摘要:
The system and method of the present invention is embodied in a multi-state on-chip logic analyzer that is preferably integrated into a VLSI circuit. In general, the logic analyzer is preferably coupled to a multilevel trace array for storing event trace data generated by the logic analyzer. Input and output logic coupled to both the trace array and the logic analyzer allows reading or writing from or to the trace array, and programming of trigger and condition criteria for transitioning states within the logic analyzer. The logic analyzer has the capability match one or more programmable trigger events to satisfy one or more programmable conditions. Further, the logic analyzer preferably has the capability to initialize programmable conditions in desired states, and to store event trace data in an on-chip array for trace data reconstruction and analysis. Trace array input and output logic allows reading or writing from or to the trace array, and programming of trigger and condition criteria for transitioning states within the logic analyzer. Further, the trace array input and output logic is preferably accessible at both the wafer and component stage to allow for testing and debugging of the VLSI circuitry.
摘要:
Monitoring is performed to detect a hang condition. A timer is set to detect a hang based on a core hang limit. If a thread hangs for the duration of the core hang limit, then a core hang is detected. If the thread is performing an external memory transaction, then the timer is increased to a longer memory hang limit. If the thread is waiting for a shared resource, then the timer may be increased to the longer memory hang limit if another thread or, more particularly, the thread blocking the resource has a pending memory transaction. Responsive to detecting a hang condition, instructions dispatched to the plurality of execution units may be flushed, or the processor may be reset and restored to a previously known good, checkpointed architected state.
摘要:
A method and system for testing an integrated circuit. A test substrate is provided which is manufactured by the same particular production technology for which the integrated circuit is designed. A pattern generator for generating test data and a result checker for comparing output data are embedded on the test substrate. Isolated portions of circuitry of the integrated circuit are selectively embedded onto the test substrate. Test data from the pattern generator is applied to the isolated portions of circuitry under a first operating condition. The data output from the isolated portions of circuitry is selectively recorded into the result checker. The isolated portions of circuitry are then subjected to testing by applying test data from the pattern generator to the isolated portions of circuitry under a second operating condition. Errors in the isolated portions of circuitry are detected with the result checker by comparing data output from the isolated portions of circuitry with the selectively recorded data output, such that the integrated circuit is tested by subsets, independently of testing the integrated circuit in its entirety.
摘要:
A trace array for recording states of signals includes N-storage locations for k trace signals. In the write mode, an address generator combines the outputs of an event signal counter and a cycle clock counter to generate trace array addresses. A start code is written each time an event signal occurs and event addresses are saved. Recording is stopped by a stop signal and the stop address is saved. A compression code and time stamp code are written when no state changes occur in any trace signals at the cycle clock times to compress recorded trace signal data. An output processor reads out stored states of the trace signals and uses the start codes, event addresses, stop address, compression code and time stamp to reconstruct the original trace signal sequences for analysis.
摘要:
A method and apparatus for recovering from a hang condition in a processor having a plurality of execution units. Monitoring is performed to detect a hang condition. Responsive to detecting a hang condition, instructions dispatched to the plurality of execution units are flushed.
摘要:
In a multiprocessor environment, by executing cache-inhibited reads or writes to registers, a scan communication is used to rapidly access registers inside and outside a chip originating the command. Cumbersome locking of the memory location may be thus avoided. Setting of busy latches at the outset virtually eliminates the chance of collisions, and status bits are set to inform the requesting core processor that a command is done and free of error, if that is the case.
摘要:
In a multiprocessor environment, by executing cache-inhibited reads or writes to registers, a scan communication is used to rapidly access registers inside and outside a chip originating the command. Cumbersome locking of the memory location may be thus avoided. Setting of busy latches at the outset virtually eliminates the chance of collisions, and status bits are set to inform the requesting core processor that a command is done and free of error, if that is the case.