Abstract:
An integrated circuit (“IC”) includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. One such IC also includes circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. Such an IC provides output signals indicative of results of its operations. One such IC operates in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.
Abstract:
A transmitter circuit is operable to provide an output signal in response to a first periodic signal. A multiplexer circuit is operable to provide a second periodic signal as a selected signal during a first phase of operation. The multiplexer circuit is operable to provide the output signal of the transmitter circuit as the selected signal during a second phase of operation. A sampler circuit is operable to generate first samples of the selected signal during the first phase of operation. The sampler circuit is operable to generate second samples of the selected signal during the second phase of operation. A duty cycle control circuit is operable to adjust a duty cycle of the first periodic signal based on the first and the second samples.
Abstract:
Signal detection circuitry for a serial interface oversamples the input—i.e., samples the input multiple times per clock cycle—so that the likelihood of missing a signal is reduced. Sampling may be done with a regenerative latch which has a large bandwidth and can latch a signal at high speed. The amplitude threshold for detection may be programmable, particularly in a programmable device. Thus, between the use of a regenerative latch which is likely to catch any signal that might be present, and the use of oversampling to avoid the problem of sampling at the wrong time, the likelihood of failing to detect a signal is greatly diminished. Logic, such as a state machine, may be used to determine whether the samples captured s do or do not represent a signal. That logic may be programmable, allowing a user to set various parameters for signal detection.
Abstract:
An IC that includes an eye viewer and a BER checker coupled to the eye viewer, where the BER checker receives a serial data signal from the eye viewer, is provided. In one implementation, the BER checker receives the serial data signal from the eye viewer without the serial data signal passing through a deserializer. In one implementation, the BER checker compares the serial data signal against a reference data signal to determine the BER for the serial data signal. In one implementation, the IC includes an IC core coupled to the eye viewer and the BER checker, where the BER checker is outside the IC core. In one implementation, the BER checker is a dedicated BER checker. In one implementation, the BER checker includes an exclusive OR gate, a programmable delay circuit coupled to the exclusive OR gate, and an error counter coupled to the exclusive OR gate.
Abstract:
An integrated circuit (“IC”) may include circuitry for use in testing a serial data signal. The IC may include circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. The IC may also include circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. The IC may provide output signals indicative of results of its operations. The IC can operate in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.
Abstract:
A circuit includes a phase detection circuit and a phase change circuit. The phase detection circuit compares a phase of a first periodic signal to an input signal to generate a gain signal. The phase change circuit provides phase shifts to the first periodic signal in first and second directions when the gain signal has a first value. The phase change circuit increases phase shifts provided to the first periodic signal in the first direction in response to the gain signal changing from the first value to a second value. The phase change circuit provides phase shifts to the first periodic signal in the second direction when the gain signal has the second value that are smaller than the phase shifts provided to the first periodic signal in the first direction when the gain signal has the second value.
Abstract:
A programmable logic device integrated circuit (“PLD”) includes high-speed serial interface (“HSSI”) circuitry in addition to programmable logic circuitry. The HSSI circuitry includes multiple channels of nominal data-handling circuitry (typically including clock and data recovery (“CDR”) circuitry), and at least one channel of nominal clock management unit (“CMU”) circuitry (typically including phase-locked loop (“PLL”) circuitry or the like). To increase the flexibility with which the channels can be used, the nominal data-handling channels are equipped to alternatively perform CMU-type functions, and the nominal CMU channel is equipped to alternatively perform data-handling functions.
Abstract:
Methods and apparatus are provided for selectively setting a CM voltage for a transceiver, reducing the effect of current mismatch, and generating a voltage step that can be used for receiver detection. A circuit of the invention can include voltage generator circuitry operable to generate a plurality of voltage signals of substantially different voltages. The circuit can also include multiplexer circuitry with voltage inputs coupled to the voltage signals. The multiplexer circuitry can be operable to select a reference signal from among the voltage inputs. In addition, the circuit can include operational amplifier (“op-amp”) circuitry with a first input coupled to the reference signal and a second input coupled to an output signal of the op-amp circuitry.
Abstract:
Signal offset variation caused by transistor variation/mismatch in integrated circuits may be reduced. In one embodiment, a buffer circuit has variable-valued circuit elements. Offset variation measurements are made and the variable-valued circuit elements are calibrated to reduce the measured offset variation. In another embodiment, each amplifying stage of a multi-stage buffer provides variable gain. The total DC gain of the cascade is distributed unevenly across the stages, with more DC gain being provided by amplifier stages at the beginning of the cascade than at the end. An additional pre-amplifier stage can also be provided at the beginning of the cascade.
Abstract:
Systems and methods for adjusting a signal received from a communication path are disclosed. A receiver can receive a signal from a communication path which attenuates at least some frequency components of the signal. The receiver can include an equalization block that adjusts at least some of the frequency content of the received signal, a signal normalization block that provides a normalized signal amplitude and/or a normalized edge slope, and a control block. In one embodiment, the control block controls frequency adjustment in the equalization block for high frequencies but not for low frequencies. For low frequency adjustment, the control block controls the normalized signal amplitude in the signal normalization block. In this manner, controlled adjustment for low frequency content is performed in the signal normalization block.