公开(公告)号：US20160033455A1

公开(公告)日：2016-02-04

申请号：US14745757

申请日：2015-06-22

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Christopher R. Muggli ,  Martin Rockwell ,  Ira G. Pollock

IPC: G01N29/30 ,  G01N29/24

CPC classification number: G01N29/30 ,  G01N29/24 ,  G01R1/06766 ,  G01R1/06772 ,  G01R31/31706

Abstract: A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.

Abstract translation: 探头，包括被配置为接收第一输入信号的第一输入，被配置为接收第二输入信号的第二输入，连接到第一输入的第一电缆，连接到第二输入的第二电缆，连接到 所述第一电缆，所述电子可调节延迟被配置为延迟所述第一输入信号以去除所述第一输入信号和所述第二输入信号之间的偏斜;以及放大器，被配置为从所述电子可调延迟接收所述第一输入信号，以及第二输入信号 。

公开(公告)号：US20130221985A1

公开(公告)日：2013-08-29

申请号：US13854566

申请日：2013-04-01

Applicant: TEKTRONIX, INC.

Inventor： Josiah A. Bartlett ,  Ira G. Pollock ,  Daniel G. Knierim ,  Lester L. Larson ,  Scott R. Jansen ,  Kenneth P. Dobyns ,  Michael Duane Stevens

IPC: G01R35/00

CPC classification number: G01R35/005 ,  G01R1/06766

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract translation: 信号采集系统具有信号采集探针，其具有耦合到电阻中心导体信号电缆的探针尖端电路。 信号采集探头的电阻中心导体信号电缆通过输入节点和信号处理仪器中的输入电路耦合到信号处理仪器中的补偿系统。 信号采集探头和信号处理仪器在输入节点处具有不匹配的时间常数，补偿系统提供极零对，以保持信号采集系统频率带宽的平坦度。

公开(公告)号：US11249111B2

公开(公告)日：2022-02-15

申请号：US16028236

申请日：2018-07-05

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

IPC: G01R1/067 ,  G01R31/02 ,  G01R31/50 ,  G01R31/54

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

公开(公告)号：US20210088553A1

公开(公告)日：2021-03-25

申请号：US17114468

申请日：2020-12-07

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

IPC: G01R1/067 ,  G01R31/50

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

公开(公告)号：US10168356B2

公开(公告)日：2019-01-01

申请号：US14830339

申请日：2015-08-19

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  William A. Hagerup ,  Ira G. Pollock

IPC: G01R1/067

Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.

公开(公告)号：US10145822B2

公开(公告)日：2018-12-04

申请号：US14745757

申请日：2015-06-22

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Christopher R. Muggli ,  Martin Rockwell ,  Ira G. Pollock

IPC: G01N29/30 ,  G01N29/24 ,  G01R1/067 ,  G01R31/317

Abstract: A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.

公开(公告)号：US10119992B2

公开(公告)日：2018-11-06

申请号：US14676703

申请日：2015-04-01

Applicant: Tektronix, Inc.

Inventor： William A. Hagerup ,  Julie A. Campbell ,  Ira G. Pollock ,  James E. Spinar ,  Kathleen F. M. Ullom ,  Charles M. Hartmann ,  Daniel J. Ayres ,  Christina D. Enns

IPC: G01R1/067

Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.

公开(公告)号：US10041975B2

公开(公告)日：2018-08-07

申请号：US14949562

申请日：2015-11-23

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

IPC: G01R1/067 ,  G01R31/02

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

公开(公告)号：US20170052216A1

公开(公告)日：2017-02-23

申请号：US14830339

申请日：2015-08-19

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  William A. Hagerup ,  Ira G. Pollock

IPC: G01R1/067

CPC classification number: G01R1/06705 ,  G01R1/06722 ,  G01R1/06738 ,  G01R1/06772 ,  G01R1/06788 ,  H01R2201/20

Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.

Abstract translation: 用于与被测设备的测试点进行电接触的探针包括主体，能够相对于主体线性地行进的刚性构件;柔性臂，其在一端具有测试点接触并且紧固到刚性构件 另一端，以及固定到主体和柔性臂的柔性连杆。 柔性连杆构造成使得柔性臂响应于刚性构件在一个方向上的移动而弯曲，并且响应于刚性构件沿另一方向的行进而使柔性臂解开弯曲。 可以包括第二柔性臂，两个臂打开和关闭以改变测试点触点之间的距离。 光源可以设置在柔性连接件的同时铰接以自动跟踪测试点接触的取向的部分上。

公开(公告)号：US20140103951A1

公开(公告)日：2014-04-17

申请号：US13649303

申请日：2012-10-11

Applicant: Tektronix, Inc.

Inventor： Daniel G. KNIERIM ,  William A. HAGERUP ,  Barton T. HICKMAN ,  Ira G. Pollock

IPC: G01R31/04 ,  G06F19/00 ,  G01R1/067

CPC classification number: G01R1/06788 ,  G01R1/06766 ,  G01R1/06794 ,  G01R31/024 ,  G01R31/026

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。