行采样以产生用于在时域刻度中显示的时域波形。 处理器还被配置为产生频域波形以在频域刻度中显示，频域波形与时域刻度的选定时间段相关。 处理器还被配置为生成频谱时间指示器，其被配置为以图形方式示出相对于频域波形的时域刻度的位置和所选择的时间段。
-
14.发明申请公开(公告)号：US20220413051A1
公开(公告)日：2022-12-29
申请号：US17849577
申请日：2022-06-24
Applicant: Tektronix, Inc.
Inventor： Parjanya Adiga , Niranjan R. Hegde , Krishna N H. Sri , Gary J. Waldo , Yogesh M. Pai
IPC: G01R31/34 , H02P6/18 , H02P21/18 , H02P25/026 , H02P27/08
Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.
-
公开(公告)号：US20220308090A1
公开(公告)日：2022-09-29
申请号：US17701658
申请日：2022-03-22
Applicant: Tektronix, Inc.
Inventor： Gary J. Waldo
IPC: G01R13/02
Abstract: A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal and store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the selected acquisition in the data store against one or more criteria, and identify whether the acquisition meets the one or more criteria. When the acquisition meets the one or more criteria, the acquisition may be stored in a secondary memory of the instrument as a curated or selected history of measurements, on which measurements or other analysis may be made.
-
Patent Agency Ranking
公开(公告)号：US20210278441A1
公开(公告)日：2021-09-09
申请号：US17191059
申请日：2021-03-03
Applicant: Tektronix, Inc.
Inventor： Gary J. Waldo , Pierre Dupont
Abstract: A test and measurement instrument having an input configured to acquire waveforms from a device under test, a memory configured to store the acquired waveforms, a user input configured to receive a selection, and one or more processors. The one or more processors can render on a display the acquired waveforms, receive the selection from the user input indicating a filter criterium, such as a region of interest in the displayed acquired waveforms, determine which waveforms of the acquired waveforms are within the region of interest, and render only waveforms associated with the region of interest on the display.
-
17.发明申请公开(公告)号：US20200233827A1
公开(公告)日：2020-07-23
申请号：US16733613
申请日：2020-01-03
Applicant: Tektronix, Inc.
Inventor： James D. Alley , Gary J. Waldo
Abstract: A test and measurement instrument including a digital down converter configured to receive a bus signal and output in-phase and quadrature-phase baseband component waveform data, a trace generator configured to receive the in-phase and quadrature-phase baseband component waveform data and generate at least one radio frequency versus time trace, a decoder configured to receive the at least one radio frequency versus time trace and decode the bus signal based on the at least one radio frequency versus time trace and a wireless modulation scheme, and a trigger configured to capture at least a portion of the bus signal based on the decoded bus signal.
-
公开(公告)号：US20160252207A1
公开(公告)日：2016-09-01
申请号：US15049338
申请日：2016-02-22
Applicant: Tektronix, Inc.
Inventor： Brian A. Hollenberg , Robert R. Kreitzer , Gary J. Waldo , Jonah S. Griffith , Jared Randall
CPC classification number: F16M11/38 , F16M2200/024 , F16M2200/08 , G01D11/30 , H05K5/0234
Abstract: A locking foldable foot includes a mounting plate, a first member, and a second member. The proximal end of the first member is attached to the mounting plate at a pivot. The second member is coupled to the first member and is structured to move parallel to the first member. The proximal end of the second member is structured to be capable of engaging the mounting plate to prevent rotation of the first and second members about the pivot. A test and measurement instrument includes the locking foldable foot. A method of preventing unintentional closure of a foldable foot on a test and measurement instrument includes locking the foldable foot in an open position in response to the weight of the test and measurement instrument being applied to the foldable foot.
Abstract translation: 锁定折叠脚包括安装板，第一构件和第二构件。 第一构件的近端在枢轴处附接到安装板。 第二构件联接到第一构件并且构造成平行于第一构件移动。 第二构件的近端构造成能够接合安装板，以防止第一和第二构件围绕枢轴旋转。 测试和测量仪器包括锁定可折叠脚。 防止可折叠脚在测试和测量仪器上的无意闭合的方法包括响应于测试和测量仪器被施加到可折叠脚的重量而将可折叠脚锁定在打开位置。
-
19.发明授权公开(公告)号：US12092693B2
公开(公告)日：2024-09-17
申请号：US17849577
申请日：2022-06-24
Applicant: Tektronix, Inc.
Inventor： Parjanya Adiga , Niranjan R. Hegde , Krishna N H. Sri , Gary J. Waldo , Yogesh M. Pai
IPC: G01R31/34 , H02P6/18 , H02P21/18 , H02P25/026 , H02P27/08
CPC classification number: G01R31/343 , H02P6/18 , H02P21/18 , H02P25/026 , H02P27/08 , H02P2207/05
Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.
-
公开(公告)号：USD909899S1
公开(公告)日：2021-02-09
申请号：US29678101
申请日：2019-01-25
Applicant: Tektronix, Inc.
Designer： Neil Clayton , Robert R. Kreitzer , Gary J. Waldo , Jonah S. Griffith , Aaron Piazza
-
-
-
-
-
-
-
-
-
Search Results
20
records
(took 0.014 seconds)
